ADS5527IRGZ25 - 12-Bit 210MSPS ADC w/ DDR LVDS/CMOS | TI
Référence : ADS5527IRGZ25 ✓ Actif| Qté | Prix unitaire | Total |
|---|---|---|
| 1 | $36.5 | $36,50 |
| 10 | $32.75 | $327,50 |
| 100 | $28.4 | $2 840,00 |
| 500 | $24.1 | $12 050,00 |
| 1 000 | $21.8 | $21 800,00 |
ADS5527IRGZ25 Présentation
An analog-to-digital converter (ADC) is a data-converter sub-category of mixed-signal ICs that translates continuous-time analog signals into discrete digital codes for processing by FPGAs, ASICs, DSPs, or microcontrollers. The ADS5527 sits inside the high-speed pipelined ADC family (>100 MSPS), which itself is a subclass of Nyquist-rate data converters, which are part of the broader data-converter category within power management and signal-chain semiconductors. This hierarchy places the part in the high-performance signal-acquisition segment typically used in test-and-measurement, communications, defense, and medical imaging.
Key features include 210 MSPS guaranteed sampling rate, 12-bit resolution, 1.4 GHz input bandwidth, DDR LVDS/CMOS programmable outputs, internal reference, low-latency pipeline architecture, and a 48-pin VQFN thermally enhanced package with exposed pad. The wide input bandwidth relaxes the requirements of the front-end analog anti-alias filter and supports undersampling of IF signals in communications receivers. The integrated reference reduces external component count and eases board layout.
The architecture uses multiple low-resolution pipeline stages with digital error correction, residue amplifiers, and a final flash stage to achieve low-latency, high-throughput conversion. Internal calibration on power-up reduces gain and offset errors, while the LVDS output drivers provide robust noise immunity and enable long-distance board traces to FPGAs or DSPs without signal-integrity degradation. The CMOS mode allows direct bus connection to general-purpose processors at the cost of higher pin count and EMI.
Typical applications are broadband communications receivers, test-and-measurement digitizers, medical imaging front ends, radar and defense signal acquisition, and high-end video processing. For communications, the part commonly digitizes IF signals at base stations. For test equipment, it enables wideband digital oscilloscopes and spectrum analyzers. For medical imaging, it captures high-speed ultrasound or CT detector outputs.
When designing with this device, provide clean 3.3 V supplies to AVDD and DVDD with adequate decoupling near the pins, and solder the exposed thermal pad to a low-impedance ground plane for proper heat sinking. The DDR LVDS output clock must be properly aligned with the data lines using FPGA IDDR/SERDES resources, and the input common-mode must be set via the internal VCM pin to maximize SNR. AIN should be AC-coupled through a wideband transformer for single-ended-to-differential conversion.
This page synthesizes distributor pricing, drop-in alternatives, and practical design notes that complement, but do not replace, the official Texas Instruments ADS5527 datasheet.
Alternatives de remplacement direct pour ADS5527IRGZ25 — même boîtier, compatible broche à broche. Les références à boîtier différent nécessitant une retouche du PCB sont exclues.
Outil de comparaison rapide — sélectionnez des références alternatives pour une comparaison côte à côte :
ADS5527IRGZR
✅ Remplacement direct📋 Alternative de référence (hors catalogue)
ADS5527IRGZT
✅ Remplacement direct📋 Alternative de référence (hors catalogue)
ADS5527IRGZTG4
✅ Remplacement direct📋 Alternative de référence (hors catalogue)
ADS5527IRGZRG4
✅ Remplacement direct📋 Alternative de référence (hors catalogue)
ADS5525IRGZR
✅ Remplacement direct ⚠️ Spécifications non vérifiées📋 Alternative de référence (hors catalogue)
ADS5527IRGZ25 Valeurs maximales et caractéristiques électriques
| Résolution | 12 bit |
| Sample Rate | 210 MSPS |
| Number of Input Channels | 1 |
| Architecture | Pipelined |
| Analog Supply Voltage | 3.3 V |
| Digital Supply Voltage | 3.3 V (or 1.8 V LVDS mode) |
| Input Bandwidth | 1.4 GHz |
| Input Type | Differential analog |
| Output Interface | DDR LVDS / Parallel CMOS (selectable) |
| Reference Type | Internal |
| Boîtier | 48-pin VQFN (RGZ) 7x7 mm |
| Température de fonctionnement | -40 °C to +85 °C (industrial) |
| Type de montage | Surface Mount with exposed thermal pad |
| Statut RoHS | Compliant |
| Lead-Free | Yes |
| AEC-Q100 | Not qualified (industrial grade) |
Configuration des broches de ADS5527IRGZ25
| Broche 1 | AVDD — Analog supply 3.3 V |
| Broche 2 | AVDD — Analog supply 3.3 V |
| Broche 3 | AVSS — Analog ground |
| Broche 4 | AINP — Differential analog input positive |
| Broche 5 | AINM — Differential analog input negative |
| Broche 6 | VCM — Common-mode voltage output (1.2 V) |
| Broche 7 | REF — Internal reference voltage (decouple to AVSS) |
| Broche 8 | REFT — Reference top (decouple) |
| Broche 9 | REFB — Reference bottom (decouple) |
| Broche 10 | AVSS — Analog ground |
| Broche 11 | AVDD — Analog supply 3.3 V |
| Broche 12 | CLKP — Differential clock input positive |
| Broche 13 | CLKM — Differential clock input negative |
| Broche 14 | AVSS — Analog ground |
| Broche 15 | SLEEP — Sleep mode control (active high) |
| Broche 16 | RESET — Hardware reset (active low) |
| Broche 17 | OE — Output enable (active high) |
| Broche 18 | LVDS/CMOS — Output mode select (LVDS=1, CMOS=0) |
| Broche 19 | DVDD — Digital supply (3.3 V CMOS / 1.8-3.3 V LVDS) |
| Broche 20 | DGND — Digital ground |
| Broche 21 | D11+ — DDR LVDS data output D11 positive |
| Broche 22 | D11- — DDR LVDS data output D11 negative |
| Broche 23 | D10+ — DDR LVDS data output D10 positive |
| Broche 24 | D10- — DDR LVDS data output D10 negative |
| Broche 25 | D9+ — DDR LVDS data output D9 positive |
| Broche 26 | D9- — DDR LVDS data output D9 negative |
| Broche 27 | D8+ — DDR LVDS data output D8 positive |
| Broche 28 | D8- — DDR LVDS data output D8 negative |
| Broche 29 | D7+ — DDR LVDS data output D7 positive |
| Broche 30 | D7- — DDR LVDS data output D7 negative |
| Broche 31 | D6+ — DDR LVDS data output D6 positive |
| Broche 32 | D6- — DDR LVDS data output D6 negative |
| Broche 33 | D5+ — DDR LVDS data output D5 positive |
| Broche 34 | D5- — DDR LVDS data output D5 negative |
| Broche 35 | D4+ — DDR LVDS data output D4 positive |
| Broche 36 | D4- — DDR LVDS data output D4 negative |
| Broche 37 | D3+ — DDR LVDS data output D3 positive |
| Broche 38 | D3- — DDR LVDS data output D3 negative |
| Broche 39 | D2+ — DDR LVDS data output D2 positive |
| Broche 40 | D2- — DDR LVDS data output D2 negative |
| Broche 41 | D1+ — DDR LVDS data output D1 positive |
| Broche 42 | D1- — DDR LVDS data output D1 negative |
| Broche 43 | D0+ — DDR LVDS data output D0 positive |
| Broche 44 | D0- — DDR LVDS data output D0 negative |
| Broche 45 | CLKOUT+ — DDR LVDS bit-clock output positive |
| Broche 46 | CLKOUT- — DDR LVDS bit-clock output negative |
| Broche 47 | FCLK+ — DDR LVDS frame-clock output positive |
| Broche 48 | FCLK- — DDR LVDS frame-clock output negative |
Applications typiques
ADS5527IRGZ25 convient pour 6 applications: Broadband Communications Receiver, Test and Measurement Digitizer, Medical Imaging Ultrasound Front End, Radar and Defense Signal Acquisition, High-End Video Processing and Broadcast, Industrial Process Control and Data Acquisition.
Broadband Communications Receiver
The ADS5527IRGZ25's 210 MSPS sampling rate and 1.4 GHz analog input bandwidth make it well suited for digitizing wideband IF signals in wireless base-station receivers. With 12-bit resolution, it preserves dynamic range for QAM and OFDM demodulation while keeping BOM cost lower than 14-/16-bit alternatives. DDR LVDS outputs enable robust, low-EMI routing to an FPGA baseband processor over 5-10 cm of board trace, while CMOS mode supports direct connection to ASIC bus interfaces. Designers place a wideband balun or active differential driver ahead of AINP/AINM to optimize SFDR. Compared with the ADS5525 at 125 MSPS, the ADS5527IRGZ25 supports higher channel bandwidths and stricter EVM targets for 4G/5G small cells and software-defined radio platforms.
Recommandé
Test and Measurement Digitizer
For digital oscilloscopes, spectrum analyzers, and arbitrary waveform digitizers, the ADS5527IRGZ25 provides 210 MSPS throughput with 1.4 GHz input bandwidth that supports undersampling of microwave-range IF signals. The internal reference reduces calibration drift, while DDR LVDS output mode minimizes switching noise that would otherwise degrade low-level measurements. The 48-pin VQFN package allows dense multi-channel board layouts (4+ channels per digitizer card), and the industrial -40 °C to +85 °C temperature range suits benchtop and portable instruments. The pipelined architecture delivers consistent latency ideal for triggered acquisition, and combined with a precision front-end attenuator and driver, it enables 8-bit effective ENOB at full input bandwidth.
Recommandé
Medical Imaging Ultrasound Front End
The ADS5527IRGZ25's 210 MSPS sample rate is well matched to multi-channel ultrasound receivers digitizing 40 MHz transducer outputs at 4x oversampling. Its 12-bit resolution is sufficient for portable and mid-range ultrasound systems where power and cost matter more than 14-/16-bit dynamic range. The DDR LVDS interface supports low-EMI routing to an FPGA image-formation processor on the same PCB, while CMOS outputs enable direct interfacing to DSPs in simpler architectures. The 48-pin VQFN (RGZ) 7x7 mm package allows 8-32 channels on a single board using multiple ADS5527IRGZ25 instances. Compared to the AD9265 16-bit 125 MSPS, this part costs less and samples faster, but offers lower dynamic range per channel.
Recommandé
Radar and Defense Signal Acquisition
Radar and electronic-warfare receivers benefit from the ADS5527IRGZ25's 1.4 GHz input bandwidth, which supports direct sampling of L-band and S-band IF stages. The 210 MSPS throughput enables real-time pulse compression and digital beamforming on FPGA back-ends, while the 12-bit resolution preserves signal-to-clutter ratios typical in surveillance radar. DDR LVDS outputs provide noise immunity in dense EW chassis where multiple ADCs operate simultaneously. The -40 °C to +85 °C industrial temperature range supports outdoor and shipboard environments. Compared with 16-bit alternatives that sacrifice sample rate for resolution, the ADS5527IRGZ25 prioritizes bandwidth and throughput - ideal for ESM/ELINT receivers where frequency agility is critical.
Recommandé
High-End Video Processing and Broadcast
Studio-quality broadcast video processing requires precise digitization of component video at 4x oversampling rates. The ADS5527IRGZ25's 210 MSPS sample rate easily supports 1080p and 4K SDI reclockers and frame stores that previously used 10-bit ADCs. The DDR LVDS output mode simplifies routing to FPGA-based scalers and deinterlacers, while CMOS mode allows direct bus interfacing to video processors. The internal reference stabilizes black-level accuracy critical for broadcast compliance (SMPTE 259M, 292M). Compared to dedicated video ADCs like the ADV7180, the ADS5527IRGZ25 offers significantly higher bandwidth and resolution headroom for emerging 12G-SDI and 8K workflows in professional video infrastructure.
Recommandé
Industrial Process Control and Data Acquisition
High-speed industrial data-acquisition systems monitoring vibration, acoustic emission, and power-line transients benefit from the ADS5527IRGZ25's 210 MSPS sample rate and 1.4 GHz bandwidth. Its 12-bit resolution is adequate for predictive-maintenance vibration spectrum analysis and high-speed power-line disturbance recording. The DDR LVDS outputs reduce EMI in noisy industrial environments with switching motor drives and relay coils. The -40 °C to +85 °C industrial temperature range suits outdoor substations and factory-floor installations. Compared with successive-approximation ADCs in the same speed class, this part provides higher throughput at the cost of input-channel count (1 vs 4-8). Multiple ADS5527IRGZ25 instances can be synchronized for multi-axis vibration monitoring.
Recommandé
Récapitulatif des produits recommandés
Données de référence d'ingénierie pour ADS5527IRGZ25 — comparaison, recommandations de conception et informations de conformité.
Guide de sélection
Comparaison avec les alternatives
| Paramètre | Ce produit | ADS5527IRGZR | ADS5527IRGZT | ADS5527IRGZTG4 | ADS5525IRGZR |
|---|---|---|---|---|---|
| Brand | Texas Instruments | Texas Instruments | Texas Instruments | Texas Instruments | Texas Instruments |
| Package | 48-VQFN (RGZ) 7x7 mm | 48-VQFN (RGZ) 7x7 mm - same | 48-VQFN (RGZ) 7x7 mm - same | 48-VQFN (RGZ) 7x7 mm - same | 48-VQFN (RGZ) 7x7 mm - same |
| Resolution | 12 bit | 12 bit | 12 bit | 12 bit | 12 bit |
| Sample Rate | 210 MSPS | 210 MSPS | 210 MSPS | 210 MSPS | 125 MSPS |
| Output Interface | DDR LVDS / CMOS | DDR LVDS / CMOS | DDR LVDS / CMOS | DDR LVDS / CMOS | DDR LVDS / CMOS |
| Operating Temperature | -40 °C to +85 °C | -40 °C to +85 °C | -40 °C to +85 °C | -40 °C to +85 °C | -40 °C to +85 °C |
| Supply Voltage | 3.3 V | 3.3 V | 3.3 V | 3.3 V | 3.3 V |
| RoHS Compliance | Yes | Yes | Yes | Yes (Pb-free G4) | Yes |
Principaux différenciateurs
- Higher sample rate than the ADS5525 family variant at the same package (vs ADS5525IRGZR)
- DDR LVDS output mode with same-die drop-in variants (vs ADS5527IRGZR)
- DDR LVDS mode vs CMOS-only competitor ADCs (vs Generic 12-bit 210 MSPS CMOS-only ADCs)
Notes de conception
Place 0.1 µF and 10 µF ceramic decoupling capacitors as close as possible to each AVDD and DVDD pin. Use a continuous ground plane on layer 2 directly beneath the ADC, and stitch the perimeter with vias to provide a low-impedance return path. The exposed thermal pad (EP) must be soldered to a copper island with at least 8 thermal vias to the inner ground plane to achieve the datasheet's thermal resistance. Keep analog input traces (AINP/AINM) impedance-controlled at 100 Ω differential and route them as a length-matched pair away from noisy digital outputs to minimize common-mode pickup.
Drive the CLKP/CLKM differential clock input with a low-jitter LVPECL or LVDS source; phase noise above 1 ps RMS directly degrades SNR. Match the length of the clock trace pair within 5 mils and route over a continuous ground plane. If using a single-ended CMOS clock source, AC-couple it through a balun to maintain differential signaling. Verify that the FPGA IDDR/SERDES capture register has sufficient timing margin across voltage and temperature; consider using a PLL-based skid compensation if the ADC and FPGA reference clocks are not frequency-locked.
Do not float the LVDS/CMOS mode-select pin - tie it directly to DVDD or DGND through a 10 kΩ resistor. Failure to define this pin causes unpredictable output behavior and power-supply current spikes. Do not exceed the 3.6 V absolute maximum on any supply pin or 4 V on analog inputs; clamp with TVS diodes if long input traces are exposed to ESD events. Avoid routing analog input traces parallel to DDR LVDS data outputs - keep at least 5 mm separation or use guard traces to avoid coupling that manifests as spurs in the FFT spectrum at integer multiples of the clock frequency.
Estimated: at 210 MSPS with 3.3 V analog supply, typical power dissipation is approximately 700-900 mW (estimate based on similar TI 12-bit 210 MSPS ADCs). Provide at least 1 A of headroom on the 3.3 V analog LDO feeding the ADC to handle inrush at power-up and ADC calibration transients. Use a linear regulator (not a switching converter) for the analog supply to avoid injected switching noise; if a switching pre-regulator is required, follow it with an LDO and additional LC filtering at the ADC supply pin.
Informations de conformité
RoHS compliant per TI product page. Industrial temperature grade (-40 °C to +85 °C). Not AEC-Q100 qualified - for automotive applications use a different ADC family. G4 suffix variants are Pb-free tape-and-reel packaging per TI nomenclature.
