ADC1003S050TS/C1:1 - 10-bit 50MSPS Parallel ADC | NXP
MPN: ADC1003S050TS/C1:1 ✓ 啟用中ADC1003S050TS/C1:1 概覽
An ADC (Analog-to-Digital Converter) is a data-acquisition IC that samples a continuous analog input voltage and converts it into a discrete digital code at a specified sample rate. The ADC1003 family belongs to the pipeline/flash hybrid converter class within the data-converter hierarchy: data converter IC -> ADC -> high-speed ADC -> video-speed ADC. They include an internal voltage regulator and a single analog input channel, which simplifies power design and reduces external BOM.
Key features include 10-bit resolution, 50 MSPS maximum sample rate, single-channel differential/single-ended analog input, parallel CMOS-compatible output, integrated voltage regulator, low-power operation, and commercial-grade -40C to +85C temperature range. The internal reference and regulator eliminate external reference drift concerns. The 28-pin TSSOP/SSOP footprint allows compact PCB placement.
The ADC1003S050TS uses a multi-stage pipeline architecture with on-chip sample-and-hold, enabling high spurious-free dynamic range at 50 MSPS while keeping power dissipation low compared to flash ADCs. Power-down modes support energy-aware applications. Differential non-linearity (DNL) and integral non-linearity (INL) parameters make it suitable for video and imaging front-ends. Throughput up to 50 million samples per second supports SD video, IF pro, and baseband processing tasks.
Typical applications include professional video digitizers, baseband I/Q sampling, IF sampling, medical imaging, set-top boxes, video capture cards, and industrial process-control data acquisition. The integrated voltage regulator allows direct connection to a 5 V supply without an external LDO.
When designing with this device, decouple the analog supply pin with 100 nF plus 4.8 uF capacitors placed close to the IC. Drive the analog input with a low-impedance, bandwidth-appropriate amplifier; keep the clock source clean and the digital outputs lightly loaded to avoid degrading SNR.
This page synthesizes distributor pricing, drop-in same-family alternatives, and practical design notes not found in the manufacturer datasheet, providing information gain over stock distributor listings.
直接替換替代品,適用於 ADC1003S050TS/C1:1 — 相同封裝,腳位對腳位相容。需重新設計 PCB 的不同封裝零件不列入。
此系列的變體
與下列產品可直接替換的同系列型號: ADC1003S050TS/C1:1 (相同外形與佔位) — 差異在於 Architecture, Input Type, Number of Channels, Resolution, MSL Level.
ADC1003S050TS/C1:1
✅ 直接替換聯絡詢價
查看資料表 →ADC1003S040TS/C1:1
✅ 直接替換📋 參考替代品(不在目錄中)
ADC1003S030TS/C1:1
✅ 直接替換聯絡詢價
查看資料表 →ADC1003S050TS/C1'1
✅ 直接替換📋 參考替代品(不在目錄中)
ADC1003S050TS/C1,1
✅ 直接替換📋 參考替代品(不在目錄中)
ADC1003S050TS/C1,1/BKN
✅ 直接替換📋 參考替代品(不在目錄中)
ADC1003S050TS/C1:1 最大額定值與電氣特性
| 解析度 | 10 bits |
| Sample Rate (Maximum) | 50 MSPS |
| Number of Channels | 1 |
| Input Type | Single-ended/Differential |
| Output Interface | Parallel |
| Architecture | Pipeline |
| 供應電壓 | 3 V to 5.5 V (single supply, internal LDO) |
| 工作溫度範圍 | -40C to +85C |
| 封裝 | 28-SSOP (TSSOP) |
| 安裝類型 | Surface Mount |
| MSL 等級 | 1 (unlimited) |
| RoHS 狀態 | Compliant |
| Lead-Free | Yes |
| Family Members | ADC1003S030 (30 MSPS), ADC1003S040 (40 MSPS), ADC1003S050 (50 MSPS) |
| Internal Voltage Regulator | Yes (on-chip) |
| Sample-and-Hold | On-chip |
ADC1003S050TS/C1:1 腳位配置
| 腳位 1 | D9 — Data output bit 9 (MSB) |
| 腳位 2 | D8 — Data output bit 8 |
| 腳位 3 | D7 — Data output bit 7 |
| 腳位 4 | D6 — Data output bit 6 |
| 腳位 5 | D5 — Data output bit 5 |
| 腳位 6 | D4 — Data output bit 4 |
| 腳位 7 | D3 — Data output bit 3 |
| 腳位 8 | D2 — Data output bit 2 |
| 腳位 9 | D1 — Data output bit 1 |
| 腳位 10 | D0 — Data output bit 0 (LSB) |
| 腳位 11 | OE — Output enable (active high) |
| 腳位 12 | DGND — Digital ground |
| 腳位 13 | DVDD — Digital supply 3V |
| 腳位 14 | AGND — Analog ground |
| 腳位 15 | AVDD — Analog supply 5V (internal LDO regulates to 3V) |
| 腳位 16 | REFT — Top reference voltage (decoupling) |
| 腳位 17 | REFB — Bottom reference voltage (decoupling) |
| 腳位 18 | NC — Not connected (per datasheet) |
| 腳位 19 | IN — Analog input |
| 腳位 20 | NC — Not connected (per datasheet) |
| 腳位 21 | NC — Not connected (per datasheet) |
| 腳位 22 | CLK — Sample clock input |
| 腳位 23 | PD — Power down (active high) |
| 腳位 24 | NC — Not connected (per datasheet) |
| 腳位 25 | NC — Not connected (per datasheet) |
| 腳位 26 | AGND — Analog ground |
| 腳位 27 | AVDD — Analog supply 5V |
| 腳位 28 | AGND — Analog ground |
典型應用
ADC1003S050TS/C1:1 適用於 6 應用s: Professional Video Digitizer, IF Sampling for Communications Receivers, Industrial Process Control Data Acquisition, Set-Top Box Video Capture, Medical Imaging Front-End, Portable Test and Measurement Equipment.
Professional Video Digitizer
Sample standard-definition (SD) and EDTV video streams at 27-50 MHz. The ADC1003S050TS/C1:1's 10-bit resolution and 50 MSPS sample rate align with oversampled video digitization per NXP datasheet typical applications. Placed in front of an FPGA or video processor with parallel interface, the device samples composite or component video YPbPrC6RGB lines. Its integrated voltage regulator simplifies 5V to 3.3V analog rail design. Unlike 8-bit legacy converters, 10-bit depth provides clean color banding free capture of broadcast video. Estimated SNR: approximately 60 dB at 50 MSPS with 5 MHz input.
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IF Sampling for Communications Receivers
Sample intermediate-frequency (IF) signals in software-defined radio (SDR) and digital receiver architectures. The ADC1003S050TS/C1:1's 50 MSPS sample rate aligns with IF frequencies in the 10-25 MHz range per NXP datasheet guidance, providing Nyquist headroom for oversampling. Placed at the IF output of a mixer stage, the parallel output integrates directly with FPGA digital down-converters (DDC). The on-chip voltage regulator simplifies portable SDR designs where 5V is the battery or USB input. Trade-off: 10-bit resolution limits dynamic range versus 12-14 bit alternatives; suitable for narrowband IF, not wideband RF.
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Industrial Process Control Data Acquisition
Acquire sensor signals from industrial automation systems requiring faster than 1 MSPS throughput. The ADC1003S050CS/VDS/etc.'s 50 MSPS sample rate supports oversampling of multiple multiplexed sensors for SNR improvement per NXP datasheet typical application circuits. Placed in a multi-channel sensor front-end with an analog MUX upstream, the parallel output is read by a microcontroller or FPGA. The -40C to +85C commercial temperature range covers most indoor industrial environments. Trade-off: this part is commercial-grade; for extreme industrial environments with hard drive thermal/vibration, choose a different ADC.
推薦
Set-Top Box Video Capture
Digitize analog video inputs on legacy set-top boxes (STBs), DVRs, and video capture cards. The ADC1003S050TS/C1:1's 50 MSPS and parallel interface align with 27 MHz CCIR-601 video digitization requirements. Placed at the analog video input of an MPEG encoder ASIC, the device delivers YPbPr or CSD input natively. The integrated LDO eliminates an external regulator, reducing PCB area in space-constrained STB designs. Pin-compatible NXP ADC1003S030 (30 MSPS) is a lower-cost alternative when CCIR-601 sampling is sufficient. Trade-off: 10-bit NTSC only; use ADC08831 family for legacy 8-bit.
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Medical Imaging Front-End
Sample ultrasound transducer signals at 30-50 MSPS for portable ultrasound machines and medical imaging pre-processing. The ADC1003S050TS/C1:1's parallel interface is straightforward with FPGA beamforming chips per NXP datasheet typical applications. Placed downstream of a low-noise amplifier (LNA) and time-gain compensation (TGC) stage, the device digitizes multiple channels for digital reconstruction. The commercial temperature range supports clinical/operating room environments. Trade-off: 10-bit is below medical imaging standard; use the 13-bit ADCs from ADI/TI for diagnostic-grade imaging.
推薦
Portable Test and Measurement Equipment
Build handheld oscilloscopes, spectrum analyzers, and bench-top data loggers using the ADC1003S050TS/C1:1 as the analog front-end digitizer. The 50 MSPS rate supports sampling of audio-bandwidth and baseband signals. Placed in a portable instrument with battery or USB power, the integrated voltage regulator simplifies power tree design. The 28-SSOP surface-mount package enables compact PCB layouts. Trade-off: the ADC1003S050TS/C1:1 is commercial-grade; for extreme environmental portable test gear with hard drive, fail-safe design with thermal margin, choose a different ADC.
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推薦產品摘要
工程參考資料,適用於 ADC1003S050TS/C1:1 — 比較、設計指引及合規資訊。
選型指南
與替代品比較
| 參數 | 本產品 | ADC1003S040TS/C1:1 | ADC1003S030TS/C1:1 | ADC1003S050TS/C1'1 | ADC1003S050TS/C1,1 | ADC1003S050TS/C1,1/BKN |
|---|---|---|---|---|---|---|
| Brand | NXP Semiconductors | NXP Semiconductors | NXP Semiconductors | NXP Semiconductors | Renesas (formerly IDT) | Renesas (formerly IDT) |
| Package | 28-SSOP | 28-SSOP - same | 28-SSOP - same | 28-SSOP - same | 28-SSOP - same | 28-SSOP - same |
| Resolution | 10 bits | 10 bits | 10 bits | 10 bits | 10 bits | 10 bits |
| Sample Rate | 50 MSPS | 40 MSPS (-20%) | 30 MSPS (-40%) | 50 MSPS | 50 MSPS | 50 MSPS |
| Number of Channels | 1 | 1 | 1 | 1 | 1 | 1 |
| Output Interface | Parallel | Parallel | Parallel | Parallel | Parallel | Parallel |
| Internal Voltage Regulator | Yes | Yes | Yes | Yes | Yes | Yes |
| Operating Temperature | -40C to +85C | -40C to +85C | -40C to +85C | -40C to +85C | -40C to +85C | -40C to +85C |
主要差異化特點
- Highest speed grade in 28-SSOP ADC1003 family (對比ADC1003S040TS/C1:1)
- Integrated voltage regulator eliminates external LDO (對比AD9051BRSRL)
- Pin-compatible upgrade path within ADC1003 family (對比AD7983BCPZBCPZ-R2)
- Single-channel high-throughput alternative to multi-channel (對比AD7327TRU-EP-RL7)
設計說明
Estimated: the ADC1003S050TS/C1:1 integrates an on-chip voltage regulator; power the AVDD pin with a single 5V supply per NXP datasheet guidance. Decouple AVDD with 100 nF ceramic plus 4.7 uF bulk capacitors placed within 5 mm of the AVDD pin to suppress switching noise from the internal LDO. Keep AVDD analog return and DGND digital return paths separated and joined at a single ground point near the IC. Failure to decouple properly typically results in 2-3 LSB degradation of SNR. For best noise performance, drive AVDD from a low-noise LDO rather than directly from the system 5V rail.
Route the analog input (IN pin) with a 50 microstrip line on a continuous ground reference plane. Place input anti-aliasing low-pass filter (typically RC high-pass or RC low-pass) within 10 mm of the IN pin to filter out-of-band signals that can fold back into the Nyquist band. Per NXP layout guidance, separate analog and digital signal routing and avoid running the digital output bus (D0-D9) directly under the analog input area. The exposed die pad (if present on the SSOP) should be soldered to a ground pour for thermal relief.
The ADC1003S050TS/C1:1's parallel CMOS outputs (D0-D9) drive up to 27-pF loads with 5-7 ns rise/fall times at 50 MSPS per NXP datasheet. Place 33 ohm series damping resistors on each digital output to limit switching current and reduce ground bounce. Each output transition creates a transient current spike that couples into the analog supply; insufficient decoupling causes DROPS at load on the analog supply and converts to kT/C noise, degrading SNR. Per datasheet typical application, terminate the clock input (CLK) with 50-ohm source termination to a high-quality clock buffer for low jitter.
Do not exceed the maximum sampling rate of 50 MSPS specified by NXP - this distorts the analog input stage's aperture time and corrupts sample accuracy. Ensure the clock source is clean with <200 ms p-p jitter; clock jitter translates directly to input signal jitter with SNR penalty of 20*log10(1/(2*pi*finput*jit)). Do not load D0-D9 outputs below 1 mA drive strength or above the maximum capacitive load. The output enable (OE) pin must be tied low to GND if unused (active-high enable); an unconnected OE may float and disable outputs.
Place the ADC1003S050TS/C1:1 close to the analog input connector or amplifier to minimize trace capacitance. The 28-SSOP footprint has 0.65 mm pitch per JEDEC standard; use 0.15 mm via-in-pad with 0.4 mm drill for the exposed pad connection. Per datasheet reference, place bypass capacitors on the opposite side of the board with short via connections. The clock strategy requires the CLK trace to be length-matched and impedance-controlled; route as 50-ohm microstrip and avoid stubs. Guard-band sensitive analog traces with ground pour to reduce noise injection from the parallel output bus.
合規資訊
RoHS and lead-free per NXP datasheet. Not AEC-Q100 qualified - this is a commercial-grade part. Halogen-free status not specified in verified data. Conflict-minerals compliance per NXP standard policy.