RTAX4000SL-CQ352PROTO vs RTAX4000SL-CQ352B 비교
다음의 상세 나란히 비교: RTAX4000SL-CQ352PROTO 제조: Microchip Technology 및 RTAX4000SL-CQ352B 제조: Microchip Technology. 주요 사양, 전기적 파라미터, 패키징, 수명 주기 상태, 가격 및 재고를 비교하여 설계 요구 사항에 가장 적합한 부품을 결정하십시오.
Microchip Technology
RTAX4000SL-CQ352PROTO - 4M-Gate Radiation-Tolerant FPGA | Microchip
RTAX4000SL-CQ352PROTO ✓ 활성Microchip Technology
RTAX4000SL-CQ352B - 4M-Gate Rad-Tolerant FPGA CQFP-352 | Microchip
RTAX4000SL-CQ352B ✓ 활성사양 비교
| 파라미터 | RTAX4000SL-CQ352PROTO | RTAX4000SL-CQ352B |
|---|---|---|
| 브랜드 | Microchip Technology | Microchip Technology |
| 카테고리 | RF Modules | FPGA & CPLD |
| 수명 주기 상태 | 활성 | 활성 |
| 재고 상태 | In Stock | In Stock |
| 단가 (USD) | $0.00 | $1.00 |
| Family | RTAX-S/SL Radiation-Tolerant FPGAs | RTAX-SL (Radiation-Tolerant FPGAs) |
| Equivalent System Gates | 4,000,000 | 4,000,000 |
| Logic Cells | 60,480 | 40,320 |
| CLBs | 40,320 | — |
| CLB Combinatorial Delay (Max) | 1.1 ns | — |
| Technology | CMOS, antifuse (one-time programmable) | — |
| 패키지 | CQFP-352, ceramic metal-sealed cofired | 352-Pin CQFP |
| 실장 유형 | Surface Mount | Surface Mount |
| 동작 온도 | -55C to +125C | [DATA_NEEDED: Operating Temperature] |
| Embedded Memory | Embedded SRAM with built-in FIFO control logic | Embedded SRAM with built-in FIFO control logic |
| Clock Architecture | Segmentable clocks, chip-wide highway routing | — |
| Arithmetic Support | Dedicated carry logic | Carry logic |
| Configuration | Live-at-power-up, no external configuration device | — |
| Target Market | Space-flight systems | — |
| 공급 전압 | [DATA_NEEDED: core supply voltage] | — |
| User I/O Count (CQ352) | [DATA_NEEDED: user I/O count] | — |
| RoHS 상태 | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS Status] |
| Process Technology | — | 0.15 um |
| Core Voltage | — | 1.5 V |
| Packaging / Shipping | — | Box |
| Programmable Type | — | FPGA |
| Radiation Tolerance | — | Radiation-tolerant (space flight qualified family) |
| Clock Resources | — | Segmentable clocks, chip-wide highway routing |
| I/O Voltage | — | [DATA_NEEDED: I/O Voltage] |
| Total Ionizing Dose (TID) | — | [DATA_NEEDED: TID Rating] |
| Single Event Latch-up Threshold | — | [DATA_NEEDED: SEL LET Threshold] |