RTAX250S-1CG624E vs RTAX250S-CG624E Comparison
Detailed side-by-side comparison of RTAX250S-1CG624E by Microchip Technology and RTAX250S-CG624E by Microchip Technology. Compare key specifications, electrical parameters, packaging, lifecycle status, pricing, and availability to determine the best component for your design requirements.
Microchip Technology
RTAX250S-1CG624E - 250K-Gate Rad-Tolerant FPGA 624-CCGA | Microchip
RTAX250S-1CG624E ✓ ActiveMicrochip Technology
RTAX250S-CG624E - 250K-Gate Rad-Tolerant FPGA | Microchip
RTAX250S-CG624E ✓ ActiveSpecification Comparison
| Parameter | RTAX250S-1CG624E | RTAX250S-CG624E |
|---|---|---|
| Brand | Microchip Technology | Microchip Technology |
| Category | FPGA & CPLD | FPGA & CPLD |
| Lifecycle Status | Active | Active |
| Stock Status | In Stock | In Stock |
| Unit Price (USD) | $960.00 | $0.00 |
| Family | RTAX-S Radiation-Tolerant FPGA | RTAX-S radiation-tolerant FPGA |
| Equivalent System Gates | 250,000 | — |
| Logic Cells | 2816 | — |
| Maximum Toggle Frequency | 649 MHz | 649 MHz |
| CLB Combinatorial Delay (Max) | 0.930 ns | — |
| Core Supply Voltage | 1.5 V | 1.5 V |
| Process Technology | 0.15 um CMOS antifuse | 0.15 um CMOS |
| Speed Grade | -1 (approximately 15% faster than standard) | — |
| Package | 624-pin Ceramic Column Grid Array (CCGA) | — |
| Operating Temperature | -55C to +125C | -55C to +125C |
| Configuration Type | One-time programmable antifuse, live at power-up | — |
| Logic Family | CMOS | CMOS |
| SEU Hardening | SEU-hardened registers, immune to single-event upsets | SEU-hardened registers, no external TMR required |
| Embedded Memory | Embedded SRAM with built-in FIFO control | — |
| Mounting Type | Surface Mount | Surface Mount |
| Application Domain | Space flight / satellite systems | — |
| System Gates | — | 250000 gates |
| Logic Cells (CLBs) | — | 2816 |
| CLB Combinatorial Delay (max) | — | 0.930 ns |
| Package Type | — | CCGA-624 (ceramic column grid array, 624 pins) |
| Programming Technology | — | Antifuse (one-time programmable) |
| SEU Immunity | — | Immune to single-event upsets to specified LET threshold; SEU rate < 10-10 errors/bit-day |
| Power-Up Behavior | — | Live at power-up (true single-chip) |
| Target Application | — | Space-flight systems |