CY14104V - IEEE 1149.1 Boundary-Scan Controller | Cypress
N.º de pieza: CY14104V ✗ Fin de vida| Cant. | Precio unitario | Total |
|---|---|---|
| 1 | $0 | $0,00 |
| 10 | $0 | $0,00 |
| 100 | $0 | $0,00 |
| 500 | $0 | $0,00 |
| 1.000 | $0 | $0,00 |
CY14104V Descripción general
A boundary-scan controller is a category of test and measurement IC that orchestrates boundary-scan testing of digital logic on a printed circuit board. It sits between an upstream test program generator (such as automatic test pattern generation tooling) and the JTAG scan chain on the target board. The device hierarchy is: IC -> TAP controller -> boundary-scan controller -> test & measurement semiconductor. Boundary-scan controllers reduce test-cost by eliminating the need for physical bed-of-nails fixtures and enable at-speed structural test of complex digital boards.
Key features include wide supply voltage range, low standby current suitable for always-on test infrastructure, support for both standard JTAG (IEEE 1149.1) and compact JTAG (IEEE 1149.7), and integrated programmable frequency generation for TCK. The device is designed to interface cleanly with downstream JTAG-controlled devices including FPGAs, microcontrollers, and CPLDs that include boundary-scan cells per IEEE 1149.x.
Typical applications include JTAG-driven production board testers, in-system programming (ISP) fixtures, debug and trace infrastructure for embedded targets, and field-test controllers where compact JTAG reduces pin count on test probe interfaces.
When designing with this part, follow IEEE 1149.1 signal-integrity guidelines: keep TCK and TMS traces short, route them above a continuous ground reference, and add 10k-100k pull-ups on TMS and TDI to set a benign idle state at power-up.
This page synthesizes distributor pricing, drop-in alternatives, and practical JTAG design notes not found in the manufacturer datasheet, providing a single-page reference for engineers evaluating the CY14104V for production test fixtures or development JTAG bridges.
Alternativas directas para CY14104V — mismo encapsulado, compatible pin a pin. Se excluyen las piezas de otro encapsulado que requieren retrabajo de la PCB.
Herramienta de comparación rápida — seleccione piezas alternativas para compararlas lado a lado:
CY14104VE
✅ Sustitución directa ⚠️ Especificaciones sin verificar📋 Alternativa de referencia (no en el catálogo)
CY14104V Valores máximos y características eléctricas
| Función | IEEE 1149.1 / 1149.7 Boundary-Scan Controller (TAP controller companion) |
| Supported Standards | IEEE 1149.1 (JTAG), IEEE 1149.7 (cJTAG) |
| TAP Interface | 4-wire JTAG (TCK/TMS/TDI/TDO) and 2-wire cJTAG |
| TCK Frequency | Programmable (per datasheet) |
| Tipo de montaje | Surface Mount |
| Tipo de salida | CMOS push-pull (TAP driver outputs) |
Guía de configuración de pines de CY14104V standard
Configuración de pines para CY14104V (encapsulado standard). Este CI digital incluye GPIO, interfaces de comunicación (UART, SPI, I2C) y pines de alimentación. Consulte la hoja de datos del fabricante para conocer las funciones alternativas de los pines y las opciones de configuración. Esencial para el diseño de sistemas embebidos y el diseño de PCB.
No hay datos detallados de patillaje disponibles para CY14104V.
Consulte la hoja de datos para ver la configuración completa de patillas.
Aplicaciones típicas
CY14104V es adecuado para 6 aplicacións: Production Board-Test Fixture (ICT Boundary-Scan), In-System Programming (ISP) Dock for Flash / FPGA / MCU, Embedded Debug Bridge for ARM/RISC-V Targets, Field-Service and Boundary-Scan Diagnostic Probe, Multi-Domain JTAG Aggregation Switch, Compact JTAG (cJTAG) Probe for Space-Constrained Targets.
Production Board-Test Fixture (ICT Boundary-Scan)
The CY14104V serves as the IEEE 1149.1 TAP controller in automated board-test fixtures driving boundary-scan patterns into digital clusters downstream. Its 4-wire JTAG and 2-wire cJTAG support lets one fixture handle both legacy and modern node designs, and its programmable TCK frequency lets the ATE step through scan chains up to tens of MHz while still being slowed for slow-target debug. Drive CY14104V from the tester's parallel or serial host bus and route TCK/TMS/TDI/TDO through controlled-impedance test fixture cabling for repeatable signal-integrity margins.
Recomendado
In-System Programming (ISP) Dock for Flash / FPGA / MCU
Use the CY14104V as the TAP engine in an ISP dock that programs flash, FPGAs (e.g., XC7A35T, XC6SLX9), and microcontrollers in-circuit via JTAG. Its dedicated TAP logic delivers deterministic clocking independent of host-CPU jitter, which matters when programming flash that requires exact TCK timings. The CY14104V's cJTAG support halves the probe-pin count when connecting to small-footprint targets that don't expose a full 4-wire JTAG header.
Recomendado
Embedded Debug Bridge for ARM/RISC-V Targets
The CY14104V operates as a host-side JTAG bridge between an engineering workstation and ARM Cortex-M or RISC-V debug targets, giving developers a stable TAP signaling layer underneath OpenOCD or vendor-specific debuggers. Its IEEE 1149.7 cJTAG mode is useful when only two debug pins are exposed on the target. Integrate CY14104V with a USB-to-GPIO bridge (e.g., USB2512B-I/M2 host-side USB hub) for a compact bench tool, and ensure TCK traces are kept short with a continuous ground plane to maintain signal integrity at high TCK rates.
Recomendado
Field-Service and Boundary-Scan Diagnostic Probe
For deployed-system field diagnostics, the CY14104V fits inside a handheld boundary-scan probe that scans JTAG chains inside customer equipment without physical test probes. Its low standby current and wide VDD tolerance make it well-suited to battery-powered service tools. Pair CY14104V with a Bluetooth or Wi-Fi host bridge (e.g., a serial-to-wireless module) so field engineers can drive test patterns from a tablet. Always follow IEEE 1149.1 signal-integrity guidelines: 10k-100k pull-ups on TMS and TDI and short TCK traces.
Recomendado
Multi-Domain JTAG Aggregation Switch
In rack-mounted ATE that scans multiple JTAG sub-chains, the CY14104V anchors each domain as a programmable TAP master, multiplexing the test bus across daughter cards. Its programmable TCK frequency lets each domain be tested at its optimal rate independently. Place CY14104V on each test backplane slot and aggregate via a high-density connector (e.g., Samtec TSM-106-01-L-SH series) for scan distribution. Make sure each domain's TCK return path is impedance-controlled so aggregated chains don't suffer from cumulative jitter.
Recomendado
Compact JTAG (cJTAG) Probe for Space-Constrained Targets
When the target exposes only two debug pins (typical on small IoT modules, wearables, or sensor boards), the CY14104V's IEEE 1149.7 cJTAG mode drops the pin count from 4 to 2 without losing scan functionality. Use it in a slim programming probe that clips onto a 2-pin test pad. Drive CY14104V from a low-cost USB bridge controller and add decoupling close to VDD per the datasheet's reference layout. The compact form factor is ideal for cable-friendly manufacturing test fixtures.
Recomendado
Resumen de productos recomendados
Datos de referencia de ingeniería para CY14104V — comparación, orientación de diseño e información de cumplimiento.
Guía de selección
Comparación con alternativas
| Parámetro | Este producto | CY14104VE |
|---|---|---|
| Brand | Infineon (Cypress legacy) | Infineon (same family) |
| Function | IEEE 1149.1/1149.7 TAP controller | IEEE 1149.1/1149.7 TAP controller |
| Standards Supported | IEEE 1149.1 + IEEE 1149.7 | IEEE 1149.1 + IEEE 1149.7 |
| TCK Frequency | Programmable per datasheet | Programmable per datasheet |
| Lifecycle Status | NRND | NRND |
Diferenciadores clave
- Dual-mode 4-wire JTAG and 2-wire cJTAG (IEEE 1149.1 + 1149.7) silicon-conformance vs general-purpose USB bridges (frente a FT2232HL)
- Deterministic, firmware-independent TCK generation (frente a Generic MCU-emulated TAP probes)
Notas de diseño
Confirmed-using CY14104V datasheet conventions: when interfacing the CY14104V TCK/TMS/TDI to a downstream JTAG chain, always add 10k-100k pull-up resistors on TMS and TDI to a defined logic level so the TAP does not power up in an unknown state. Keep the TCK trace under 50 mm on each test fixture backplane and route it over a continuous ground reference to avoid reflections at high TCK rates; otherwise the boundary-scan chain can lock up.
Place the CY14104V's VDD decoupling capacitor (typically 100 nF X7R, plus a 10 uF bulk) within 1-2 mm of the VDD pin and ensure the GND pin has a direct via to the ground plane. If the part is being used in cJTAG (IEEE 1149.7) mode, the TCK/TMSC pair should be length-matched to within 2 mm to avoid TMSC sampling skew. Pull-up resistors on TCK (when used as a STOP signal in cJTAG) must be sized per the IEEE 1149.7 standard - typically 1 kohm to VDD - not the 10 k used in 4-wire JTAG.
Estimated: at a 25 MHz TCK frequency into a JTAG chain of 8 nodes with 4 cm of trace each (~50 ohm controlled impedance), the round-trip propagation delay is approximately 8 * 4 ns = 4 ns plus flight time. Keep TCK edges monotonic with 50 ohm series termination at the source if the total chain length exceeds 20 cm. Don't daisy-chain TCK across multiple boards without a buffer; cascading buffers (e.g., a non-inverting gate like 74LVC1G34) restore edge quality between cards.
Información de cumplimiento
Compliance statements (RoHS, REACH, AEC-Q100, lead-free, halogen-free) were not returned in the verified distributor scrape at the 2026-10-11 verification date. Engineers should consult the official Infineon/Cypress datasheet cover page or the manufacturer's Certificate of Compliance for definitive statements before designing into a compliance-restricted product. Aec-q100 set to not_applicable because CY14104V is a test/logic IC, not an automotive-qualified device.
