M1AFS600-1FG256 vs AFS600-1FG256I مقایسه
مقایسه دقیق کنار به کنار M1AFS600-1FG256 توسط Microchip Technology و AFS600-1FG256I توسط Microchip Technology. مشخصات کلیدی، پارامترهای الکتریکی، بسته‌بندی، وضعیت چرخه عمر، قیمت‌گذاری و موجودی را مقایسه کنید تا بهترین قطعه را برای نیازهای طراحی خود تعیین کنید.
Microchip Technology
AFS600-1FG256I - 600K-Gate Fusion Mixed-Signal FPGA | Microchip
AFS600-1FG256I ✓ فعالمقایسه مشخصات
| پارامتر | M1AFS600-1FG256 | AFS600-1FG256I |
|---|---|---|
| برند | Microchip Technology | Microchip Technology |
| دسته‌بندی | FPGA & CPLD | FPGA & CPLD |
| وضعیت چرخه عمر | فعال | فعال |
| Series | Fusion | — |
| Number of Logic Elements/Cells | [DATA_NEEDED: Number of Logic Elements/Cells] | — |
| Total RAM Bits | 110592 | — |
| Number of I/O | 119 | — |
| Number of Gates | 600000 | — |
| Voltage - Supply | 1.425V ~ 1.575V | — |
| نوع نصب | Surface Mount | — |
| بسته‌بندی / کیس | 256-LBGA | — |
| Supplier Device Package | 256-FPBGA (17x17) | — |
| دمای کاری | 0°C ~ 85°C (TJ) | 0°C to 85°C |
| وضعیت RoHS | RoHS non-compliant | — |
| Manufacturer Lead Time | 16 weeks | — |
| Product Status | Active | — |
| Packaging | Tray | — |
| Core Voltage | 1.5V | — |
| Technology | 130nm | — |
| Maximum Frequency | 1282.05MHz | — |
| Device Type | — | Fusion mixed-signal field-programmable gate array (FPGA) |
| System Gates | — | 600,000 gates |
| Logic Family | — | Flash-based CMOS |
| I/O Count | — | 119 I/O |
| ولتاژ تغذیه | — | 1.5 V |
| Process Technology | — | 130 nm CMOS |
| Metal Layers | — | 7 layers |
| بسته‌بندی | — | 256-LBGA, 1 mm pitch |
| تعداد پایه | — | 256 pins |
| Configuration Memory | — | Nonvolatile flash |
| Power-Up Behavior | — | Live at power-up (LAPU) |
| Integrated Resources | — | Configurable analog, large flash memory blocks, clock generation and management |
| Programmable Logic | — | High-performance flash-based programmable logic |
| RoHS Compliance | — | [DATA_NEEDED: RoHS compliance status] |
| REACH Compliance | — | [DATA_NEEDED: REACH compliance status] |
| AEC-Q100 Qualification | — | [DATA_NEEDED: AEC-Q100 qualification status] |
| Junction Test Temperature | — | 100°C |