EPF10K30ATI144-3N vs EPF10K30ATI144-2 Pengandingan
Pengandingan Sisi Kiri Sisi Kanan Terperinci EPF10K30ATI144-3N disebabkan oleh Altera dan EPF10K30ATI144-2 disebabkan oleh Altera. Bandingkan spesifikasi utama, parameter elektrik, pakej, status kehidupan, harga, dan keupayaan untuk menentukan komponen terbaik untuk keperluan disenjaya anda.
Altera
EPF10K30ATI144-3N - 30K Gate FLEX-10KA FPGA, 102 I/O, TQFP-144
EPF10K30ATI144-3N ⚠ Bahagian terakhir untuk beliPengandingan Spesifikasi
| Parametr | EPF10K30ATI144-3N | EPF10K30ATI144-2 |
|---|---|---|
| Merek | Altera | Altera |
| Kategori | FPGA & CPLD | FPGA & CPLD |
| Status Lingkungan Hidup | Masa Terakhir Dibeli | NRND |
| Family | FLEX 10KA | FLEX 10K Embedded Programmable Logic Family |
| Logic Elements / Cells | 1,728 | — |
| Typical Gates | 30,000 | — |
| Logic Array Blocks (LABs) | 216 | — |
| Embedded Memory (EABs) | 12 EABs | — |
| Embedded SRAM | 12,288 bits | — |
| User I/O | 102 | — |
| Supply Voltage (VCCINT) | 3.3 V | — |
| Maximum Operating Frequency | 125 MHz | — |
| Technology Node | 0.3 µm CMOS | — |
| Kemasan | TQFP-144 (20x20 mm) | 144-pin TQFP (TQFP-144), 0.500 mm pitch |
| Jenis Pemasangan | Surface Mount | Surface Mount |
| Suhu Operasi | 0°C to +70°C (Commercial) | -40 °C to +85 °C (industrial, 'I' suffix) |
| Speed Grade | -3 (slowest FLEX 10KA bin) | -2 |
| Programming Interface | JTAG (IEEE 1149.1) | — |
| Status RoHS | unknown | Unknown (legacy Altera product line; verify with supplier) |
| Series | — | FLEX 10KA |
| Typical Gate Count | — | 30,000 gates |
| Logic Elements | — | 1,728 cells |
| Embedded Array Blocks (EABs) | — | 12 |
| On-chip RAM | — | 12,288 bits |
| User I/O Pins | — | 246 (max for family), 102 in this 144-TQFP variant per DigiKey listing |
| Propagation Delay | — | 13 ns (per Microchip USA) |
| Process Technology | — | 0.42 µm CMOS, 4 metal layers |
| Core Voltage | — | 5.0 V |
| I/O Voltage Compatibility | — | 5.0 V / 3.3 V / 2.5 V |
| Configuration Method | — | SRAM, in-system programmable |
| JTAG Support | — | IEEE 1149.1 boundary-scan |