EPF8820ATC144-10 vs EPF8820ATC144-1 Comparison
Detailed side-by-side comparison of EPF8820ATC144-10 by Altera and EPF8820ATC144-1 by Altera. Compare key specifications, electrical parameters, packaging, lifecycle status, pricing, and availability to determine the best component for your design requirements.
Altera
EPF8820ATC144-10 - 672-Cell FLEX 8000 FPGA, 144-LQFP, 10ns | Altera
EPF8820ATC144-10 ObsoleteAltera
EPF8820ATC144-1 - FLEX 8000 FPGA, 672 Cells, 112 I/O, 144-TQFP | Altera
EPF8820ATC144-1 ObsoleteSpecification Comparison
| Parameter | EPF8820ATC144-10 | EPF8820ATC144-1 |
|---|---|---|
| Brand | Altera | Altera |
| Category | FPGA & CPLD | FPGA & CPLD |
| Lifecycle Status | Obsolete | Obsolete |
| Family | FLEX 8000 | FLEX 8000 |
| Usable Gates | approximately 8,000 | — |
| Logic Cells / Elements | 672 | — |
| Number of LABs/CLBs | 84 | — |
| Number of User I/Os | 112 | — |
| Total RAM Bits | [DATA_NEEDED: RAM bits per datasheet] | — |
| Propagation Delay (Speed Grade) | 10 ns (speed grade -10) | — |
| Process Technology | 0.42 µm CMOS | CMOS SRAM |
| Supply Voltage (Core) | 5 V | — |
| I/O Voltage (MultiVolt) | 3.3 V or 5.0 V | — |
| Configuration Memory | CMOS SRAM | — |
| Package | 144-pin LQFP (TQFP) 0.5 mm pitch | 144-pin TQFP |
| Configuration Devices Supported | EPC1, EPC1213, EPC1064, EPC1441 | — |
| Operating Temperature | 0 °C to 70 °C (commercial) | 0C to 70C (commercial) |
| RoHS Status | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS status] |
| Lead-Free | [DATA_NEEDED: lead-free status] | — |
| MSL Level | [DATA_NEEDED: MSL rating] | — |
| Mounting Type | Surface Mount | — |
| Device | — | EPF8820A |
| Logic Cells | — | 672 |
| Logic Array Blocks (LABs) | — | 84 |
| User I/Os | — | 112 |
| Equivalent Gates | — | ~8,000 usable gates |
| Flip-Flops (max) | — | 1,500 |
| Supply Voltage | — | 5.0 V (MultiVolt I/O supports 3.3 V or 5.0 V) |
| Speed Grade | — | -1 (slowest) |
| Configuration Method | — | SRAM, loaded via EPC1 / EPC1064 / EPC1213 / EPC1441 or parallel EPROM |
| In-Circuit Reconfigurability | — | Yes (ICR) |
| JTAG Boundary Scan | — | Yes (IEEE 1149.1) |