RTAX2000SL-1LG624V vs RTAX2000SL-1CGS624V Comparación
Comparación detallada lado a lado de RTAX2000SL-1LG624V por Microchip Technology y RTAX2000SL-1CGS624V por Microsemi. Compare las especificaciones clave, los parámetros eléctricos, el encapsulado, el estado del ciclo de vida, los precios y la disponibilidad para determinar el mejor componente para los requisitos de su diseño.
Microchip Technology
RTAX2000SL-1LG624V - 2M-Gate Rad-Tolerant FPGA | Microchip
RTAX2000SL-1LG624V ✓ ActivoMicrosemi
RTAX2000SL-1CGS624V - 2M-Gate Rad-Tolerant FPGA | Actel/Microchip
RTAX2000SL-1CGS624V ✓ ActivoComparación de especificaciones
| Parámetro | RTAX2000SL-1LG624V | RTAX2000SL-1CGS624V |
|---|---|---|
| Marca | Microchip Technology | Microsemi |
| Categoría | FPGA & CPLD | FPGA & CPLD |
| Estado del ciclo de vida | Activo | Activo |
| Estado del stock | In Stock | In Stock |
| Precio unitario (USD) | $9.600,00 | $0,00 |
| Logic Cells | 32256 | — |
| CLBs (Configurable Logic Blocks) | 21504 | — |
| Equivalent Gates | 2000000 (approx.) | — |
| Family | RTAX-S/SL (radiation-tolerant FPGA) | — |
| Process Variant | SL (super low-power) CMOS | — |
| Core Supply Voltage | 1.5 V (nominal) | [DATA_NEEDED: core supply voltage] |
| Temperatura de funcionamiento | -55C to +125C | [DATA_NEEDED: operating temperature range] |
| Encapsulado | 624-terminal ceramic CGA (CG624) | 624-ball ceramic CGA (CGS624) |
| Tipo de montaje | Surface Mount (column grid array) | Surface Mount |
| Programming Technology | Anti-fuse, one-time programmable | — |
| Configuration | Live at power-up, single-chip (no external config storage) | One-time programmable (OTP), live at power-up, single chip |
| Radiation Tolerance | Radiation-tolerant for space flight systems | — |
| Speed Grade | -1 | -1 |
| Application Class | Space flight / aerospace | — |
| Estado RoHS | [DATA_NEEDED: RoHS status] | — |
| Embedded Memory | [DATA_NEEDED: embedded SRAM bits] | Up to 540 kbits with optional EDAC |
| Equivalent System Gates | — | 2000000 |
| Logic Cells (CLBs) | — | 21504 |
| User I/Os (max, package dependent) | — | Up to 684 |
| Total Ionizing Dose (TID) | — | 300 krad (functional), 200 krad (parametric) |
| SEU Rate | — | Less than 1E-10 errors per bit-day |
| Technology | — | Digital CMOS, antifuse nonvolatile |
| Quality / Screening Suffix | — | S (space flow), V suffix qualification level |
| I/O Supply Voltage | — | [DATA_NEEDED: I/O supply voltage] |
| Embedded SRAM Features | — | Built-in FIFO control logic |
| Clocking | — | Segmentable clocks, chip-wide highway routing |