EP1C12Q240C8N vs EP1C12Q240I8ES तुलना
विस्तृत दोनों ओर की तुलना EP1C12Q240C8N द्वारा Intel और EP1C12Q240I8ES द्वारा Intel. मुख्य विशेषताओं, इलेक्ट्रिकल पैरामीटर, पैकेजिंग, चक्र स्थिति, मूल्यांकन और उपलब्धता को तुलना करके अपनी डिजाइन की आवश्यकताओं के लिए सबसे अच्छा घटक निर्धारित करें。
विशेषता तुलना
| पैरामीटर | EP1C12Q240C8N | EP1C12Q240I8ES |
|---|---|---|
| ब्रांड | Intel | Intel |
| श्रेणी | FPGA & CPLD | FPGA & CPLD |
| लाइफसाइकिल स्थिति | Obsolete | Obsolete |
| Series | Cyclone | — |
| Family | Cyclone I | — |
| Logic Elements (LE) | 12,060 | — |
| Total RAM Bits | 239,616 | — |
| Embedded RAM Blocks | M4K (4 Kbit blocks) | — |
| Process Technology | 0.13 µm all-layer copper SRAM | — |
| Core Voltage | 1.5 V | — |
| Speed Grade | 8 (commercial) | 8 |
| User I/O Pins (max in package) | 173 | — |
| पैकेज | 240-pin PQFP / BFQFP (Q240) | — |
| PLLs | 2 | — |
| Global Clock Networks | 8 | — |
| Configuration Modes | AS, PS, JTAG | — |
| ऑपरेटिंग तापमान | Commercial (0C to +85C) | — |
| माउंटिंग प्रकार | Surface Mount | — |
| RoHS स्थिति | [DATA_NEEDED: RoHS status - not stated in verified data] | unknown |
| Lead-Free | [DATA_NEEDED: lead-free status - not stated in verified data] | — |
| Manufacturer | — | Intel |
| Manufacturer Part Number | — | EP1C12Q240I8ES |
| FPGA Family | — | Cyclone |
| Programmable Logic Type | — | FPGA (field-programmable gate array) |
| Configuration Type | — | SRAM-based |
| FPGA Process | — | 1.5-V, 0.13-um, all-layer copper SRAM process |
| Maximum Family Logic Elements | — | 20,060 LEs |
| Maximum Family Embedded RAM | — | 288 Kbits |
| EP1C12 Delivered Logic Elements | — | [DATA_NEEDED: EP1C12 exact LE count] |
| Package Code | — | FQFP |
| Package Description | — | 240-pin square QFP (PQFP/FQFP) |
| Number of Terminals | — | 240 |
| Terminal Form | — | GULL WING |
| Package Shape | — | Square |
| JESD-609 Code | — | e0 |
| Maximum Supply Voltage | — | 1.575 V |
| Nominal Core Supply Voltage | — | 1.5 V |
| Temperature Grade Code | — | I (industrial) |
| Ordering Code Variant | — | ES (engineering sample) |
| Minimum Operating Temperature | — | [DATA_NEEDED: minimum operating temperature] |
| Maximum Operating Temperature | — | [DATA_NEEDED: maximum operating temperature] |
| Supported Configuration | — | Configuration and JTAG boundary-scan testing supported |