EPF8282ATI100-3N vs EPF8282ATC100-3 Comparación
Comparación detallada lado a lado de EPF8282ATI100-3N por Altera y EPF8282ATC100-3 por Intel. Compare las especificaciones clave, los parámetros eléctricos, el encapsulado, el estado del ciclo de vida, los precios y la disponibilidad para determinar el mejor componente para los requisitos de su diseño.
Comparación de especificaciones
| Parámetro | EPF8282ATI100-3N | EPF8282ATC100-3 |
|---|---|---|
| Marca | Altera | Intel |
| Categoría | FPGA & CPLD | FPGA & CPLD |
| Estado del ciclo de vida | Obsolete | Obsolete |
| Estado del stock | In Stock | In Stock |
| Precio unitario (USD) | $10,95 | $10,25 |
| Family | FLEX 8000 | FLEX 8000 |
| Logic Cells | 208 | — |
| Logic Array Blocks (LABs) | 26 | — |
| Usable Gates | 2,500 | 2,500 |
| User I/Os | 78 | — |
| Maximum Operating Frequency | 125 MHz | — |
| Process Technology | 0.42 um CMOS SRAM | 0.42 micron CMOS SRAM |
| Core Supply Voltage (VCCINT) | 5 V | — |
| I/O Supply Voltage (VCCIO) | 3.3 V or 5.0 V | — |
| Encapsulado | 100-pin TQFP | 100-pin TQFP (100-TQFP) |
| Tipo de montaje | Surface Mount | — |
| Temperatura de funcionamiento | 0C to +70C | — |
| Configuration Memory | SRAM (volatile) | — |
| Configuration Devices Supported | EPC1, EPC1064, EPC1213, EPC1441 | — |
| In-Circuit Reconfigurability | Yes (ICR) | — |
| Boundary-Scan Support | IEEE 1149.1 JTAG | — |
| Estado RoHS | [DATA_NEEDED: RoHS status] | — |
| Logic Cells (LEs) | — | 208 |
| Typical Gates Equivalent | — | 12,000 |
| Maximum User I/O | — | 78 |
| Number of Logic Array Blocks (LABs) | — | 26 |
| Embedded Array Blocks (EABs) | — | 6 |
| Total RAM Bits | — | 12 Kbits |
| Supply Voltage (Core) | — | 5 V |
| MultiVolt I/O Support | — | 3.3 V / 5 V |
| Maximum Frequency | — | 125 MHz |
| Speed Grade | — | -3 |
| Configuration Method | — | SRAM, EPC1/EPC1064/EPC1213/EPC1441, microprocessor |
| Operating Temperature (Commercial) | — | 0 C to +70 C |
| In-Circuit Reconfigurable | — | Yes (ICR) |
| Boundary Scan | — | JTAG IEEE 1149.1 |