EP1K100FI256-2 vs EP1K100FI256-3 Comparación
Comparación detallada lado a lado de EP1K100FI256-2 por Intel y EP1K100FI256-3 por Intel. Compare las especificaciones clave, los parámetros eléctricos, el encapsulado, el estado del ciclo de vida, los precios y la disponibilidad para determinar el mejor componente para los requisitos de su diseño.
Intel
EP1K100FI256-3 - 100K-Gate ACEX 1K FPGA, 186 I/O, FBGA-256 | Intel
EP1K100FI256-3 ⚠ Última compraComparación de especificaciones
| Parámetro | EP1K100FI256-2 | EP1K100FI256-3 |
|---|---|---|
| Marca | Intel | Intel |
| Categoría | FPGA & CPLD | FPGA & CPLD |
| Estado del ciclo de vida | Obsolete | Última compra |
| Estado del stock | In Stock | In Stock |
| Precio unitario (USD) | $92,00 | $52,90 |
| Family | ACEX 1K | ACEX 1K |
| Series | EP1K100 | — |
| Logic Elements / Cells | 4,992 | — |
| System Gates | 100,000 | — |
| Number of LABs/CLBs | 624 | — |
| Total RAM Bits | 49,152 | — |
| Number of I/O | 186 | — |
| Number of Gates | 257,000 | — |
| Voltage - Supply | 2.5 V | — |
| Temperatura de funcionamiento | -40 °C to +85 °C (Industrial) | — |
| Tipo de montaje | Surface Mount | Surface Mount |
| Encapsulado / Carcasa | 256-BGA (FineLine BGA, FBGA-256) | — |
| Speed Grade | -2 (mid-range) | -3 |
| Max Frequency | 250 MHz | — |
| Process Technology | 0.22 µm CMOS | 0.22 micron CMOS |
| Estado RoHS | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS status] |
| Device Logic Elements | — | 4,992 |
| Typical Gate Count | — | 100,000 gates |
| Maximum RAM Bits | — | 49,152 bits |
| User I/O Pins | — | 186 |
| Dedicated Inputs | — | 6 |
| Nominal Core Voltage | — | 2.5 V |
| Core Voltage Range | — | 2.375 V to 2.625 V |
| Rango de temperatura de funcionamiento | — | -40 C to +85 C (Industrial) |
| Encapsulado | — | 256-ball FineLine BGA (FBGA-256) |
| Configuration Method | — | SRAM-based, JTAG / PS / AS supported |
| Lead-Free | — | [DATA_NEEDED: lead-free status] |
| AEC-Q100 Qualification | — | Not qualified |
| Nivel MSL | — | [DATA_NEEDED: MSL level] |
| JTAG Boundary Scan | — | Yes (IEEE 1149.1) |