MT25QL128ABB8E12-CAUT vs MT25QL128ABB8E12-0AUT 비교
다음의 상세 나란히 비교: MT25QL128ABB8E12-CAUT 제조: Micron Technology 및 MT25QL128ABB8E12-0AUT 제조: Micron Technology. 주요 사양, 전기적 파라미터, 패키징, 수명 주기 상태, 가격 및 재고를 비교하여 설계 요구 사항에 가장 적합한 부품을 결정하십시오.
Micron Technology
MT25QL128ABB8E12-CAUT - 128Mb SPI Quad I/O NOR Flash | Micron
MT25QL128ABB8E12-CAUT ✓ 활성Micron Technology
MT25QL128ABB8E12-0AUT - 128Mb SPI NOR Flash 133MHz | Micron
MT25QL128ABB8E12-0AUT ✓ 활성사양 비교
| 파라미터 | MT25QL128ABB8E12-CAUT | MT25QL128ABB8E12-0AUT |
|---|---|---|
| 브랜드 | Micron Technology | Micron Technology |
| 카테고리 | Memory ICs | Memory ICs |
| 수명 주기 상태 | 활성 | 활성 |
| 재고 상태 | In Stock | In Stock |
| 단가 (USD) | $3.60 | $3.62 |
| 메모리 유형 | Flash - NOR Memory IC | Serial NOR Flash |
| Memory Capacity | 128 Mbit (16 MB) | — |
| 인터페이스 | SPI - Quad I/O | SPI - Quad I/O (x4) |
| Max Clock Frequency | 133 MHz | — |
| Access Time | 5 ns | — |
| Memory Organization | x1 / x2 / x4 | — |
| 공급 전압 | 2.7 V to 3.6 V (3V class) | 3.0 V (nominal) |
| 동작 온도 | -40C to +125C (automotive grade, CAUT suffix) | -40C to +125C |
| 패키지 | 24-T-PBGA (6x8 mm) | 24-T-PBGA (6x8 mm), 5x5 ball array |
| 실장 유형 | Surface Mount | Surface Mount (BGA) |
| Series | MT25Q (successor to N25Q) | — |
| FBGA Code (family variant) | RW314 (MT25QL128ABB1EW7-CAUT per datasheet addendum) | — |
| Programming/Endurance | [DATA_NEEDED: program/erase endurance cycles] | — |
| Data Retention | [DATA_NEEDED: data retention years] | [DATA_NEEDED: data retention] |
| Active Read Current | [DATA_NEEDED: ICC read current] | — |
| Standby Current | [DATA_NEEDED: ICC standby current] | — |
| Product Longevity Program | No (per datasheet addendum) | — |
| RoHS 상태 | [DATA_NEEDED: RoHS compliance statement] | Compliant |
| Density | — | 128 Mbit (16 MB) |
| 최대 클록 주파수 | — | 133 MHz |
| Technology | — | 45 nm |
| Package Dimensions | — | 6.00 x 8.00 x 1.20 mm |
| FBGA Code | — | RW318 |
| Automotive Grade | — | Yes (-AUT suffix) |
| Bus Width | — | x4 (Quad I/O) |
| Execute In Place (XIP) | — | Supported (serial NOR) |
| Endurance | — | [DATA_NEEDED: program/erase endurance] |