EPM3512AQC208-3 vs EPM3512AQC208-10N Comparación
Comparación detallada lado a lado de EPM3512AQC208-3 por Altera y EPM3512AQC208-10N por Intel. Compare las especificaciones clave, los parámetros eléctricos, el encapsulado, el estado del ciclo de vida, los precios y la disponibilidad para determinar el mejor componente para los requisitos de su diseño.
Altera
EPM3512AQC208-3 - MAX 3000A CPLD, 512 Macrocells, 172 I/O, PQFP-208 | Altera
EPM3512AQC208-3 ⚠ Última compraComparación de especificaciones
| Parámetro | EPM3512AQC208-3 | EPM3512AQC208-10N |
|---|---|---|
| Marca | Altera | Intel |
| Categoría | FPGA & CPLD | FPGA & CPLD |
| Estado del ciclo de vida | Última compra | Obsolete |
| Estado del stock | In Stock | In Stock |
| Precio unitario (USD) | $27,80 | $42,80 |
| Family | MAX 3000A | MAX 3000A |
| Device Type | CPLD (Complex Programmable Logic Device) | CPLD (Complex Programmable Logic Device) |
| Macrocells | 512 | 512 |
| Logic Array Blocks (LABs) | 16 (32 macrocells each) | 16 |
| Maximum User I/O Pins | 172 | — |
| Encapsulado | PQFP-208 | 208-pin PQFP (Plastic Quad Flat Pack) |
| Speed Grade | -3 | -10 |
| Supply Voltage - Core (VCCINT) | 3.3 V | — |
| I/O Bank Supply Voltage (VCCIO) | 2.5 V / 3.3 V / 5.0 V (multiVolt) | — |
| In-System Programmability | Yes (IEEE Std. 1532 compliant) | — |
| Boundary-Scan Test | Yes (IEEE Std. 1149.1 / JTAG) | — |
| Program/Erase Cycles | 100 minimum [DATA_NEEDED: exact datasheet figure] | — |
| Non-Volatile Configuration | Yes (EEPROM-based) | — |
| Temperatura de funcionamiento | [DATA_NEEDED: industrial/commercial grade range] | 0 C to 70 C (commercial) |
| Estado RoHS | [DATA_NEEDED: confirm from datasheet] | [DATA_NEEDED: RoHS status not in verified web data] |
| Tipo de montaje | Surface Mount | — |
| Nivel MSL | [DATA_NEEDED: moisture sensitivity level] | — |
| Usable Gates | — | Up to 10,000 |
| User I/Os | — | 172 |
| Tensión de alimentación | — | 3.3 V |
| Pin-to-Pin Delay | — | 4.5 ns (-10 speed grade) |
| Maximum Internal Frequency | — | 227.3 MHz |
| Process Technology | — | CMOS EEPROM |
| In-System Programming | — | IEEE Std. 1149.1 JTAG, IEEE Std. 1532 |
| Boundary-Scan Test (BST) | — | Built-in, IEEE 1149.1 compliant |
| I/O Standards | — | MultiVolt (1.8V / 2.5V / 3.3V) |