IDTADC1215S105HN-C18 - 12-Bit 105 MSPS ADC w/ Input Buffer | Renesas
Référence : IDTADC1215S105HN-C18 ✓ Actif| Qté | Prix unitaire | Total |
|---|---|---|
| 1 | $18.5 | $18,50 |
| 10 | $16.2 | $162,00 |
| 100 | $13.85 | $1 385,00 |
| 500 | $11.6 | $5 800,00 |
| 1 000 | $9.95 | $9 950,00 |
IDTADC1215S105HN-C18 Présentation
An ADC (Analog-to-Digital Converter) is a data-acquisition integrated circuit that samples continuous analog signals and converts them into discrete digital codes for downstream processing by FPGAs, DSPs, or microcontrollers. Pipelined ADCs such as the ADC1215S use a multi-stage architecture to achieve high sampling rates (tens to hundreds of MSPS) while maintaining moderate resolution (10-14 bits), making them the workhorse of communications infrastructure, medical imaging, and industrial test equipment. Within the broader hierarchy they sit under Data Acquisition ICs, which in turn belong to the signal-chain and power-management semiconductor family.
Key features of the IDTADC1215S105HN-C18 include a wide analog input bandwidth supported by the integrated buffer, low spurious-free dynamic range (SFDR) optimized for IF-sampling applications, dual data-rate LVDS output for low-pin-count FPGA interfacing, and a small 6x6 mm 40-VFQFN footprint with an exposed thermal pad. The on-chip buffer eliminates the need for an external high-bandwidth op-amp driver, simplifying the analog front-end and reducing BOM cost. The part is specified over the industrial temperature range and supports single 3.3V analog and digital supply operation.
The architecture combines a track-and-hold front end, a multi-stage pipelined switched-capacitor core, and a digital error-correction block. The integrated input buffer is a unity-gain wideband amplifier that presents a high impedance to the source and drives the switched-capacitor sampling network internally, which relaxes source-impedance matching and reduces gain-error drift over temperature compared to unbuffered ADC designs.
Typical applications include wireless base-station IF sampling, cable-modem and set-top box tuners, medical ultrasound beamformers, portable and benchtop oscilloscopes, and high-speed industrial data-acquisition cards. The dual-output-interface feature (CMOS / LVDS DDR) lets the same part serve both low-cost MCU-based systems and high-performance FPGA-based signal processors.
A key design consideration is the requirement for a clean, low-noise analog supply and well-bypassed reference; the exposed thermal pad must be soldered to a sufficiently large ground copper pour for proper heat dissipation and for the lowest possible package-inductance ground return. A common-pitfall warning: when interfacing the LVDS DDR outputs to a 1.8V FPGA, confirm VDD of the ADC's digital outputs and the FPGA's LVDS bank are matched or use an external level translator.
This page consolidates distributor pricing, package-level data, and a drop-in alternative list that is not present in the manufacturer datasheet itself, giving engineers a faster path to second-source validation and BOM risk reduction.
Alternatives de remplacement direct pour IDTADC1215S105HN-C18 — même boîtier, compatible broche à broche. Les références à boîtier différent nécessitant une retouche du PCB sont exclues.
Variantes de cette série
Modèles de la même série directement compatibles avec IDTADC1215S105HN-C18 (même facteur de forme et même empreinte) — différant par Package, Input Type, RoHS Status, Operating Temperature, Number of Channels.
Outil de comparaison rapide — sélectionnez des références alternatives pour une comparaison côte à côte :
IDTADC1215S125HN-C18
✅ Remplacement direct✓ En stock
$15.8 / unité
Voir la fiche technique →IDTADC1215S080HN-C18
✅ Remplacement direct✓ En stock
$8.95 / unité
Voir la fiche technique →ADC1410S105HN-C1
✅ Remplacement direct ⚠️ Spécifications non vérifiées✓ En stock
$17.8 / unité
Voir la fiche technique →ADC1213S125HN-C1
✅ Remplacement direct ⚠️ Spécifications non vérifiées✓ En stock
$18.45 / unité
Voir la fiche technique →ADC1213S080HN-C18
✅ Remplacement direct ⚠️ Spécifications non vérifiées✓ En stock
$9.45 / unité
Voir la fiche technique →IDTADC1215S105HN-C18 Valeurs maximales et caractéristiques électriques
| Manufacturer | Renesas Electronics (formerly Integrated Device Technology / IDT) |
| Part Series | ADC1215S |
| Résolution | 12 bit |
| Number of Channels | 1 (single channel) |
| Fréquence d'échantillonnage | 105 MSPS |
| Architecture | Pipelined |
| Input Buffer | Integrated on-chip |
| Digital Output Interface | CMOS or LVDS DDR (selectable) |
| Input Type | Single-ended analog input (with internal buffer) |
| Boîtier | 40-pin VFQFN exposed pad (HVQFN-40), 6x6 mm |
| Tension d'alimentation | 3.3 V (analog and digital) |
| Plage de température de fonctionnement | -40 C to +85 C (industrial) |
| Type de montage | Surface Mount |
| Statut RoHS | Compliant (per Renesas product page) |
Configuration des broches de IDTADC1215S105HN-C18
| Broche 1 | VDD_A — Analog 3.3 V supply |
| Broche 2 | VSS_A — Analog ground |
| Broche 3 | INA — Analog input (single-ended, internally buffered) |
| Broche 4 | VCM — Common-mode voltage bypass |
| Broche 5 | REFT — Top reference decoupling |
| Broche 6 | REFB — Bottom reference decoupling |
| Broche 7 | VDD_A — Analog 3.3 V supply |
| Broche 8 | VSS_A — Analog ground |
| Broche 9 | CLKP — Differential clock input (positive) |
| Broche 10 | CLKN — Differential clock input (negative) |
| Broche 11 | VDD_D — Digital 3.3 V supply |
| Broche 12 | VSS_D — Digital ground |
| Broche 13 | OE/CMOS-LVDS — Output enable / interface select |
| Broche 14 | D11 — Data output bit 11 (MSB) |
| Broche 15 | D10 — Data output bit 10 |
| Broche 16 | D9 — Data output bit 9 |
| Broche 17 | D8 — Data output bit 8 |
| Broche 18 | D7 — Data output bit 7 |
| Broche 19 | D6 — Data output bit 6 |
| Broche 20 | D5 — Data output bit 5 |
| Broche 21 | D4 — Data output bit 4 |
| Broche 22 | D3 — Data output bit 3 |
| Broche 23 | D2 — Data output bit 2 |
| Broche 24 | D1 — Data output bit 1 |
| Broche 25 | D0 — Data output bit 0 (LSB) |
| Broche 26 | DCLKOUT — Data clock output |
| Broche 27 | DRDY — Data ready strobe |
| Broche 28 | VDD_D — Digital 3.3 V supply |
| Broche 29 | VSS_D — Digital ground |
| Broche 30 | OFS — Offset adjust |
| Broche 31 | FSR — Full-scale range adjust |
| Broche 32 | PD — Power-down control |
| Broche 33 | TEST1 — Test mode pin 1 (tie to VDD or VSS in normal operation) |
| Broche 34 | TEST2 — Test mode pin 2 (tie to VDD or VSS in normal operation) |
| Broche 35 | BIAS — Bias current setting (external resistor) |
| Broche 36 | VSS_A — Analog ground |
| Broche 37 | VDD_A — Analog 3.3 V supply |
| Broche 38 | NC — Not connected (per datasheet) |
| Broche 39 | NC — Not connected (per datasheet) |
| Broche 40 | NC — Not connected (per datasheet) |
Applications typiques
IDTADC1215S105HN-C18 convient pour 6 applications: Wireless Base-Station IF Sampling, Medical Ultrasound Beamformer, Portable Oscilloscope / DSO Front End, Cable-Modem / Set-Top Box Tuner, Industrial High-Speed Data Acquisition Card, Software-Defined Radio (SDR) Daughter Card.
Wireless Base-Station IF Sampling
The IDTADC1215S105HN-C18 is well suited to wireless base-station IF-sampling applications because its 105 MSPS sample rate comfortably exceeds the Nyquist requirement for intermediate-frequency signals in 3G/4G receiver chains, while the integrated input buffer relaxes the drive requirement on the preceding IF mixer/filter stage. The selectable LVDS DDR output mode minimizes EMI and pin count on the digital bus to the FPGA baseband processor. SFDR and SNR performance at 105 MSPS make the part competitive for cost-optimized remote-radio-head designs, and the 12-bit resolution is sufficient for the dynamic range required at the IF stage (with gain control handled upstream). The 40-VFQFN exposed-pad package fits within typical RRU mezzanine card constraints.
Recommandé
Medical Ultrasound Beamformer
In medical ultrasound beamformer front ends, the IDTADC1215S105HN-C18 provides the high sample rate needed to digitize the 10-15 MHz bandlimited echo signals returned from the transducer array. The integrated input buffer presents a stable high-impedance load to the time-gain-compensated (TGC) LNA chain, isolating the switched-capacitor ADC sampling glitches from the analog front end. The 12-bit resolution is standard for mid-range cart-based ultrasound systems where the trade-off between penetration depth and image resolution favors dynamic range over channel count. The exposed-pad 6x6 mm QFN package supports the dense multi-channel board layouts typical of 64- and 128-element probes.
Recommandé
Portable Oscilloscope / DSO Front End
The IDTADC1215S105HN-C18 is a strong fit for the analog front end of portable digital-storage oscilloscopes (DSOs) in the 100 MHz bandwidth class, where the 105 MSPS sample rate provides 1.05x oversampling at full bandwidth and 4-5x oversampling on typical 20-25 MHz measurement ranges. The integrated input buffer is critical here - it directly accepts the attenuator/AC-coupling network output without requiring a low-distortion external op-amp, reducing front-end cost and PCB area. LVDS DDR output mode keeps the digital bus quiet and low-EMI, important in a portable instrument with mixed-signal digital displays. The 3.3 V single-supply operation simplifies the analog power tree and prolongs battery life in handheld scopes.
Recommandé
Cable-Modem / Set-Top Box Tuner
In cable-modem and set-top box tuner designs, the IDTADC1215S105HN-C18 digitizes the down-converted IF signal from the cable tuner block. The 105 MSPS sample rate supports DOCSIS 3.0 and DVB-C channel plans with adequate margin, and the integrated input buffer means the tuner can drive the ADC directly without a costly external SAW filter buffer amplifier. The 12-bit dynamic range is well matched to the MER (modulation error ratio) requirements of 256-QAM downstream channels. CMOS output mode can be used in cost-sensitive designs to interface directly to a low-cost tuner SoC without an FPGA.
Recommandé
Industrial High-Speed Data Acquisition Card
The IDTADC1215S105HN-C18 serves as the analog-to-digital front end of PCI/PCIe and PXI-based industrial data-acquisition cards used in vibration analysis, machine-condition monitoring, and automated test equipment. The 105 MSPS sample rate captures transient signals with sub-microsecond resolution, and the integrated input buffer accepts the wide dynamic range of piezoelectric accelerometers and strain-gauge sensors through the conditioning amplifier. LVDS DDR output mode connects cleanly to the on-board FPGA that performs real-time FFT and threshold detection. The exposed-pad QFN package supports forced-air cooling in dense multi-channel ATE systems where 8-16 ADCs may be paralleled on a single board.
Recommandé
Software-Defined Radio (SDR) Daughter Card
The IDTADC1215S105HN-C18 is a natural fit for the ADC stage of software-defined radio (SDR) daughter cards that target HF/VHF/UHF reception from 1 MHz to 30 MHz (direct-sampling) and up to 150 MHz (with an external LNA and mixer). The integrated input buffer accepts the output of a passive filter/attenuator network directly, avoiding the need for a high-IP3 external driver that would degrade the noise figure. The 12-bit resolution is sufficient for narrow-band signals such as SSB, CW, and digital modes (FT8, PSK31), and the LVDS DDR output stream feeds an FPGA that performs DDC and decimation in real time. The 6x6 mm QFN footprint supports the compact, fanless designs typical of low-power portable SDR receivers.
Recommandé
Récapitulatif des produits recommandés
Données de référence d'ingénierie pour IDTADC1215S105HN-C18 — comparaison, recommandations de conception et informations de conformité.
Guide de sélection
Comparaison avec les alternatives
| Paramètre | Ce produit | IDTADC1215S125HN-C18 | IDTADC1215S080HN-C18 | ADC1410S105HN-C1 | ADC1213S125HN-C1 | ADC1213S080HN-C18 |
|---|---|---|---|---|---|---|
| Brand | Renesas Electronics (formerly IDT) | Renesas Electronics | Renesas Electronics | Renesas Electronics | Renesas Electronics | Renesas Electronics |
| Package | 40-VFQFN exposed pad (6x6 mm) | 40-VFQFN exposed pad (6x6 mm) - same | 40-VFQFN exposed pad (6x6 mm) - same | 40-VFQFN exposed pad - same | 40-VFQFN exposed pad - same | 40-VFQFN exposed pad - same |
| Resolution | 12 bit | 12 bit | 12 bit | 14 bit | 12 bit | 12 bit |
| Sampling Rate | 105 MSPS | 125 MSPS | 80 MSPS | 105 MSPS | 125 MSPS | 80 MSPS |
| Input Buffer | Integrated (buffered) | Integrated (buffered) | Integrated (buffered) | Integrated (buffered) | Unbuffered | Unbuffered |
| Digital Output | CMOS or LVDS DDR | CMOS or LVDS DDR | CMOS or LVDS DDR | CMOS or LVDS DDR | CMOS or LVDS DDR | CMOS or LVDS DDR |
| Number of Channels | 1 | 1 | 1 | 1 | 1 | 1 |
| Supply Voltage | 3.3 V | 3.3 V | 3.3 V | 3.3 V | 3.3 V | 3.3 V |
| Lifecycle Status | Active | Active | Active | Active | Active | Active |
Principaux différenciateurs
- Integrated input buffer eliminates external driver op-amp (vs ADC1213S125HN-C1 (unbuffered 12-bit 125 MSPS))
- Selectable CMOS or LVDS DDR output for design flexibility (vs IDTADC1215S080HN-C18 (same family, 80 MSPS))
- Pin-compatible 14-bit upgrade path available in same family (vs ADC1410S105HN-C1 (14-bit 105 MSPS, same QFN-40 exposed-pad footprint))
Notes de conception
Use a clean, low-noise 3.3 V analog supply (VDD_A) and 3.3 V digital supply (VDD_D) derived from separate LDO regulators or a filtered pi-network from a common 5 V or 12 V rail. The analog supply noise directly couples into the input signal path and degrades SNR; a switching regulator without adequate filtering will typically reduce SNR by 3-6 dB. Place 10 uF bulk and 100 nF ceramic bypass capacitors as close as possible to each VDD_A and VDD_D pin, and add a ferrite bead or small resistor (1-2.2 ohm) between the analog and digital supply nodes to break ground loops. The exposed thermal pad must be soldered to a ground plane with at least 4 thermal vias to a large bottom-layer ground pour.
Keep the analog input trace (INA) as short as possible and route it over a continuous ground pour on an inner layer to minimize loop area and pickup. The differential clock traces (CLKP/CLKN) must be length-matched within 1-2 mm and routed as a 100 ohm differential pair with no splits or vias if possible. Avoid routing digital output lines (D0..D11, DCLKOUT) parallel to the analog input - cross them at 90 degrees if they must intersect. Place the reference decoupling capacitors (REFT/REFB) immediately adjacent to their respective pins, with the ground return via right at the capacitor pad.
When the ADC is configured in LVDS DDR mode, ensure the FPGA's LVDS bank supply matches the ADC's VDD_D (3.3 V in this part) - level mismatches cause intermittent link failures that are very hard to debug. The TEST1/TEST2 pins must be tied to a defined logic level (VSS for normal operation per datasheet) - leaving them floating can put the part into a test mode that corrupts the data output. If the clock duty cycle is not exactly 50 percent, expect measurable SNR degradation at 105 MSPS; use a clock driver with <100 ps jitter to preserve the rated ENOB.
Informations de conformité
RoHS compliant per Renesas product page. Industrial temperature grade -40 to +85 C, not AEC-Q100 qualified (this is a commercial/industrial ADC, not an automotive-grade part). Halogen-free status not explicitly stated in verified web data - set to unknown.
