NIS6351MT1TXG - 5V 3A Electronic eFuse | onsemi
부품 번호: NIS6351MT1TXG ✓ 활성| 수량 | 단가 | 합계 |
|---|---|---|
| 1 | $0.95 | $0.95 |
| 10 | $0.86 | $8.60 |
| 100 | $0.72 | $72.00 |
| 500 | $0.63 | $315.00 |
| 1,000 | $0.55 | $550.00 |
NIS6351MT1TXG 개요
An electronic fuse (eFuse) is an active circuit-protection IC that replaces traditional passive PPTC fuses and discrete fuse elements. Sitting within the hierarchy of power management ICs, an eFuse monitors the current flowing into a load and disconnects the power path within microseconds when a fault such as a short circuit, overcurrent, or overtemperature event is detected. Unlike one-time polymer fuses, an electronic fuse can reset automatically or latch off under system control, dramatically improving reliability and serviceability of hot-plug interfaces such as USB ports.
The NIS6351 is described by onsemi as a cost-effective, resettable fuse which can greatly enhance the reliability of a USB application from both catastrophic and shutdown failures. Key characteristics include the 5 V rated input rail, 3 A current capability, a thermal latch feature, and a lead-free, RoHS-compliant WDFNW-10 (3x3 mm) footprint suited to space-constrained portable designs. The 'thermal latch' behavior means that once a severe overtemperature or overcurrent event trips the device, it stays off until the fault is removed and the part cools, protecting both the IC and downstream circuitry from repeated fault cycling.
Typical applications include USB port power protection in host and peripheral devices, 5V distributed power rails in notebook computers and docking stations, hot-swappable accessory protection, and general-purpose 5V rail current limiting in industrial and consumer electronics. Where a robust, resettable protection element is required on a 5V line, the NIS6351 fits directly in series with the power path.
For design, ensure that PCB copper area under the exposed pad of the WDFNW-10 package is adequate for the worst-case power dissipation during a fault, and follow onsemi datasheet layout guidance for input/output capacitance placement. Verify the current-limit setting against your USB port specification (e.g., USB 2.0 vs USB 3.0 current classes).
This page synthesizes distributor pricing, availability, datasheet references, and practical design guidance not consolidated in the manufacturer datasheet alone.
드롭인 대체품: NIS6351MT1TXG — 동일 패키지, 핀 호환. PCB 재작업이 필요한 다른 패키지 부품은 제외됩니다.
빠른 비교 도구 — 나란히 비교할 대체 부품을 선택하십시오:
NIS6351MT2TXG
✅ 드롭인📋 참조 대체품 (카탈로그에 없음)
NIS5431MTATXG
✅ 드롭인 ⚠️ 사양 미검증📋 참조 대체품 (카탈로그에 없음)
NIS5432MTATXG
✅ 드롭인 ⚠️ 사양 미검증📋 참조 대체품 (카탈로그에 없음)
NIS6351MT1TXG 사양
| Product Type | Electronic Fuse (eFuse) Protection IC |
| Input Voltage Rating | 5 V |
| 최대 출력 전류 | 3 A |
| Protection Features | Overcurrent, Thermal Latch, Fault Shutdown |
| Reset Behavior | Resettable / Thermal Latch |
| 패키지 | 10-WDFNW (3x3 mm) |
| 실장 유형 | Surface Mount |
| Manufacturer | onsemi (ON Semiconductor) |
| Typical Application | USB 5V line protection |
| RoHS 상태 | Compliant |
NIS6351MT1TXG 10-wdfnw (3x3 mm) 핀 구성 가이드
NIS6351MT1TXG(10-wdfnw (3x3 mm) 패키지)의 핀 구성입니다. 핀 번호, 기능, 연결 다이어그램은 제조사 데이터시트에 정의되어 있습니다. 정확한 풋프린트와 솔더링 지침은 해당 문서를 참조하십시오.
다음에 대한 상세 핀아웃 데이터 없음: NIS6351MT1TXG.
다음을 참조하십시오: 데이터시트 전체 핀 구성은 다음을 참조하십시오.
일반적인 애플리케이션
NIS6351MT1TXG 적합 용도: 6 애플리케이션s: USB Port Power Protection, Notebook and Docking Station 5V Rails, Hot-Swap Accessory Protection, Industrial 5V Control Rail Protection, Consumer Electronics Charging Ports, SSD and Storage Peripheral Power Inputs.
USB Port Power Protection
The NIS6351MT1TXG is purpose-built for 5V USB port protection, per the onsemi datasheet description of the device as a resettable fuse enhancing USB application reliability. Placed in series with the USB VBUS 5V rail, the eFuse limits fault current to safe levels within microseconds when a downstream device shorts or overloads, far faster than a passive PPTC polymer fuse which takes seconds to trip. Its 3 A rating covers high-current USB port classes, and the thermal latch behavior prevents repeated fault cycling that could damage connectors or cabling. Designers should set the external current-limit configuration to match the USB port current class and place the eFuse close to the VBUS connector for maximum protection coverage.
추천
Notebook and Docking Station 5V Rails
In notebook computers, docking stations, and multi-port hubs, several 5V accessory rails must be independently protected so that a single shorted accessory does not drag down the shared 5V system supply. The NIS6351MT1TXG provides per-port protection with its 3 A current limit and fast fault shutdown, isolating the fault while the rest of the system continues operating. The compact 10-WDFNW (3x3 mm) package fits dense multi-port layouts where a discrete fuse solution would consume excessive board area. Thermal latch operation keeps a latched fault off until service action, which is valuable in docking applications where the user can simply unplug the faulty accessory and re-dock to restore the port.
추천
Hot-Swap Accessory Protection
Hot-plugging accessories into a live 5V rail creates inrush current spikes as load capacitance charges, potentially damaging connectors and upsetting the supply. The NIS6351MT1TXG acts as an active inrush limiter and fault isolator in the hot-swap path, providing controlled turn-on behavior and microsecond overcurrent disconnection per its eFuse architecture described in the onsemi datasheet. Compared with a one-time fuse or PPTC device, it resets without service intervention and its 3 A rating accommodates power-hungry accessories. Layout should minimize series inductance on the protected path, and the exposed pad of the WDFNW-10 package must be well soldered to handle fault-event power dissipation safely.
추천
Industrial 5V Control Rail Protection
Industrial control panels and field-wired I/O modules frequently expose 5V logic supply rails to wiring faults, crushed cables, and miswiring during installation. The NIS6351MT1TXG offers a resettable, latching protection element rated 3 A for these 5V distribution points. Its thermal latch feature is especially valuable in industrial settings because a persistent fault remains isolated rather than auto-retrying, allowing safe diagnostics. The surface-mount WDFNW-10 (3x3 mm) package suits modern compact PLC and I/O module designs. Engineers should confirm ambient operating conditions against the datasheet temperature range and derate the 3 A rating where enclosure temperatures are elevated, following onsemi thermal guidance.
추천
Consumer Electronics Charging Ports
Charging ports in set-top boxes, monitors, and small appliances supply external devices over 5V lines where shorted or non-compliant cables are common. The NIS6351MT1TXG protects the host 5V supply with its 3 A current limit and fast eFuse response, meeting the reliability goals described in the onsemi datasheet for 5V electronic fusing. Because the device resets after transient faults, warranty returns due to blown one-time fuses are avoided, and the thermal latch prevents sustained heating into a hard short. Compact WDFNW-10 packaging allows placement directly at each charging connector. Verify the current-limit setting covers the maximum intended charge current while still tripping on genuine faults.
추천
SSD and Storage Peripheral Power Inputs
External SSD enclosures and storage peripherals operating from a 5V input benefit from an upstream eFuse such as the NIS6351MT1TXG, which isolates the storage electronics from host-side faults and limits current during drive failures. The 3 A rating of the NIS6351MT1TXG accommodates typical 2.5-inch and portable SSD power budgets on a 5V rail. Its fast fault disconnection protects the host port from a shorted drive input stage, and resettable operation allows the enclosure to be re-powered after the drive is replaced. Place the eFuse near the power input connector and provide adequate copper on the exposed pad of the WDFNW-10 package for fault-dissipation events per onsemi layout recommendations.
추천
엔지니어링 참조 데이터: NIS6351MT1TXG — 비교, 설계 지침 및 규정 준수 정보.
선택 가이드
대체품과의 비교
| 파라미터 | 이 제품 |
|---|---|
| Package | 10-WDFNW (3x3 mm) |
| Brand | onsemi |
| Rated Voltage | 5 V |
| Maximum Current | 3 A |
| Protection Type | eFuse with Thermal Latch |
주요 차별점
- Active microsecond fault response (vs Passive PPTC resettable fuses)
- Thermal latch prevents fault cycling (vs Auto-retry eFuse alternatives)
- Compact integrated protection (vs Discrete FET + comparator protection circuits)
설계 노트
During a fault event, the NIS6351MT1TXG dissipates significant transient power before the thermal latch trips. Estimated: at 5 V rail with a hard short and the internal sense FET fully conducting momentarily, peak power can exceed several watts for the fault response interval. The exposed pad of the WDFNW-10 (3x3 mm) package must be soldered to a minimum of 2x2 via-stitched copper pour to keep junction temperature within limits during repeated fault events. Verify with thermal imaging in your final enclosure at worst-case ambient.
Follow the onsemi datasheet land pattern for the 10-WDFNW package exactly, including exposed-pad aperture dimensions. Place input capacitance close to the input pin and output capacitance close to the load-side pin, using short wide traces on the 3 A power path to minimize series resistance and inductance. Keep sensitive fault/status signal traces away from the high-current path to avoid false fault indications during transient events.
Do not confuse the NIS6351 eFuse with a passive PPTC fuse: its thermal latch means the part stays OFF after a severe fault until conditions are cleared, so systems must include a power-cycle or reset mechanism for field recovery. Also confirm the current-limit configuration against the USB port class being protected - setting the limit above the connector or cable rating defeats the protection purpose, while setting it too low causes nuisance trips with legitimate high-current loads.
규정 준수 정보
RoHS compliance consistent with the TXG suffix and onsemi standard product policy; obtain formal material declarations from onsemi. REACH, halogen-free, and conflict-minerals status not stated in provided data.
