EPM3256AT1144-10S vs EPM3256ATC144-10N Vergleich

Detaillierter Direktvergleich von EPM3256AT1144-10S von Intel und EPM3256ATC144-10N von Altera. Vergleichen Sie die wichtigsten Spezifikationen, elektrischen Parameter, Gehäuse, Lebenszyklusstatus, Preise und Verfügbarkeit, um das beste Bauteil für Ihre Designanforderungen zu ermitteln.

Altera
EPM3256ATC144-10N EPM3256ATC144-10N - 256-Macro CPLD, 10ns, 144-TQFP | Altera

EPM3256ATC144-10N - 256-Macro CPLD, 10ns, 144-TQFP | Altera

EPM3256ATC144-10N ⚠ Letzte Bestellmöglichkeit

Spezifikationsvergleich

Parameter EPM3256AT1144-10S EPM3256ATC144-10N
Marke Intel Altera
Kategorie FPGA & CPLD FPGA & CPLD
Lebenszyklusstatus NRND Letzte Kaufgelegenheit
Lagerstatus In Stock In Stock
Stückpreis (USD) $21,30 $14,50
Family MAX 3000A —
Device Type CPLD (Complex Programmable Logic Device) CPLD (Complex Programmable Logic Device)
Macrocells 256 —
Logic Array Blocks (LABs) 16 —
Maximum User I/O Pins 212 —
Pin-to-Pin Delay (tPD) 10 ns —
Gehäuse TQFP-144 144-LQFP (TQFP, ATC suffix)
Montageart Surface Mount Surface Mount
Betriebstemperatur 0C to +85C (commercial) 0C to +70C (commercial) [DATA_NEEDED: exact operating-temp grade letter for -10N suffix]
Supply Voltage - Core 3.3 V —
I/O Voltage Support 2.5V / 3.3V / 5.0V MultiVolt —
Programmable Interconnect EEPROM-based, non-volatile —
In-System Programming Yes, via IEEE 1149.1 JTAG —
Configuration Cells EEPROM (instant-on, no external PROM) —
RoHS-Status [DATA_NEEDED: RoHS compliance status] [DATA_NEEDED: RoHS compliance - not explicitly confirmed in verified data]
Series — MAX 3000A
Macro Cells — 256
Usable Gates — 5,000 (up to 10,000 usable in family)
Number of I/Os — 116
Number of Logic Elements / Blocks — 16 LABs
Supply Voltage (VCCINT) — 3.3 V
Propagation Delay (tPD) — 10 ns
Maximum Counter Frequency — 227.3 MHz
Global Clocks — 3
Global Clear / OE — Yes (1 global clear, 1 global OE)
Program Memory Type — EEPROM (non-volatile, in-system programmable)
JTAG Support — IEEE Std. 1149.1 with pin-locking
ISP Compliance — IEEE Std. 1532
Boundary-Scan Test (BST) — Built-in, IEEE 1149.1 compliant
Lead-Free / Halogen-Free — [DATA_NEEDED: not explicitly confirmed in verified data]

Datenblätter & Ressourcen

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