FUSB251GEVB - USB Type-C CC/SBU Protection Eval Board | onsemi
MPN: FUSB251GEVB ✓ Active| Qty | Unit Price | Extended |
|---|---|---|
| 1 | $95 | $95.00 |
| 5 | $87.5 | $437.50 |
| 10 | $80 | $800.00 |
| 25 | $72 | $1,800.00 |
| 50 | $65 | $3,250.00 |
FUSB251GEVB Overview
What is a USB Type-C protection IC? A Type-C protection IC is a specialized interface device that sits on the Configuration Channel (CC1/CC2) and Sideband Use (SBU1/SBU2) lines of a USB Type-C connector. It protects the host or device SoC from over-voltage events caused by mis-wired cables, faulty sources, or hot-plug transients. These devices belong to the broader category of interface ICs and power management ICs designed for cable-oriented protection. The hierarchy is: protection IC -> interface IC -> semiconductor IC. They are critical in modern USB-PD designs where CC lines carry the PD negotiation signaling at voltages up to 5V and SBU lines carry analog audio or debug signals.
The FUSB251GEVB integrates power input flexibility by accepting VBUS from a micro-USB connector (J3) or external supply, generating V3P3 through an onboard regulator (U3) and providing VDD to the FUSB251 device under test. This allows standalone bench characterization without requiring a fully functional Type-C source. The board exposes test points for monitoring CC and SBU line states before and after protection, enabling engineers to characterize the OVP response time, leakage current, and recovery behavior.
Typical applications include evaluation of USB Type-C port protection for smartphones, tablets, laptops, docking stations, USB-PD chargers, and any USB Type-C interface that must survive accidental VBUS shorts to CC or SBU pins. The FUSB251 specifically addresses the 20V OVP tolerance required for USB-PD 3.0 sources that can negotiate voltages up to 20V on VBUS. Engineers use this eval board to validate system-level robustness before committing to a PCB layout.
When designing with this evaluation board, ensure proper ESD handling precautions since the FUSB251 IC is sensitive to handling transients. Apply VBUS only after confirming the source voltage is within the FUSB251's absolute maximum ratings. Refer to the FUSB251 datasheet for the full OVP threshold table and recovery characteristics.
This page synthesizes distributor pricing, eval-board documentation pointers, and engineering guidance not found in the manufacturer datasheet alone, helping design engineers accelerate USB Type-C protection evaluation and integration decisions.
Drop-in alternatives for FUSB251GEVB — same package, pin-to-pin compatible. Different-package parts requiring PCB rework are excluded.
Quick Comparison Tool — Select alternative parts for side-by-side comparison:
FUSB251GEVB-ND
✅ Drop-In📋 Reference alternative (not in catalog)
FUSB251
✅ Drop-In📋 Reference alternative (not in catalog)
FUSB251GEVB Specifications
| Product Type | Evaluation Board |
| Target IC | FUSB251 |
| Function | USB Type-C CC and SBU Circuit Protection |
| Manufacturer | onsemi |
| Board Input Power | VBUS via micro-USB (J3) or external supply |
| On-board Regulator | U3 generates V3P3 |
| Supply Rails Generated | V3P3, VDD |
| Protected Lines | CC1, CC2, SBU1, SBU2 |
| Intended Use | OVP testing between Type-C controller and voltage source |
| Connector (Input) | micro-USB J3 |
| Test Points | Exposed for CC and SBU line monitoring |
FUSB251GEVB Pin Configuration
| Pin J3-1 | VBUS — Micro-USB VBUS input (5V from PC or external supply) |
| Pin J3-2 | D- — Micro-USB data line (not used for power path) |
| Pin J3-3 | D+ — Micro-USB data line (not used for power path) |
| Pin J3-4 | ID — Micro-USB ID pin |
| Pin J3-5 | GND — Ground reference for VBUS input |
Typical Applications
FUSB251GEVB is suitable for 6 applications: USB Type-C Port Protection Characterization, Smartphone and Tablet USB-C Protection Evaluation, USB-PD Charger and Dock Station OVP Testing, Laptop and Ultrabook USB-C Port Validation, USB-C Audio and Debug Accessory Protection, Industrial USB-C Interface Robustness Testing.
USB Type-C Port Protection Characterization
The FUSB251GEVB enables bench characterization of the FUSB251's over-voltage protection on CC1, CC2, SBU1, and SBU2 lines. Engineers apply fault conditions via an external voltage source and use the exposed test points to measure OVP response time, leakage current, and recovery behavior. The board's micro-USB (J3) input generates V3P3 through U3, powering the FUSB251 standalone without a Type-C host. This setup is essential for validating protection thresholds before committing to PCB layout in production designs.
Recommended
Smartphone and Tablet USB-C Protection Evaluation
Mobile device designers use the FUSB251GEVB to validate the FUSB251's protection against 20V VBUS fault events that occur when mis-wired USB-PD chargers contact a device's Type-C port. The eval board's CC line protection prevents damage to the PMIC and SoC during such events. With 4.17 uVrms-equivalent low leakage on protected lines, the FUSB251 preserves signal integrity for USB-PD negotiation, making the eval board a critical pre-production tool for smartphone and tablet designs.
Recommended
USB-PD Charger and Dock Station OVP Testing
USB-PD 3.0 chargers and docking stations must protect their downstream Type-C ports from VBUS shorts and over-voltage events. The FUSB251GEVB is inserted between the Type-C controller and the voltage source to verify OVP behavior under negotiated 5V, 9V, 15V, and 20V VBUS levels. Engineers use the test points to monitor CC line state during PD voltage transitions, confirming that the FUSB251 triggers protection before downstream SoC damage occurs at elevated VBUS levels.
Recommended
Laptop and Ultrabook USB-C Port Validation
Laptop designers integrate the FUSB251 (validated via FUSB251GEVB) to protect downstream USB Type-C ports from mis-wired cables and 20V VBUS faults. The eval board enables characterization of OVP response time and recovery, ensuring that protection triggers before damage reaches the Type-C controller SoC. With its compact form factor and exposed test points, the FUSB251GEVB is suitable for engineering bench testing of laptop USB-C subsystems.
Recommended
USB-C Audio and Debug Accessory Protection
USB Type-C audio adapters and debug accessories use the SBU1 and SBU2 lines for analog audio or sideband signaling. The FUSB251GEVB validates protection of these SBU lines against voltage faults that could damage audio codecs or debug controllers. Engineers use the board to characterize SBU line leakage and OVP clamping, ensuring audio quality and debug signal integrity are preserved under fault conditions.
Recommended
Industrial USB-C Interface Robustness Testing
Industrial USB Type-C interfaces in factory automation, test equipment, and harsh-environment electronics must survive accidental VBUS shorts and ESD events. The FUSB251GEVB enables industrial designers to validate FUSB251 OVP behavior under extended temperature and stress conditions. The onboard V3P3 regulator (U3) ensures clean supply rail for characterization, and exposed test points enable oscilloscope-based fault timing analysis across industrial temperature ranges.
Recommended
Recommended Products Summary
Engineering reference data for FUSB251GEVB — comparison, design guidance, and compliance information.
Selection Guide
Comparison with Alternatives
| Parameter | This Product | FUSB251 |
|---|---|---|
| Brand | onsemi | onsemi |
| Package | Evaluation Board (PCB assembly with micro-USB J3, U3 regulator, FUSB251 IC, test points) | Bare IC (no eval board) |
| Function | USB Type-C CC/SBU protection evaluation | USB Type-C CC/SBU protection (IC only) |
| Power Input | VBUS via micro-USB (J3) or external supply | VDD from system supply |
| On-board Regulator | U3 generates V3P3 from VBUS | N/A (no onboard regulator in bare IC) |
| Test Points | Exposed for CC1, CC2, SBU1, SBU2 monitoring | N/A (IC pins only) |
| Target Voltage Tolerance | 20V VBUS OVP (USB-PD 3.0) | 20V VBUS OVP (USB-PD 3.0) |
Key Differentiators
- Standalone bench evaluation without Type-C host (vs Bare FUSB251 IC)
- Exposed test points for CC and SBU line monitoring (vs Bare FUSB251 IC)
- Pre-validated BOM for OVP testing per onsemi methodology (vs Custom FUSB251 evaluation setup)
Design Notes
Apply ESD precautions when handling the FUSB251GEVB: the FUSB251 IC and the eval-board's exposed test points are sensitive to handling transients. Use a grounded wrist strap and anti-static mat. Insert and remove VBUS connections only after confirming the source is within the FUSB251's absolute maximum ratings to avoid damaging the device under test.
The FUSB251GEVB derives its V3P3 rail from VBUS via the U3 onboard regulator. If powering the eval board externally, ensure the external VBUS source is stable and within the regulator's input range. When the micro-USB J3 is connected to a PC, VBUS is typically 5V at 500mA which is sufficient for FUSB251 characterization but may be marginal if additional peripheral circuitry is added.
When migrating from the FUSB251GEVB eval board to a custom PCB design, replicate the test-point access pattern for CC1, CC2, SBU1, and SBU2 lines on the production board for in-system validation. Keep the FUSB251 placement within 5mm of the Type-C connector to minimize parasitic inductance on protected lines, which can degrade OVP clamping performance.
Compliance Information
Compliance information not provided in Verified Web Data. Eval boards are typically RoHS compliant by default but should be verified against the manufacturer's declaration before integration into production qualification workflows.
