RTAX4000D-CQ352E vs RTAX4000SL-CQ352B 对比
详细并排对比 RTAX4000D-CQ352E 出自 Microsemi 和 RTAX4000SL-CQ352B 出自 Microchip Technology。对比关键规格、电气参数、封装、生命周期状态、价格和供货情况，以确定最适合您设计需求的元器件。
Microchip Technology
RTAX4000SL-CQ352B - 4M-Gate Rad-Tolerant FPGA CQFP-352 | Microchip
RTAX4000SL-CQ352B ✓ 量产中规格对比
| 参数 | RTAX4000D-CQ352E | RTAX4000SL-CQ352B |
|---|---|---|
| 品牌 | Microsemi | Microchip Technology |
| 分类 | FPGA & CPLD | FPGA & CPLD |
| 生命周期状态 | 有效 | 有效 |
| 库存状态 | 有库存 | 有库存 |
| 单价（USD） | $0.00 | $1.00 |
| Family | RTAX-DSP Radiation-Tolerant FPGA | RTAX-SL (Radiation-Tolerant FPGAs) |
| System Gates | 4,000,000 | — |
| Logic Cells | 33,600 | 40,320 |
| Process Technology | 0.15 um CMOS | 0.15 um |
| Core Supply Voltage | 1.5 V | — |
| 封装 | 352-Pin CQFP (CQ352) ceramic, hermetic | 352-Pin CQFP |
| Configuration | Live at power-up (antifuse, single-chip) | — |
| Embedded Memory | Embedded SRAM with built-in FIFO control logic | Embedded SRAM with built-in FIFO control logic |
| Clocking | Segmentable clocks, chip-wide highway routing | — |
| Number of CLBs | [DATA_NEEDED: CLB / AX cell organization count] | — |
| User I/O Count | [DATA_NEEDED: user I/O count for CQ352 package] | — |
| Speed Grade | Standard (no dash-1 speed suffix indicated in CQ352E ordering code) | — |
| 工作温度 | [DATA_NEEDED: operating temperature range] | [DATA_NEEDED: Operating Temperature] |
| Radiation Tolerance | Radiation-tolerant, space-flight qualified family (per Microchip RTAX-DSP product page) | Radiation-tolerant (space flight qualified family) |
| 安装类型 | Surface Mount | Surface Mount |
| RoHS 状态 | [DATA_NEEDED: RoHS status - hermetic ceramic aerospace package, typically exempt] | [DATA_NEEDED: RoHS Status] |
| Design Software | Microsemi/Microchip Libero SoC | — |
| Equivalent System Gates | — | 4,000,000 |
| Core Voltage | — | 1.5 V |
| Packaging / Shipping | — | Box |
| Programmable Type | — | FPGA |
| Clock Resources | — | Segmentable clocks, chip-wide highway routing |
| Arithmetic Support | — | Carry logic |
| I/O Voltage | — | [DATA_NEEDED: I/O Voltage] |
| Total Ionizing Dose (TID) | — | [DATA_NEEDED: TID Rating] |
| Single Event Latch-up Threshold | — | [DATA_NEEDED: SEL LET Threshold] |