EP1C12Q240C8 vs EP1C12Q240I8ES Comparación

Comparación detallada lado a lado de EP1C12Q240C8 por Intel y EP1C12Q240I8ES por Intel. Compare las especificaciones clave, los parámetros eléctricos, el encapsulado, el estado del ciclo de vida, los precios y la disponibilidad para determinar el mejor componente para los requisitos de su diseño.

Comparación de especificaciones

Parámetro EP1C12Q240C8 EP1C12Q240I8ES
Marca Intel Intel
Categoría FPGA & CPLD FPGA & CPLD
Estado del ciclo de vida Última compra Obsolete
Estado del stock In Stock In Stock
Precio unitario (USD) $23,10 $7,15
Series Cyclone® —
Family Cyclone I (EP1C12) —
Logic Elements (LEs) 12,060 —
Embedded Memory (bits) 239,616 (234 kbit) —
User I/O Pins 173 —
PLLs 2 —
Embedded Multipliers Yes (per Cyclone architecture) —
Speed Grade C8 8
Core Voltage 1.5 V —
I/O Voltage 3.3 V (LVTTL/LVCMOS/LVDS tolerant) —
Process Technology 130 nm CMOS SRAM —
Encapsulado 240-BFQFP / PQFP-240, gull-wing —
Tipo de montaje Surface Mount —
Configuration Modes AS, PS, JTAG —
JTAG Support IEEE 1149.1 boundary-scan —
Estado RoHS Non-Compliant (legacy PQFP) unknown
Manufacturer — Intel
Manufacturer Part Number — EP1C12Q240I8ES
FPGA Family — Cyclone
Programmable Logic Type — FPGA (field-programmable gate array)
Configuration Type — SRAM-based
FPGA Process — 1.5-V, 0.13-um, all-layer copper SRAM process
Maximum Family Logic Elements — 20,060 LEs
Maximum Family Embedded RAM — 288 Kbits
EP1C12 Delivered Logic Elements — [DATA_NEEDED: EP1C12 exact LE count]
Package Code — FQFP
Package Description — 240-pin square QFP (PQFP/FQFP)
Number of Terminals — 240
Terminal Form — GULL WING
Package Shape — Square
JESD-609 Code — e0
Maximum Supply Voltage — 1.575 V
Nominal Core Supply Voltage — 1.5 V
Temperature Grade Code — I (industrial)
Ordering Code Variant — ES (engineering sample)
Minimum Operating Temperature — [DATA_NEEDED: minimum operating temperature]
Maximum Operating Temperature — [DATA_NEEDED: maximum operating temperature]
Supported Configuration — Configuration and JTAG boundary-scan testing supported

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