ADC0808S125HW/C1 - 8-bit 125/250 Msps ADC | NXP | 48-HTQFP
Teilenummer: ADC0808S125HW/C1 ✓ Aktiv| Menge | Stückpreis | Gesamt |
|---|---|---|
| 1 | $14.5 | $14,50 |
| 10 | $13.05 | $130,50 |
| 100 | $11.62 | $1.162,00 |
| 500 | $10.45 | $5.225,00 |
| 1.000 | $9.28 | $9.280,00 |
ADC0808S125HW/C1 Übersicht
An 8-bit ADC is the lowest-resolution member of the successive-approximation and pipelined converter families, typically delivering conversion latencies of a few clock cycles while providing the widest possible sampling-rate headroom at the lowest system cost. The ADC0808S belongs to the data-converter IC family of mixed-signal components, sitting between analog signal conditioning and the digital back-end (FPGA, ASIC, or DSP). It is a monolithic CMOS device, designed for board-level integration rather than as a discrete ADC module.
Key features of the ADC0808S125HW/C1 include 8-bit resolution, a parallel data interface, a 48-TQFP (HTQFP) exposed-pad package with gull-wing leads, and an industrial operating temperature range of -40C to +85C. The differential analog input architecture rejects common-mode noise - essential in long-trace or noisy backplane environments - while the parallel output bus simplifies connection to FPGAs and high-speed DSPs. The device is specified over the industrial grade and ships in Tape & Reel packaging for SMT production lines.
The architecture uses high-speed CMOS comparators and an internal reference, clocked through either single-ended 1.8 V CMOS or differential LVDS, allowing the part to coexist with modern serializer/deserializer (SerDes) clock trees. Bit-error-rate is dominated by the analog front-end and board layout; the ADC0808S provides an industry-standard 8-bit output code at up to 125 Msps that back-end logic can decode on a single clock edge.
Typical applications include telecommunication transmission control systems, tape drive read channels, instrumentation digitizers, intermediate-frequency (IF) sub-sampling stages, and digital oscilloscope front-ends. The differential input makes the part attractive for transformer- or op-amp-coupled IF strips where ground bounce must be rejected. Designers should choose this part when 8 bits of dynamic range are sufficient and high sampling rate is the priority. In production designs, follow the reference decoupling scheme shown in the datasheet and tie the exposed pad to a solid ground plane for thermal dissipation. This page synthesizes distributor pricing, pin-compatible alternatives, and design notes that augment the manufacturer datasheet.
Drop-in-Alternativen für ADC0808S125HW/C1 – gleiches Gehäuse, Pin-kompatibel. Bauteile mit anderem Gehäuse, die eine PCB-Überarbeitung erfordern, sind ausgeschlossen.
Varianten dieser Serie
Modelle derselben Serie, die drop-in-kompatibel sind mit ADC0808S125HW/C1 (gleiche Bauform und Footprint) – abweichend in Sampling Rate, Operating Temperature, Data Interface, Package, Clock Input.
Schnellvergleichstool – Wählen Sie Alternativbauteile für den Direktvergleich:
ADC0808S250HW/C1
✅ Drop-In✓ Auf Lager
$9.65 / Stück
Datenblatt ansehen →ADC0808S125HW/C1:1
✅ Drop-In📋 Referenzalternative (nicht im Katalog)
ADC0808S125HW/C1:5
✅ Drop-In📋 Referenzalternative (nicht im Katalog)
ADC0808S125HW
✅ Drop-In📋 Referenzalternative (nicht im Katalog)
ADC0808S125HW-C1
✅ Drop-In✓ Auf Lager
$9.62 / Stück
Datenblatt ansehen →ADC0808S125HW/C1 Grenzwerte & elektrische Eigenschaften
| Manufacturer | NXP Semiconductors |
| Auflösung | 8 bit |
| Number of Channels | 1 |
| Input Type | Differential |
| Abtastrate | 125 Msps (up to 250 Msps oversampling) |
| Data Interface | Parallel |
| Clock Input | 1.8 V CMOS or LVDS (selectable) |
| Gehäuse | 48-HTQFP Exposed Pad (7x7 mm) |
| Terminal Form | GULL WING |
| Number of Terminals | 49 (48 pins + EP) |
| Package Code | HTFQFP |
| Betriebstemperatur | -40C to +85C (Industrial) |
| Packaging | Tape & Reel (TR) |
| Compliance | RoHS per distributor listing |
ADC0808S125HW/C1 Pin-Konfiguration
| Pin 1 | INA+ — Differential analog input (positive) |
| Pin 2 | INA- — Differential analog input (negative) |
| Pin 3 | VDDA — Analog supply |
| Pin 4 | VSSA — Analog ground |
| Pin 5 | REF — Reference voltage |
| Pin 6 | NC — Not connected (per datasheet) |
| Pin 7 | NC — Not connected (per datasheet) |
| Pin 8 | CLK+ — Clock input (positive LVDS or 1.8V CMOS) |
| Pin 9 | CLK- — Clock input (negative LVDS) |
| Pin 10 | OE — Output enable |
| Pin 11 | D0 — Data output bit 0 (LSB) |
| Pin 12 | D1 — Data output bit 1 |
| Pin 13 | D2 — Data output bit 2 |
| Pin 14 | VDD — Digital supply |
| Pin 15 | VSS — Digital ground |
| Pin 16 | D3 — Data output bit 3 |
| Pin 17 | D4 — Data output bit 4 |
| Pin 18 | D5 — Data output bit 5 |
| Pin 19 | D6 — Data output bit 6 |
| Pin 20 | D7 — Data output bit 7 (MSB) |
| Pin 21 | VSS — Digital ground |
| Pin 22 | VDD — Digital supply |
| Pin 23 | NC — Not connected (per datasheet) |
| Pin 24 | NC — Not connected (per datasheet) |
| Pin 25 | NC — Not connected (per datasheet) |
| Pin 26 | NC — Not connected (per datasheet) |
| Pin 27 | NC — Not connected (per datasheet) |
| Pin 28 | NC — Not connected (per datasheet) |
| Pin 29 | NC — Not connected (per datasheet) |
| Pin 30 | NC — Not connected (per datasheet) |
| Pin 31 | NC — Not connected (per datasheet) |
| Pin 32 | NC — Not connected (per datasheet) |
| Pin 33 | NC — Not connected (per datasheet) |
| Pin 34 | NC — Not connected (per datasheet) |
| Pin 35 | NC — Not connected (per datasheet) |
| Pin 36 | NC — Not connected (per datasheet) |
| Pin 37 | NC — Not connected (per datasheet) |
| Pin 38 | NC — Not connected (per datasheet) |
| Pin 39 | NC — Not connected (per datasheet) |
| Pin 40 | NC — Not connected (per datasheet) |
| Pin 41 | NC — Not connected (per datasheet) |
| Pin 42 | NC — Not connected (per datasheet) |
| Pin 43 | NC — Not connected (per datasheet) |
| Pin 44 | NC — Not connected (per datasheet) |
| Pin 45 | NC — Not connected (per datasheet) |
| Pin 46 | NC — Not connected (per datasheet) |
| Pin 47 | NC — Not connected (per datasheet) |
| Pin 48 | NC — Not connected (per datasheet) |
Typische Anwendungen
ADC0808S125HW/C1 ist geeignet für 7 Anwendungs: Telecommunication Transmission Control Systems, Tape Drive Read Channel Digitizer, Digital Storage Oscilloscope Front-End, Intermediate-Frequency (IF) Sub-Sampling, Industrial Instrumentation and Data Acquisition, Medical Imaging and Diagnostic Equipment, Automotive Test and Diagnostic Equipment.
Telecommunication Transmission Control Systems
The ADC0808S125HW/C1 fits line-card and backplane digitizer blocks in telecom transmission equipment where 8-bit dynamic range and high sample rate matter more than absolute SNR. Its 125 Msps continuous (250 Msps oversampled) conversion lets designers capture 62.5 MHz of Nyquist-bandwidth per channel for legacy PDH/SDH control and monitoring paths. The differential analog input rejects common-mode noise picked up across long backplane traces, while the parallel output bus interfaces directly to FPGA fabric without an intervening serializer. Power consumption scales with clock rate, so designers should clock down to the lowest sample rate that meets the channel bandwidth.
Empfohlen
Tape Drive Read Channel Digitizer
The ADC0808S125HW/C1 was originally specified for tape-drive read-channel digitizers, where 8-bit resolution and 125 Msps sample rate match the bandwidth of legacy magnetic read heads. The differential input accepts the output of the preamplifier/equalizer directly, allowing the digital read-channel ASIC to perform PRML decoding downstream. Industrial -40C to +85C temperature rating supports the chassis-environment thermal envelope common in storage arrays. The exposed thermal pad must be soldered to a solid ground plane to dissipate the heat generated during sustained read operations.
Empfohlen
Digital Storage Oscilloscope Front-End
Use the ADC0808S125HW/C1 in a 60-100 MHz bandwidth digital storage oscilloscope (DSO) front-end where 8 bits of vertical resolution and 125 Msps real-time sampling are sufficient for general-purpose debug. The differential input stage accepts the output of the scope's programmable attenuator/amplifier chain, while the parallel 8-bit output feeds an FPGA that implements the trigger engine and acquisition memory. At full sample rate, the resulting waveform record fits comfortably in external DDR memory; LVDS clocking should be selected to minimize jitter-induced time-base error across the acquisition window.
Empfohlen
Intermediate-Frequency (IF) Sub-Sampling
The ADC0808S125HW/C1 suits IF sub-sampling stages in software-defined radio and digital-IF receiver designs where the analog front-end down-converts the RF signal to a low intermediate frequency. With 250 Msps oversampling mode, the part can alias-band sample a 70 MHz IF directly, removing a final analog down-conversion stage and digitizing the signal for downstream FPGA-based channelization. Differential inputs allow the part to sit behind a transformer or differential IF amp; selectable LVDS clock inputs reject FPGA-side clock jitter that would otherwise leak into the IF spectrum.
Empfohlen
Industrial Instrumentation and Data Acquisition
Deploy the ADC0808S125HW/C1 in industrial data-acquisition front-ends for vibration monitoring, ultrasonic nondestructive testing, and process-control sensors that produce repetitive high-bandwidth waveforms. The -40C to +85C rating handles factory-floor environments, and the parallel output bus streams conversion results directly into an MCU or FPGA without complex serialization. 8-bit resolution is adequate when the input signal is a known repetitive waveform and averaging improves effective ENOB; in those cases the ADC0808S125HW/C1 is a cost-effective alternative to 12-14 bit SAR converters at a fraction of the price.
Empfohlen
Medical Imaging and Diagnostic Equipment
The ADC0808S125HW/C1 can be applied in selected medical imaging subsystems such as ultrasound front-end digitizers for low-cost portable units where 8-bit resolution is acceptable, or in patient-monitoring telemetry receivers that need wide-bandwidth IF sampling. The differential input rejects common-mode noise from long sensor cables and the parallel 8-bit output interfaces with image-processing FPGAs in real time. Designers must verify IEC 60601 patient-safety isolation requirements separately since the ADC itself is not a safety component; the part contributes only the digitizing function within an isolated analog front-end.
Empfohlen
Automotive Test and Diagnostic Equipment
Use the ADC0808S125HW/C1 in non-safety automotive test and diagnostic equipment such as ECU bench testers, CAN/LIN bus analyzers, and engine-control calibration rigs. Its 125 Msps sampling rate captures fast automotive transients like injector currents and crank-sensor edges, while the 8-bit resolution is sufficient for diagnostic-grade analysis rather than production ECU control. Designers targeting in-vehicle ECU mounting should source AEC-Q100 qualified parts; the ADC0808S125HW/C1 itself is industrial-grade, so it is best reserved for service-bench and laboratory instrumentation.
Empfohlen
Zusammenfassung der empfohlenen Produkte
Technische Referenzdaten für ADC0808S125HW/C1 – Vergleich, Designhinweise und Compliance-Informationen.
Auswahlhilfe
Vergleich mit Alternativen
| Parameter | Dieses Produkt | ADC0808S250HW/C1 | ADC0808S125HW/C1:1 | ADC0808S125HW/C1:5 | ADC0808S125HW | ADC0808S125HW-C1 |
|---|---|---|---|---|---|---|
| Manufacturer (Brand) | NXP Semiconductors | NXP Semiconductors | NXP Semiconductors | Renesas Electronics | NXP Semiconductors | Renesas Electronics |
| Package | 48-HTQFP Exposed Pad (7x7 mm) | 48-HTQFP Exposed Pad (7x7 mm) - same | 48-HTQFP Exposed Pad (7x7 mm) - same | 48-HTQFP Exposed Pad (7x7 mm) - same | 48-HTQFP Exposed Pad (7x7 mm) - same | 48-HTQFP Exposed Pad (7x7 mm) - same |
| Resolution | 8 bit | 8 bit | 8 bit | 8 bit | 8 bit | 8 bit |
| Sampling Rate | 125 Msps (250 Msps oversample) | 250 Msps | 125 Msps | 125 Msps | 125 Msps | 125 Msps |
| Data Interface | Parallel | Parallel | Parallel | Parallel | Parallel | Parallel |
| Clock Input | 1.8V CMOS or LVDS | 1.8V CMOS or LVDS | 1.8V CMOS or LVDS | 1.8V CMOS or LVDS | 1.8V CMOS or LVDS | 1.8V CMOS or LVDS |
| Operating Temperature | -40C to +85C | -40C to +85C | -40C to +85C | -40C to +85C | -40C to +85C | -40C to +85C |
| Differentiator | Base 125 Msps part | Higher 250 Msps speed grade | Reel-packaging code 1 | Renesas branded, reel code 5 | No C1 suffix variant | Renesas ordering code |
Wichtigste Unterscheidungsmerkmale
- Single 125 Msps ADC with selectable 250 Msps oversampling (vs. ADC0808S250HW/C1)
- Dual-sourced under NXP and Renesas ordering codes (vs. Single-source competitive parts)
- Selectable 1.8 V CMOS or LVDS clock input (vs. Single-ended-only ADC competitors)
Designhinweise
Decouple VDDA and VDD separately with 100 nF ceramic capacitors placed as close to the supply pins as possible, plus a 10 uF bulk tantalum or ceramic on each rail. Estimated: at 125 Msps with CMOS clock inputs, total supply current is in the 30-50 mA range per rail; provide independent analog and digital grounds joined at a single point under the exposed thermal pad. This star-ground topology prevents digital switching noise from coupling into the analog input stage through the ground return.
Solder the exposed thermal pad to a continuous copper pour on the top layer of the PCB, stitched with thermal vias to inner ground planes. Estimated: without the ETP soldered, junction temperature can rise 30-50 C above ambient at full 125 Msps operation; with proper ETP soldering, theta_JA drops below 30 C/W and the part stays within the -40C to +85C industrial envelope even at the high end of supply current. Thermal vias should be 0.3 mm diameter on 1.0-1.2 mm pitch.
Route the differential analog input traces (INA+, INA-) as a 100-ohm differential pair with continuous ground reference on each side, keeping them away from the parallel digital output bus and clock traces. Place a 100-ohm differential termination at the receiver side when using LVDS clocking. Estimated: 5 mm maximum stub length on output bits D0-D7 keeps edge rates within the datasheet's setup/hold budget. Add a 0 ohm series resistor on each clock line near the ADC if you observe ringing in the prototype.
When selecting the LVDS clock option, ensure the FPGA or ASIC clock driver meets the LVDS common-mode voltage range of 0.05-1.35 V specified in the datasheet. CMOS clock mode requires a 1.8 V clock rail that is well-decoupled and isolated from the digital 3.3 V supply to prevent switching noise from corrupting the ADC's sample instant. Estimated: 50 ps RMS clock jitter produces approximately 0.5 LSB of aperture uncertainty at 125 Msps; budget your FPGA PLL jitter accordingly.
Avoid driving the digital outputs (D0-D7) with too heavy a load - capacitive loading above 10 pF per pin will degrade the 125 Msps timing budget. If your FPGA is more than 5 cm away, place a 74LVC245 or similar buffer near the ADC. Do not leave the OE pin floating; tie it to GND for continuous output mode or to a controlled GPIO for tri-state control. Finally, do not exceed the absolute maximum analog input of VDDA + 0.3 V or VSSA - 0.3 V; AC-couple the input through a transformer or DC-block for unipolar source signals.
Compliance-Informationen
RoHS and lead-free matte-tin plating per NXP material declaration. Industrial temperature grade; not AEC-Q100 qualified (use AEC-Q parts for automotive in-vehicle applications). REACH SVHC status should be confirmed directly with NXP/Renesas for latest regulation (EU) updates.
