EPF6024AQI208-1 vs EPF6024AQI208-3 비교
다음의 상세 나란히 비교: EPF6024AQI208-1 제조: Altera 및 EPF6024AQI208-3 제조: Intel. 주요 사양, 전기적 파라미터, 패키징, 수명 주기 상태, 가격 및 재고를 비교하여 설계 요구 사항에 가장 적합한 부품을 결정하십시오.
Altera
EPF6024AQI208-1 - 24K Gate FLEX 6000 PLD, 208-PQFP, 172 MHz | Altera
EPF6024AQI208-1 Obsolete사양 비교
| 파라미터 | EPF6024AQI208-1 | EPF6024AQI208-3 |
|---|---|---|
| 브랜드 | Altera | Intel |
| 카테고리 | FPGA & CPLD | FPGA & CPLD |
| 수명 주기 상태 | Obsolete | Obsolete |
| 재고 상태 | In Stock | In Stock |
| 단가 (USD) | $22.85 | $9.85 |
| Family | FLEX 6000 | FLEX 6000 |
| Device Type | Programmable Logic Device (PLD) | — |
| Typical Gates | 24,000 | — |
| Logic Elements | 1,960 LEs (estimated from family datasheet) | 1,960 cells |
| 최대 클록 주파수 | 172 MHz | — |
| Supply Voltage (VCCINT) | 3.0 V to 3.6 V (3.3 V nominal) | — |
| I/O Voltage Standard | 3.3 V LVTTL / LVCMOS | — |
| 5 V Tolerant Inputs | Yes | — |
| 패키지 | 208-pin PQFP (FQFP, gull-wing) | 208-pin PQFP (Plastic Quad Flat Pack) |
| 핀 수 | 208 | — |
| 동작 온도 | -40C to +85C (industrial) | 0 °C to +70 °C (commercial) |
| Configuration Method | SRAM (volatile), serial or JTAG | — |
| JTAG Support | IEEE 1149.1 boundary-scan | — |
| Process Technology | CMOS, 0.42 um 4-metal layer | 0.42 µm CMOS |
| RoHS 상태 | [DATA_NEEDED: RoHS status] | Non-compliant (legacy PQFP) |
| Lead-Free | [DATA_NEEDED: lead-free status] | No (SnPb finish typical) |
| Typical Gate Count | — | 24,000 gates |
| User I/O Pins | — | 171 |
| Core Voltage | — | 3.3 V |
| I/O Voltage Tolerance | — | 5.0 V (clamping-diode tolerant inputs) |
| Internal Performance | — | 142.86 MHz (max) |
| Logic Architecture | — | 4-input LUT with programmable register |
| Embedded Array Blocks (EAB) | — | 4 |
| Configuration Modes | — | Passive Serial, Active Serial, JTAG (IEEE 1149.1) |
| Speed Grade | — | -3 |