EP1K30QC208-1N vs EP1K30QC208-1 Сравнение
Подробное сравнение бок о бок EP1K30QC208-1N от Altera и EP1K30QC208-1 от Intel. Сравните ключевые характеристики, электрические параметры, упаковку, статус жизненного цикла, цены и наличие, чтобы выбрать лучший компонент для ваших требований.
Сравнение характеристик
| Параметр | EP1K30QC208-1N | EP1K30QC208-1 |
|---|---|---|
| Бренд | Altera | Intel |
| Категория | FPGA & CPLD | FPGA & CPLD |
| Статус жизненного цикла | Obsolete | Obsolete |
| Наличие | In Stock | In Stock |
| Цена за единицу (USD) | $29,88 | $10,85 |
| Device Family | ACEX 1K | ACEX-1K |
| Product Type | FPGA (Field Programmable Gate Array) | — |
| Number of Typical Gates | 30000 | — |
| Number of Logic Elements / Cells | 1728 | — |
| Number of LABs / CLBs | 216 | — |
| Total RAM Bits | 24576 | — |
| Number of User I/O | 147 | — |
| Напряжение питания | 2.5 V | — |
| Process Technology | 0.22 um | 2.5 V CMOS |
| Maximum Internal Frequency | 250 MHz | — |
| Package Type | 208-BFQFP (208-pin PQFP) | — |
| Package Code | FQFP, square | — |
| Terminal Form | Gull wing | — |
| Number of Terminals | 208 | — |
| Temperature Grade | Commercial | — |
| Lead-Free Finish (N-Suffix) | Yes | — |
| Тип монтажа | Surface Mount | Surface Mount (gull-wing leads) |
| Статус RoHS | [DATA_NEEDED: RoHS compliance status] | Compliant (lead-free) |
| REACH Status | [DATA_NEEDED: REACH compliance status] | — |
| Диапазон рабочих температур | [DATA_NEEDED: exact operating temperature range] | — |
| Moisture Sensitivity Level | [DATA_NEEDED: MSL] | — |
| Logic Elements (LEs) | — | 1,728 |
| Equivalent Gates | — | 30,000 |
| Logic Array Blocks (LABs) | — | 216 |
| Embedded Memory (EAB) | — | 24,576 bits |
| Maximum User I/O | — | 147 |
| Core Supply Voltage (VCCINT) | — | 2.5 V (2.375 V to 2.625 V) |
| Корпус | — | 208-BFQFP (Plastic Quad Flat Pack, PQFP208) |
| Terminal Pitch | — | 0.500 mm |
| Рабочая температура | — | 0 °C to +70 °C (commercial) |
| Maximum Operating Frequency | — | up to 250 MHz (family typical) |
| Configuration Method | — | SRAM, in-system reconfigurable (volatile) |
| Boundary-Scan Test | — | JTAG IEEE 1149.1 |
| I/O Voltage Support | — | 2.5 V / 3.3 V (multi-volt I/O) |
| Configuration Device Support | — | EPC2, EPC4, EPC8 Enhanced Configuration Devices |