EP1C12Q240C8 vs EP1C12Q240I8ES 对比
详细并排对比 EP1C12Q240C8 出自 Intel 和 EP1C12Q240I8ES 出自 Intel。对比关键规格、电气参数、封装、生命周期状态、价格和供货情况，以确定最适合您设计需求的元器件。
规格对比
| 参数 | EP1C12Q240C8 | EP1C12Q240I8ES |
|---|---|---|
| 品牌 | Intel | Intel |
| 分类 | FPGA & CPLD | FPGA & CPLD |
| 生命周期状态 | 最后采购期 | Obsolete |
| 库存状态 | 有库存 | 有库存 |
| 单价（USD） | $23.10 | $7.15 |
| Series | Cyclone® | — |
| Family | Cyclone I (EP1C12) | — |
| Logic Elements (LEs) | 12,060 | — |
| Embedded Memory (bits) | 239,616 (234 kbit) | — |
| User I/O Pins | 173 | — |
| PLLs | 2 | — |
| Embedded Multipliers | Yes (per Cyclone architecture) | — |
| Speed Grade | C8 | 8 |
| Core Voltage | 1.5 V | — |
| I/O Voltage | 3.3 V (LVTTL/LVCMOS/LVDS tolerant) | — |
| Process Technology | 130 nm CMOS SRAM | — |
| 封装 | 240-BFQFP / PQFP-240, gull-wing | — |
| 安装类型 | Surface Mount | — |
| Configuration Modes | AS, PS, JTAG | — |
| JTAG Support | IEEE 1149.1 boundary-scan | — |
| RoHS 状态 | Non-Compliant (legacy PQFP) | unknown |
| Manufacturer | — | Intel |
| Manufacturer Part Number | — | EP1C12Q240I8ES |
| FPGA Family | — | Cyclone |
| Programmable Logic Type | — | FPGA (field-programmable gate array) |
| Configuration Type | — | SRAM-based |
| FPGA Process | — | 1.5-V, 0.13-um, all-layer copper SRAM process |
| Maximum Family Logic Elements | — | 20,060 LEs |
| Maximum Family Embedded RAM | — | 288 Kbits |
| EP1C12 Delivered Logic Elements | — | [DATA_NEEDED: EP1C12 exact LE count] |
| Package Code | — | FQFP |
| Package Description | — | 240-pin square QFP (PQFP/FQFP) |
| Number of Terminals | — | 240 |
| Terminal Form | — | GULL WING |
| Package Shape | — | Square |
| JESD-609 Code | — | e0 |
| Maximum Supply Voltage | — | 1.575 V |
| Nominal Core Supply Voltage | — | 1.5 V |
| Temperature Grade Code | — | I (industrial) |
| Ordering Code Variant | — | ES (engineering sample) |
| Minimum Operating Temperature | — | [DATA_NEEDED: minimum operating temperature] |
| Maximum Operating Temperature | — | [DATA_NEEDED: maximum operating temperature] |
| Supported Configuration | — | Configuration and JTAG boundary-scan testing supported |