RTAX4000SL-CQ352V vs RTAX4000S-CQ352V 比較
詳細並排比較 RTAX4000SL-CQ352V 由 Microchip Technology 與 RTAX4000S-CQ352V 由 Microchip Technology. 比較關鍵規格、電氣參數、封裝、生命週期狀態、價格與供貨情況，以找出最符合您設計需求的元件。
Microchip Technology
RTAX4000SL-CQ352V - 4M-Gate Rad-Tolerant FPGA | Microchip
RTAX4000SL-CQ352V ✓ 啟用中Microchip Technology
RTAX4000S-CQ352V - 4M-Gate Rad-Tolerant FPGA | Microchip
RTAX4000S-CQ352V ✓ 啟用中規格比較
| 參數 | RTAX4000SL-CQ352V | RTAX4000S-CQ352V |
|---|---|---|
| 品牌 | Microchip Technology | Microchip Technology |
| 類別 | FPGA & CPLD | FPGA & CPLD |
| 生命週期狀態 | 啟用中 | 啟用中 |
| Device Type | Radiation-Tolerant FPGA | — |
| Family | RTAX-S/SL | RTAX-S/SL Radiation-Tolerant FPGAs |
| Equivalent System Gates | 4,000,000 | 4,000,000 gates |
| Configurable Logic Blocks (CLBs) | 40,320 | — |
| Logic Cells | 60,480 | 60,480 |
| Process Technology | CMOS | — |
| Configuration Type | Live at power-up (single-chip) | — |
| Embedded Memory | Embedded SRAM with FIFO control logic | Embedded SRAM with built-in FIFO control logic |
| Clock Resources | Segmentable clocks, chip-wide highway routing | Segmentable clocks, chip-wide highway routing |
| Arithmetic Support | Dedicated carry logic | — |
| 封裝 | CQ352 (352-pin ceramic column grid array) | CQ352 (352-pin ceramic column grid array) |
| 安裝類型 | Surface Mount | — |
| Radiation Environment | Space flight | — |
| 工作溫度 | [DATA_NEEDED: Operating Temperature] | [DATA_NEEDED: operating temperature range] |
| 供應電壓 | [DATA_NEEDED: Supply Voltage] | [DATA_NEEDED: core supply voltage] |
| Maximum User I/O | [DATA_NEEDED: Maximum User I/O count for CQ352 package] | — |
| RoHS 狀態 | [DATA_NEEDED: RoHS Status] | [DATA_NEEDED: RoHS status] |
| Combinational Logic Blocks | — | 40,320 |
| Technology | — | CMOS, antifuse (OTP) |
| Radiation Tolerance | — | Radiation-tolerant (space-flight grade) |
| Configuration | — | Live at power-up, single-chip, no external configuration device |
| Architecture Base | — | Axcelerator commercial FPGA family |
| Application Domain | — | Space-flight systems |
| Max User I/O | — | [DATA_NEEDED: maximum user I/O count for CQ352] |
| Screening | — | Standard vs SL variant distinguished by ICCA limits at 125C final electrical test |