RTAX2000SL-1CQ256V vs RTAX2000S-1CQ256PROTO तुलना
विस्तृत दोनों ओर की तुलना RTAX2000SL-1CQ256V द्वारा Microchip Technology और RTAX2000S-1CQ256PROTO द्वारा Microchip Technology. मुख्य विशेषताओं, इलेक्ट्रिकल पैरामीटर, पैकेजिंग, चक्र स्थिति, मूल्यांकन और उपलब्धता को तुलना करके अपनी डिजाइन की आवश्यकताओं के लिए सबसे अच्छा घटक निर्धारित करें。
Microchip Technology
RTAX2000SL-1CQ256V - 2M-Gate Rad-Tolerant FPGA | Microchip
RTAX2000SL-1CQ256V ✓ सक्रियMicrochip Technology
RTAX2000S-1CQ256PROTO - 2M-Gate Rad-Tolerant FPGA Proto | Microchip
RTAX2000S-1CQ256PROTO ✓ सक्रियविशेषता तुलना
| पैरामीटर | RTAX2000SL-1CQ256V | RTAX2000S-1CQ256PROTO |
|---|---|---|
| ब्रांड | Microchip Technology | Microchip Technology |
| श्रेणी | FPGA & CPLD | FPGA & CPLD |
| लाइफसाइकिल स्थिति | सक्रिय | सक्रिय |
| Equivalent System Gates | 2,000,000 (approx.) | 2000000 |
| Logic Cells | 32,256 | — |
| Configurable Logic Blocks (CLBs) | 21,504 | — |
| अधिकतम क्लॉक फ़्रीक्वेंसी | 649 MHz | — |
| Technology | CMOS, antifuse (one-time programmable) | Antifuse (nonvolatile, OTP), CMOS |
| Family | RTAX-S/SL Radiation-Tolerant FPGA | — |
| Speed Grade | -1 | — |
| पैकेज | 256-pin Ceramic CQFP (CQ256) | CQ256 ceramic quad package, 256 pins |
| Radiation Tolerance | Radiation-tolerant (TID/SEE characterized) | — |
| Configuration | Live-at-power-up, single-chip (no external config device) | Live at power-up, no external boot device |
| Embedded Memory | Embedded SRAM with built-in FIFO control logic | up to 540 kbits with optional EDAC |
| ऑपरेटिंग तापमान | [DATA_NEEDED: operating temperature range] | [DATA_NEEDED: operating temperature range for PROTO suffix] |
| सप्लाई वोल्टेज | [DATA_NEEDED: core supply voltage] | [DATA_NEEDED: core and I/O supply voltage] |
| I/O Count (CQ256) | [DATA_NEEDED: user I/O count] | — |
| Total Ionizing Dose (TID) | [DATA_NEEDED: TID tolerance in krad] | — |
| माउंटिंग प्रकार | Surface Mount | Surface Mount |
| MSL स्तर | [DATA_NEEDED: moisture sensitivity level] | — |
| Logic Blocks (CLBs) | — | 21504 |
| Additional ASIC Gates | — | 250000 |
| SEU Rate | — | less than 1E-10 errors per bit-day (family spec) |
| Total Ionizing Dose (Functional) | — | 300 krad |
| Total Ionizing Dose (Parametric) | — | 200 krad |
| Logic Family | — | CMOS |
| Maximum User I/Os (family) | — | up to 684 (density dependent) |
| Architecture Base | — | Axcelerator compatible fabric |
| Product Grade | — | PROTO - engineering prototyping unit |