RTAX2000SL-1CGS624E vs RTAX250S-CG624E तुलना
विस्तृत दोनों ओर की तुलना RTAX2000SL-1CGS624E द्वारा Microchip Technology और RTAX250S-CG624E द्वारा Microchip Technology. मुख्य विशेषताओं, इलेक्ट्रिकल पैरामीटर, पैकेजिंग, चक्र स्थिति, मूल्यांकन और उपलब्धता को तुलना करके अपनी डिजाइन की आवश्यकताओं के लिए सबसे अच्छा घटक निर्धारित करें。
Microchip Technology
RTAX2000SL-1CGS624E - 2M-Gate Rad-Tolerant FPGA CGA624 | Microchip
RTAX2000SL-1CGS624E ✓ सक्रियMicrochip Technology
RTAX250S-CG624E - 250K-Gate Rad-Tolerant FPGA | Microchip
RTAX250S-CG624E ✓ सक्रियविशेषता तुलना
| पैरामीटर | RTAX2000SL-1CGS624E | RTAX250S-CG624E |
|---|---|---|
| ब्रांड | Microchip Technology | Microchip Technology |
| श्रेणी | FPGA & CPLD | FPGA & CPLD |
| लाइफसाइकिल स्थिति | सक्रिय | सक्रिय |
| Family | RTAX-S/SL Radiation-Tolerant FPGA | RTAX-S radiation-tolerant FPGA |
| Equivalent System Gates | 2000000 | — |
| Additional ASIC Gates | 250000 | — |
| Configurable Logic Blocks (CLBs) | 21504 | — |
| Technology | CMOS, 0.15 um | — |
| Core Supply Voltage | 1.5 V | 1.5 V |
| Maximum Combinatorial Performance | 649 MHz | — |
| Speed Grade | -1 | — |
| पैकेज | CBGA624 / CGA-624 Ceramic Column Grid Array | — |
| Package Material | Ceramic | — |
| Programming Technology | Anti-fuse, one-time programmable, live at power-up | Antifuse (one-time programmable) |
| Embedded Memory | Embedded SRAM with built-in FIFO control logic | — |
| Radiation Tolerance | Radiation-tolerant (space-flight qualified family) | — |
| माउंटिंग प्रकार | Surface Mount | Surface Mount |
| ऑपरेटिंग तापमान रेंज | [DATA_NEEDED: operating temperature range] | — |
| RoHS स्थिति | [DATA_NEEDED: RoHS status] | — |
| Number of I/Os | [DATA_NEEDED: number of user I/Os] | — |
| System Gates | — | 250000 gates |
| Logic Cells (CLBs) | — | 2816 |
| Maximum Toggle Frequency | — | 649 MHz |
| Process Technology | — | 0.15 um CMOS |
| Logic Family | — | CMOS |
| CLB Combinatorial Delay (max) | — | 0.930 ns |
| Package Type | — | CCGA-624 (ceramic column grid array, 624 pins) |
| ऑपरेटिंग तापमान | — | -55C to +125C |
| SEU Hardening | — | SEU-hardened registers, no external TMR required |
| SEU Immunity | — | Immune to single-event upsets to specified LET threshold; SEU rate < 10-10 errors/bit-day |
| Power-Up Behavior | — | Live at power-up (true single-chip) |
| Target Application | — | Space-flight systems |