MAX1239LEEE+T vs MAX1239MEEE+T 비교
다음의 상세 나란히 비교: MAX1239LEEE+T 제조: Analog Devices 및 MAX1239MEEE+T 제조: Maxim Integrated. 주요 사양, 전기적 파라미터, 패키징, 수명 주기 상태, 가격 및 재고를 비교하여 설계 요구 사항에 가장 적합한 부품을 결정하십시오.
Analog Devices
MAX1239LEEE+T - 12-Bit 12-Channel 2-Wire Serial ADC | Maxim Integrated
MAX1239LEEE+T ✓ 활성
사양 비교
| 파라미터 | MAX1239LEEE+T | MAX1239MEEE+T |
|---|---|---|
| 브랜드 | Analog Devices | Maxim Integrated |
| 카테고리 | ADC/DAC | ADC/DAC |
| 수명 주기 상태 | 활성 | 활성 |
| 재고 상태 | In Stock | In Stock |
| 단가 (USD) | $4.62 | $4.99 |
| 분해능 | 12 bit | 12 bit |
| Number of Input Channels | 12 (6 differential pairs) | — |
| Converter Type | SAR (Successive Approximation) | — |
| 샘플링 속도 | 94.4 ksps max | — |
| 공급 전압 | 2.7 V to 3.6 V (single supply) | — |
| 공급 전류 | 670 µA at 94.4 ksps | — |
| 인터페이스 | I2C-compatible 2-wire serial (Standard/Fast/High-Speed) | — |
| Internal Reference | 2.5 V (MAX1237) / 4.096 V (MAX1239 family) | 4.096 V (MAX1239 variant) |
| 입력 전압 범위 | 0 to VREF (unipolar); ±VREF/2 (bipolar) | 0 V to VREF (unipolar) |
| Integral Nonlinearity (INL) | ±1 LSB (max) | [DATA_NEEDED: INL spec] LSB |
| Differential Nonlinearity (DNL) | ±1 LSB (max, no missing codes) | — |
| Signal-to-Noise + Distortion (SINAD) | [DATA_NEEDED: SINAD at fIN] | — |
| 동작 온도 | -40 °C to +85 °C (industrial, "E" suffix) | — |
| 패키지 | 16-pin QSOP | 16-QSOP (SSOP-16, 0.154 in width) |
| 실장 유형 | Surface Mount | Surface Mount |
| RoHS 상태 | Compliant | Compliant (T suffix = lead-free tape and reel) |
| MSL 레벨 | 1 (unlimited) | — |
| Architecture | — | SAR (Successive Approximation) |
| Number of Analog Inputs | — | 12 single-ended / 6 differential |
| Sampling Rate (max) | — | 94.4 ksps |
| Supply Voltage Range | — | 2.7 V to 3.6 V or 4.5 V to 5.5 V |
| Supply Current (operating) | — | 1.5 mA at max sample rate |
| Supply Current (shutdown) | — | 1 µA |
| External Reference Input | — | Supported via REF pin |
| Serial Interface | — | I2C-compatible 2-wire, up to 400 kHz |
| 동작 온도 범위 | — | -40 °C to +85 °C (extended: MEEE suffix) |
| Channel Scan Mode | — | Yes, internal FIFO and sequential scan |