EPF10K200SRC240-3 vs EPF10K200SRC240-3N Comparison
Detailed side-by-side comparison of EPF10K200SRC240-3 by Intel and EPF10K200SRC240-3N by Intel. Compare key specifications, electrical parameters, packaging, lifecycle status, pricing, and availability to determine the best component for your design requirements.
Specification Comparison
| Parameter | EPF10K200SRC240-3 | EPF10K200SRC240-3N |
|---|---|---|
| Brand | Intel | Intel |
| Category | FPGA & CPLD | FPGA & CPLD |
| Lifecycle Status | Obsolete | Obsolete |
| Stock Status | In Stock | In Stock |
| Unit Price (USD) | $132.00 | $162.00 |
| Family | FLEX 10KE | FLEX 10KE |
| Series | FLEX-10KS | β |
| Logic Elements / Cells | 9984 | β |
| Total System Gates | 200,000 | β |
| Total RAM Bits | 98,304 | β |
| Number of LABs/CLBs | 1248 | β |
| Number of I/Os | 470 | β |
| Number of DLLs | 4 | β |
| Package | 240-BFQFP Exposed Pad (RQFP-240) | 240-pin RQFP (Power QFP) with exposed pad, 34.6 x 34.6 mm, 0.5 mm pitch |
| Package Dimensions | 34.60 x 34.6 mm, 0.5 mm pitch | β |
| Process Technology | 0.22 um CMOS | 0.22 Β΅m CMOS SRAM |
| Core Voltage (VCCINT) | 2.5 V | β |
| I/O Voltage (VCCIO) | MultiVolt (2.5 V / 3.3 V / 5.0 V tolerant) | β |
| Maximum Internal Frequency | 166.67 MHz | β |
| Propagation Delay | 0.4 ns | β |
| Operating Temperature | 0 C to 70 C (Commercial) | 0 Β°C to +70 Β°C (Commercial) |
| Mounting Type | Surface Mount | Surface Mount |
| RoHS Status | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS status] |
| Typical System Gates | β | 200,000 |
| Logic Elements (LEs) | β | 9,984 |
| Maximum Logic Elements | β | 9,984 |
| Embedded Array Blocks (EABs) | β | 24 |
| Maximum User RAM Bits | β | 98,304 |
| Logic Array Blocks (LABs) | β | 1,248 |
| User I/Os | β | 470 (effective); 182 user pins per RQFP-240 with the rest assigned to dedicated functions |
| Propagation Delay (tPD) | β | 0.40 ns |
| Internal Operating Frequency | β | 166.67 MHz |
| Core Supply Voltage | β | 2.5 V |
| MultiVolt I/O Support | β | 2.5 V and 3.3 V interfaces |
| JTAG Support | β | IEEE Std 1149.1 Boundary-Scan (contributes up to 31,250 gates of test logic) |
| Configuration Method | β | SRAM-based; requires external configuration device (e.g., EPC2) for power-up loading |
| Speed Grade | β | -3 (commercial) |