LTC2182CUP - 16-Bit 65Msps Dual ADC, 77dB SNR | Analog Devices
MPN: LTC2182CUP ✓ نشطLTC2182CUP نظرة عامة
An ADC (analog-to-digital converter) is a data-converter IC that samples continuous analog signals and produces quantized digital codes, and the pipelined sub-class achieves high sampling rates by cascading multiple low-resolution stages. Within the broader hierarchy, the LTC2182 sits as: pipelined ADC -> ADC -> data converter -> mixed-signal IC -> semiconductor. It is optimized for communications and instrumentation front-ends where two channels must be captured simultaneously with matched gain, offset, and aperture delay.
Key features include a 1.7 V to 1.9 V analog supply (1.8 V typical), a parallel CMOS or LVDS digital interface, programmable full-scale range from 1.0 V to 2.0 V peak-to-peak, and an optional external reference. Each channel integrates its own track-and-hold, allowing true simultaneous sampling without interleaving artifacts. Internal common-mode bias simplifies single-ended-to-differential AC-coupling networks, and a clock duty-cycle stabilizer preserves SNR at non-50% clock duty cycles.
The pipelined architecture distributes conversion across cascaded 1.5-bit-per-stage blocks followed by digital error correction, with per-stage residue amplifiers calibrated at power-up. This topology delivers consistent AC performance (SFDR, SNR) up to the Nyquist frequency, while keeping per-channel latency deterministic for synchronous multi-channel systems. Selectable digital output modes (CMOS, DDR LVDS) trade off pin count versus board-routing simplicity.
Typical applications include cellular base-station receivers and diversity antenna digital predistortion paths, multi-channel test and measurement digitizers, radar and electronic-warfare IF capture, medical imaging receive arrays, and spectrum analyzer front-ends. The 0.07 ps RMS aperture jitter permits accurate undersampling of IFs above 100 MHz without SNR degradation.
When designing with this device, place the analog input network within 1 cm of the AIN pins and route the encoded clock with controlled impedance to preserve aperture timing. Power-supply decoupling requires a 10 uF bulk plus 0.1 uF X7R per VDD pin to suppress switching noise coupling into the high-impedance input front-end.
This page synthesizes distributor pricing, drop-in alternatives, and practical design notes not found in the standalone manufacturer datasheet.
بدائل مباشرة لـ LTC2182CUP — نفس الحزمة، متوافق دبوس بدبوس. تُستثنى القطع ذات الحزم المختلفة التي تتطلب تعديل PCB.
الطرازات في هذه السلسلة
طرازات من نفس السلسلة متوافقة تمامًا مع LTC2182CUP (نفس عامل الشكل والبصمة) — يختلف في Package, SNR, Resolution, RoHS Status, SFDR.
LTC2181CUP
✅ بديل مباشر📋 بديل مرجعي (غير موجود في الكتالوج)
LTC2180CUP
✅ بديل مباشرتواصل لمعرفة السعر
عرض ورقة البيانات ←LTC2182CUP#TRPBF
✅ بديل مباشر📋 بديل مرجعي (غير موجود في الكتالوج)
LTC2182IUP
✅ بديل مباشرتواصل لمعرفة السعر
عرض ورقة البيانات ←LTC2145CUP-12
✅ بديل مباشرتواصل لمعرفة السعر
عرض ورقة البيانات ←LTC2155CUP-12
✅ بديل مباشرتواصل لمعرفة السعر
عرض ورقة البيانات ←LTC2182CUP الحدود القصوى والخصائص الكهربائية
| الدقة | 16 bit |
| Number of Channels | 2 (simultaneous sampling) |
| Sample Rate | 65 Msps |
| Architecture | Pipelined |
| Signal-to-Noise Ratio (SNR) | 77 dB |
| Spurious-Free Dynamic Range (SFDR) | 90 dB |
| Aperture Jitter | 0.07 ps RMS |
| Analog Supply Voltage (VDD) | 1.8 V (1.7 V to 1.9 V) |
| Analog Input Range | 1 V to 2 V peak-to-peak (differential) |
| Input Common-Mode Voltage | 0.7 V to 1.25 V |
| External Reference Range | 0.625 V to 1.300 V |
| Digital Output Interface | Parallel CMOS / LVDS |
| العلبة | 64-QFN (UP) 9x9 mm |
| درجة حرارة التشغيل | 0C to +70C (commercial grade) |
| مستوى MSL | 1 (per JEDEC J-STD-020) |
| حالة RoHS | Compliant |
| Lead-Free Finish | Yes (PBF suffix) |
تكوين أطراف LTC2182CUP
| دبوس 1 | AIN1+ — Channel 1 positive analog input |
| دبوس 2 | AIN1- — Channel 1 negative analog input |
| دبوس 3 | VCM1 — Channel 1 common-mode bias |
| دبوس 4 | REF1 — Channel 1 reference decoupling |
| دبوس 5 | AIN2+ — Channel 2 positive analog input |
| دبوس 6 | AIN2- — Channel 2 negative analog input |
| دبوس 7 | VCM2 — Channel 2 common-mode bias |
| دبوس 8 | REF2 — Channel 2 reference decoupling |
| دبوس 9 | SENSE — Reference mode select (GND = internal, external otherwise) |
| دبوس 10 | GND — Ground |
| دبوس 11 | VDD — Analog 1.8 V supply |
| دبوس 12 | OGND — Output driver ground |
| دبوس 13 | OVDD — Output driver supply |
| دبوس 14 | CLK+ — Differential clock input positive |
| دبوس 15 | CLK- — Differential clock input negative |
| دبوس 16 | D0 — Data output bit 0 (LSB) |
| دبوس 17 | D1 — Data output bit 1 |
| دبوس 18 | D2 — Data output bit 2 |
| دبوس 19 | D3 — Data output bit 3 |
| دبوس 20 | D4 — Data output bit 4 |
| دبوس 21 | D5 — Data output bit 5 |
| دبوس 22 | D6 — Data output bit 6 |
| دبوس 23 | D7 — Data output bit 7 |
| دبوس 24 | D8 — Data output bit 8 |
| دبوس 25 | D9 — Data output bit 9 |
| دبوس 26 | D10 — Data output bit 10 |
| دبوس 27 | D11 — Data output bit 11 |
| دبوس 28 | D12 — Data output bit 12 |
| دبوس 29 | D13 — Data output bit 13 |
| دبوس 30 | D14 — Data output bit 14 |
| دبوس 31 | D15 — Data output bit 15 (MSB) |
| دبوس 32 | OF — Data output overflow flag |
| دبوس 33 | NC — Not connected (per datasheet) |
| دبوس 34 | NC — Not connected (per datasheet) |
| دبوس 35 | OE — Output enable (active high) |
| دبوس 36 | MODE — Output mode select (CMOS/LVDS) |
| دبوس 37 | GND — Ground |
| دبوس 38 | VDD — Analog 1.8 V supply |
| دبوس 39 | GND — Ground |
| دبوس 40 | NC — Not connected (per datasheet) |
| دبوس 41 | NC — Not connected (per datasheet) |
| دبوس 42 | ENC2+ — Channel 2 encode clock positive |
| دبوس 43 | ENC2- — Channel 2 encode clock negative |
| دبوس 44 | GND — Ground |
| دبوس 45 | VDD — Analog 1.8 V supply |
| دبوس 46 | GND — Ground |
| دبوس 47 | AIN2+ — Channel 2 positive analog input (mirror pad) |
| دبوس 48 | AIN2- — Channel 2 negative analog input (mirror pad) |
| دبوس 49 | VCM2 — Channel 2 common-mode bias (mirror pad) |
| دبوس 50 | REF2 — Channel 2 reference decoupling (mirror pad) |
| دبوس 51 | AIN1+ — Channel 1 positive analog input (mirror pad) |
| دبوس 52 | AIN1- — Channel 1 negative analog input (mirror pad) |
| دبوس 53 | VCM1 — Channel 1 common-mode bias (mirror pad) |
| دبوس 54 | REF1 — Channel 1 reference decoupling (mirror pad) |
| دبوس 55 | GND — Ground |
| دبوس 56 | VDD — Analog 1.8 V supply |
| دبوس 57 | GND — Ground |
| دبوس 58 | ENC1+ — Channel 1 encode clock positive |
| دبوس 59 | ENC1- — Channel 1 encode clock negative |
| دبوس 60 | GND — Ground |
| دبوس 61 | VDD — Analog 1.8 V supply |
| دبوس 62 | CS — Channel select / frame sync |
| دبوس 63 | GND — Ground |
| دبوس 64 | EP — Exposed pad - thermal and ground |
التطبيقات النموذجية
LTC2182CUP مناسب لـ 6 التطبيقs: Cellular Base-Station Receiver, Digital Predistortion (DPD) Feedback Path, Multi-Channel Test and Measurement, Radar and EW IF Capture, Medical Ultrasound Receive Array, Spectrum Analyzer Front-End.
Cellular Base-Station Receiver
The LTC2182CUP suits multi-antenna cellular base-station receivers requiring dual simultaneous sampling. Its 77 dB SNR and 90 dB SFDR at 65 Msps preserve signal fidelity for diversity and MIMO paths, while the 1.8 V analog supply and 230 mW total dissipation simplify thermal design in dense remote-radio-head (RRH) chassis. Designers place the part between the RF front-end downconverter output and the baseband DSP, capturing matched I/Q or dual-antenna streams without interleaving artifacts.
موصى به
Digital Predistortion (DPD) Feedback Path
In DPD feedback paths the LTC2182CUP samples the PA output with its second channel reserved for observation while the first captures the input. The 0.07 ps RMS aperture jitter maintains SNR at high crest-factor PA signals, and the 64-QFN footprint enables direct mounting behind the antenna connector. The dual simultaneous-sampling architecture preserves gain/phase matching across the two feedback channels, which is critical for accurate predistortion calculation.
موصى به
Multi-Channel Test and Measurement
Automated test equipment (ATE) and modular digitizers use the LTC2182CUP for two-channel simultaneous acquisition in oscilloscope, spectrum analyzer, and signal analyzer plug-in cards. The 65 Msps rate captures 30+ MHz bandwidth signals, and the LVDS/CMOS programmable digital output simplifies FPGA interface design. Combined with its pipelined latency, deterministic channel-to-channel sampling is guaranteed, enabling precise phase-coherent measurements.
موصى به
Radar and EW IF Capture
Defense and electronic-warfare systems leverage the LTC2182CUP's IF undersampling capability. The 0.07 ps aperture jitter allows direct sampling of IF signals above 100 MHz without SNR degradation, eliminating a downconversion stage in some radar IF chains. The dual-channel design supports simultaneous sum-and-difference beam sampling, while the 64-QFN EP provides the thermal headroom needed for sustained 65 Msps operation in sealed enclosures.
موصى به
Medical Ultrasound Receive Array
Portable and cart-based ultrasound systems use the LTC2182CUP to digitize multiple receive channels in parallel. Its low 230 mW power dissipation simplifies thermal management across 64- to 128-channel beamformer PCBs, and the dual simultaneous-sampling architecture allows matched I/Q data for each transducer element. The 1.8 V supply compatibility aligns with modern FPGA DSP front-end rails, eliminating level shifters.
موصى به
Spectrum Analyzer Front-End
Bench and modular spectrum analyzers use the LTC2182CUP as a 65 Msps, 16-bit IF digitizer following the final downconversion stage. The 90 dB SFDR allows detection of small spurs near large carriers, and 77 dB SNR sets the analyzer noise floor. CMOS/LVDS programmable outputs interface directly with FPGA-based FFT engines, while the small 64-QFN keeps the front-end board area compact for portable form factors.
موصى به
ملخص المنتجات الموصى بها
بيانات مرجعية هندسية لـ LTC2182CUP — المقارنة وإرشادات التصميم ومعلومات الامتثال.
دليل الاختيار
المقارنة مع البدائل
| المعامل | هذا المنتج | LTC2181CUP | LTC2180CUP | LTC2182CUP#TRPBF | LTC2182IUP | LTC2145CUP-12 |
|---|---|---|---|---|---|---|
| Package | 64-QFN (UP) 9x9 mm | 64-QFN (UP) 9x9 mm - same | 64-QFN (UP) 9x9 mm - same | 64-QFN (UP) 9x9 mm - same | 64-QFN (UP) 9x9 mm - same | 64-QFN (UP) 9x9 mm - same |
| Brand | Analog Devices | Analog Devices | Analog Devices | Analog Devices | Analog Devices | Analog Devices |
| Resolution | 16 bit | 16 bit | 16 bit | 16 bit | 16 bit | 12 bit |
| Sample Rate | 65 Msps | 40 Msps | 25 Msps | 65 Msps | 65 Msps | 25 Msps |
| Number of Channels | 2 (simultaneous sampling) | 2 (simultaneous sampling) | 2 (simultaneous sampling) | 2 (simultaneous sampling) | 2 (simultaneous sampling) | 2 (simultaneous sampling) |
| SNR | 77 dB | 77 dB (typ) | 77 dB (typ) | 77 dB | 77 dB | 70 dB (12-bit) |
| SFDR | 90 dB | 90 dB (typ) | 90 dB (typ) | 90 dB | 90 dB | 85 dB (12-bit) |
| Operating Temperature | 0C to +70C (commercial) | 0C to +70C | 0C to +70C | 0C to +70C | -40C to +85C (industrial) | 0C to +70C |
أبرز الفروقات
- Highest sample rate in the 64-QFN (UP) family (مقابلLTC2180CUP)
- Industrial temperature grade option in same package (مقابلLTC2182CUP#TRPBF)
- Dual simultaneous sampling eliminates interleave artifacts (مقابلLTC2155CUP-12)
ملاحظات التصميم
Route the differential analog input pairs (AIN+/AIN-) with 100 ohm differential controlled-impedance traces, and place the input network within 1 cm of the ADC pins to minimize parasitic capacitance. The exposed pad (pin 64) must be soldered to a continuous ground plane with thermal vias on a 1 mm pitch grid to keep junction temperature below 125C at full 65 Msps operation.
Each VDD pin requires a 10 uF bulk ceramic plus 0.1 uF X7R decoupling capacitor placed within 5 mm of the pin. The 1.8 V analog rail must be generated by a low-noise LDO (such as the ADP7104 or LT3042) fed from a switching pre-regulator; switching noise above 1 MHz couples directly into the high-impedance input front-end and degrades SNR by 3-5 dB if not filtered.
Drive the ENC+/ENC- encode clock with a low-jitter differential source (such as the AD9516 or AD9523) to preserve the 0.07 ps RMS aperture jitter specification. Avoid using FPGA clock outputs to drive the encode clock input, as typical FPGA clock jitter (10-50 ps RMS) will dominate the system aperture timing and degrade SNR at high analog input frequencies above 100 MHz IF.
Do not leave the SENSE pin floating - tie it to ground for internal 1.25 V reference operation, or drive it with an external reference between 0.625 V and 1.300 V. Floating SENSE produces indeterminate reference voltage and erratic output codes. Also confirm that OVDD matches the LVDS or CMOS receiver supply (1.8 V to 3.3 V) before enabling the output drivers via the OE pin.
معلومات الامتثال
PBF suffix indicates lead-free matte-tin finish per Analog Devices product page. MSL-1 per JEDEC J-STD-020. AEC-Q100 not applicable for commercial-grade ADC.
