RTAX4000SL-1CG1272V vs RTAX4000SL-CG1272E तुलना
विस्तृत दोनों ओर की तुलना RTAX4000SL-1CG1272V द्वारा Microchip Technology और RTAX4000SL-CG1272E द्वारा Microsemi. मुख्य विशेषताओं, इलेक्ट्रिकल पैरामीटर, पैकेजिंग, चक्र स्थिति, मूल्यांकन और उपलब्धता को तुलना करके अपनी डिजाइन की आवश्यकताओं के लिए सबसे अच्छा घटक निर्धारित करें。
Microchip Technology
RTAX4000SL-1CG1272V - 4M-Gate Rad-Tolerant FPGA | Microchip
RTAX4000SL-1CG1272V ✓ सक्रियMicrosemi
RTAX4000SL-CG1272E - 4M-Gate Rad-Tolerant FPGA CCGA-1272 | Microsemi
RTAX4000SL-CG1272E ✓ सक्रियविशेषता तुलना
| पैरामीटर | RTAX4000SL-1CG1272V | RTAX4000SL-CG1272E |
|---|---|---|
| ब्रांड | Microchip Technology | Microsemi |
| श्रेणी | FPGA & CPLD | FPGA & CPLD |
| लाइफसाइकिल स्थिति | सक्रिय | सक्रिय |
| Equivalent System Gates | 4,000,000 gates | — |
| Logic Cells | 40,320 | 40320 |
| Family | RTAX-S/SL Radiation-Tolerant FPGA | RTAX-SL Radiation-Tolerant FPGA |
| Core Supply Voltage (Nominal) | 1.5 V | — |
| Core Supply Voltage Range | 1.425 V to 1.575 V | — |
| Logic Technology | CMOS, antifuse (one-time programmable) | — |
| Package Type | CGA-1272 ceramic column grid array | — |
| पिन काउंट | 1272 | — |
| ऑपरेटिंग तापमान | -55C to +125C | -55C to +125C |
| SEU Hardening | SEU-hardened registers, no external TMR required | — |
| SEU Rate | < 10-10 errors/bit-day | < 10-10 errors/bit-day |
| Configuration | Live at power-up, single-chip (no external config device) | — |
| Embedded Memory | Embedded SRAM with built-in FIFO control logic | — |
| Programmability Type | OTP (one-time programmable) | — |
| Speed Grade | -1 | — |
| Qualification Grade | V (space flight / radiation-tolerant) | — |
| माउंटिंग प्रकार | Surface Mount | Surface Mount |
| RoHS स्थिति | [DATA_NEEDED: RoHS Status] | [DATA_NEEDED: RoHS status] |
| System Gates | — | 4,000,000 |
| Sequential Logic Cells | — | 60480 |
| Process Technology | — | 0.15 um CMOS |
| Core Supply Voltage | — | 1.5 V |
| Logic Family | — | CMOS |
| पैकेज | — | 1272-Pin CCGA (Ceramic Column Grid Array) |
| SEU Immunity | — | Immune to single-event upsets to LETTH MeVcm2/mg |
| SEU-Hardened Registers | — | Yes (eliminates need for TMR) |
| Programming Technology | — | Antifuse (one-time programmable) |
| Power-Up Operation | — | Live at power-up (single chip) |
| Radiation Environment | — | Space flight (radiation-tolerant) |