WM8196SCDS/V - 16-Bit 12 MSPS 3-Channel AFE | Cirrus Logic
부품 번호: WM8196SCDS/V ✓ 활성WM8196SCDS/V 개요
An analog front end is an interface between a sensitive imaging sensor and an electronic system. It conditions the small analog signals produced by CCD or CIS pixels before conversion into digital data. In the broader device hierarchy, an AFE precedes an ADC, which forms part of a data-conversion system and ultimately supports image acquisition, scanning, inspection, and machine-vision processing.
The WM8196SCDS/V provides three analog processing channels, each incorporating reset-level clamping, correlated double sampling, and programmable gain and offset adjustment. Three internal multiplexers support single-channel processing, while a shared high-speed ADC time-multiplexes the channel outputs. According to the manufacturer datasheet, the digital output uses an 8-bit plus 8-bit data organization.
The device supports a 12 MSPS pixel sampling rate and delivers 16-bit digitized image data, making it appropriate for CCD and CIS imaging systems that require more scan-line throughput than a general-purpose low-speed ADC provides. Its analog supply is 5 V, while the digital interface can operate from 2.97 V to 3.63 V or 5 V, allowing integration with both 3.3 V and 5 V digital systems.
Typical uses include document scanners, flatbed scanners, contact-image-sensor scanners, industrial inspection equipment, and compact imaging modules. Each analog channel can apply calibrated gain and offset to compensate for pixel and sensor variation before the multiplexed ADC performs conversion.
The main design consideration is the relationship among sensor timing, analog signal conditioning, output data capture, and clocking. The three channels and their multiplexers must be configured for the intended sensor arrangement, and the digital interface must match the host processor voltage and data-capture method. Power and grounding also require care because sensor signals pass through high-gain analog stages before digitization.
This page consolidates the manufacturer electrical information, package details, application guidance, comparison parameters, and practical design notes into one engineering reference. It also distinguishes verified drop-in alternatives from packaging variants that do not constitute meaningful component substitutions.
드롭인 대체품: WM8196SCDS/V — 동일 패키지, 핀 호환. PCB 재작업이 필요한 다른 패키지 부품은 제외됩니다.
이 제품에는 사용 가능한 드롭인 대체품이 없습니다.
대체품 요청WM8196SCDS/V 최대 정격 & 전기적 특성
| Device Type | 3-channel CCD/CIS analog front end and digitizer |
| ADC Resolution | 16 bit |
| Pixel Sample Rate | 12 MSPS |
| Number of Analog Channels | 3 channels |
| Digital Output Organization | 8-bit + 8-bit |
| Analog Signal Processing | Reset-level clamping, correlated double sampling, programmable gain, and programmable offset |
| Channel Multiplexing | 3 multiplexers with single-channel processing |
| Analog Supply Voltage | 5 V |
| Digital Supply Voltage | 2.97 V to 3.63 V or 5 V |
| Power Dissipation | 300 mW |
| Supported Sensors | CCD and contact image sensors |
| 패키지 | 28-SSOP, 5.30 mm width |
| Package Width | 5.30 mm (0.209 inch) |
| 실장 유형 | Surface mount |
WM8196SCDS/V 5.30 mm (0.209 inch) 핀 구성 가이드
WM8196SCDS/V(5.30 mm (0.209 inch) 패키지)의 핀 구성입니다. 이 아날로그 부품에는 입력, 출력, 전원 공급 핀이 있습니다. 오프셋 널, 보상, 인에이블 핀 구성은 제조사 데이터시트를 참조하십시오. 신호 컨디셔닝 및 증폭기 회로에 이상적입니다.
다음에 대한 상세 핀아웃 데이터 없음: WM8196SCDS/V.
다음을 참조하십시오: 데이터시트 전체 핀 구성은 다음을 참조하십시오.
일반적인 애플리케이션
WM8196SCDS/V 적합 용도: 6 애플리케이션s: Document Scanner Imaging, Flatbed Scanner Signal Chain, Contact Image Sensor Interface, Industrial Inspection Imaging, Machine Vision Imaging Module, Optical Character Recognition Module.
Document Scanner Imaging
The WM8196SCDS/V suits document scanners that digitize CCD or contact image sensor output without a separate high-speed ADC. Its three analog channels provide reset-level clamping, correlated double sampling, programmable gain, and programmable offset before the outputs are multiplexed into the 16-bit converter. Operation up to 12 MSPS supports scan-line throughput, while 5 V analog and 3.3 V or 5 V digital supplies simplify mixed-voltage integration. The host controller must capture the 8-bit plus 8-bit output format and synchronize sensor transfer timing with the AFE clock.
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Flatbed Scanner Signal Chain
In a flatbed scanner, the WM8196SCDS/V can condition multiple sensor lines before high-speed digitization. Correlated double sampling suppresses reset-related offsets, while programmable gain and offset establish the operating point for pixels with different response levels. The three-channel architecture and internal multiplexers reduce the number of separate high-speed converters required. Its 16-bit resolution preserves gray-scale detail, and the 12 MSPS pixel rate supports higher scan speeds than a lower-rate general-purpose ADC. Calibration tables should be designed around the sensor's actual transfer characteristic and illumination conditions.
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Contact Image Sensor Interface
The WM8196SCDS/V is appropriate for compact CIS modules because it integrates the sensor-interface functions required before digitization. Each of the three channels can clamp the reset level, perform correlated double sampling, and apply calibrated gain and offset to the analog pixel signal. The resulting 16-bit samples are time-multiplexed into one ADC, which helps limit board area and component count. At the same time, the 12 MSPS rating supports fast line capture, and the separate analog and digital supply options simplify connection to CIS timing and host-controller logic.
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Industrial Inspection Imaging
The WM8196SCDS/V can form the sensor-conditioning portion of an industrial inspection system using CCD or CIS arrays. Programmable per-channel gain and offset provide the adjustment needed for illumination variation, sensor aging, or differing channel sensitivities, while correlated double sampling helps reject source-related offsets. Digitizing at up to 12 MSPS supports rapid inspection cycles, and the 16-bit conversion retains useful dynamic range for defect analysis. System designers should still validate vibration, temperature, illumination, calibration stability, and data-transfer bandwidth against the complete inspection platform.
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Machine Vision Imaging Module
For a compact machine-vision module, the WM8196SCDS/V combines sensor conditioning and conversion in one 28-SSOP device. Three channels permit flexible routing of CCD or CIS outputs, and the multiplexed architecture feeds a shared 16-bit ADC at up to 12 MSPS. This can reduce external conversion circuitry while retaining the bit depth needed for automated inspection, measurement, or optical recognition. The host processor must accept the split 8-bit plus 8-bit digital output and sustain the corresponding data rate. Layout must preserve a quiet analog return path and tightly control clock and sensor timing.
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Optical Character Recognition Module
The WM8196SCDS/V is suitable for OCR and page-reading modules that need consistent conversion of CIS or CCD pixel signals. Correlated double sampling and programmable offset help establish repeatable signal levels, while programmable gain accommodates variations in document illumination and sensor response. The 16-bit ADC supports detailed grayscale extraction and the 12 MSPS rate supports rapid line acquisition. System calibration should include dark, flat-field, and white-reference procedures so that gain and offset adjustments do not amplify illumination nonuniformity. A stable analog supply, short sensor traces, and controlled clocking are essential to repeatable character recognition.
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추천 제품 요약
엔지니어링 참조 데이터: WM8196SCDS/V — 비교, 설계 지침 및 규정 준수 정보.
선택 가이드
대체품과의 비교
| 파라미터 | 이 제품 |
|---|---|
| Device Type | CCD/CIS analog front end and digitizer |
| ADC Resolution | 16 bit |
| Pixel Sample Rate | 12 MSPS |
| Analog Channels | 3 channels |
| Digital Output | 8-bit + 8-bit |
| Analog Supply Voltage | 5 V |
| Digital Supply Voltage | 2.97 V to 3.63 V or 5 V |
| Power Dissipation | 300 mW |
| Package | 28-SSOP, 5.30 mm width |
| Brand | Cirrus Logic |
주요 차별점
- Integrated three-channel CCD and CIS signal conditioning (vs WM8196SCDS/RV)
- Shared multiplexing architecture reduces converter count (vs General-purpose ADC)
- Mixed-voltage analog and digital operation (vs Fixed 5 V interface)
설계 노트
Follow the manufacturer reference layout for the analog inputs, reference circuitry, clock connections, and decoupling. Route sensor signals away from digital clock and data nets, use a continuous ground reference, and place input and bypass capacitors close to their associated pins. Analog signal integrity is especially important because the AFE performs correlated double sampling and adjustable gain before digitization.
Keep sensor and pixel-clock routing short, use a solid reference plane, and avoid stubs or unnecessary vias on sensitive analog traces. Provide clean supply return paths and decouple the analog and digital domains near the device according to the manufacturer schematic. Validate the final layout for clock jitter, sensor crosstalk, and settling at the selected sample rate because the three channels share one time-multiplexed ADC.
Budget the 5 V analog supply and the 2.97 V to 3.63 V or 5 V digital supply independently. Check the maximum operating current for the selected clock and sensor mode in the manufacturer datasheet, then verify regulator headroom, startup sequencing, and capacitor tolerance. The listed 300 mW figure is the device power specification and should not be treated as a complete board-level thermal limit.
Do not treat the WM8196SCDS/RV listing as a confirmed drop-in substitute until the ordering suffix, temperature grade, tape-and-reel configuration, and manufacturer marking requirements have been checked. Also confirm that the host controller can capture the split 8-bit plus 8-bit output at 12 MSPS and that the sensor reset, transfer, and sample timing satisfies the AFE requirements.
규정 준수 정보
Compliance status was not identified in the available product information. Do not infer RoHS, REACH, AEC-Q100, lead-free, halogen-free, or conflict-minerals status from the package or lifecycle listing.
