EPF10K200SRC240-2 vs EPF10K200SRC240-3N Сравнение
Подробное сравнение бок о бок EPF10K200SRC240-2 от Intel и EPF10K200SRC240-3N от Intel. Сравните ключевые характеристики, электрические параметры, упаковку, статус жизненного цикла, цены и наличие, чтобы выбрать лучший компонент для ваших требований.
Сравнение характеристик
| Параметр | EPF10K200SRC240-2 | EPF10K200SRC240-3N |
|---|---|---|
| Бренд | Intel | Intel |
| Категория | FPGA & CPLD | FPGA & CPLD |
| Статус жизненного цикла | Obsolete | Obsolete |
| Наличие | In Stock | In Stock |
| Цена за единицу (USD) | $62,50 | $162,00 |
| Series | FLEX 10KS | — |
| Family | FLEX 10KS (FLEX 10KE/10KA generation) | FLEX 10KE |
| Number of Logic Elements (LEs) | 9984 | — |
| Number of Logic Array Blocks (LABs) | 1248 | — |
| Total RAM Bits | 98304 | — |
| Number of User I/Os | 182 | — |
| Number of Gates | 513000 | — |
| Core Supply Voltage | 2.375 V to 2.625 V (nominal 2.5 V) | 2.5 V |
| Рабочая температура | 0C to +70C (Commercial, TA) | 0 °C to +70 °C (Commercial) |
| Корпус / Типоразмер | 240-BFQFP Exposed Pad (240-RQFP, 32x32 mm) | — |
| Тип монтажа | Surface Mount | Surface Mount |
| Terminal Form | GULL WING | — |
| Number of Terminals | 240 | — |
| Speed Grade | -2 (~80 MHz internal, typical) | -3 (commercial) |
| Configuration Interface | IEEE 1149.1 JTAG + Altera EPC EEPROM | — |
| Process Technology | 0.42 micrometer CMOS SRAM | 0.22 µm CMOS SRAM |
| Статус RoHS | [DATA_NEEDED: RoHS compliance status] | [DATA_NEEDED: RoHS status] |
| Typical System Gates | — | 200,000 |
| Logic Elements (LEs) | — | 9,984 |
| Maximum Logic Elements | — | 9,984 |
| Embedded Array Blocks (EABs) | — | 24 |
| Maximum User RAM Bits | — | 98,304 |
| Logic Array Blocks (LABs) | — | 1,248 |
| User I/Os | — | 470 (effective); 182 user pins per RQFP-240 with the rest assigned to dedicated functions |
| Propagation Delay (tPD) | — | 0.40 ns |
| Internal Operating Frequency | — | 166.67 MHz |
| MultiVolt I/O Support | — | 2.5 V and 3.3 V interfaces |
| Корпус | — | 240-pin RQFP (Power QFP) with exposed pad, 34.6 x 34.6 mm, 0.5 mm pitch |
| JTAG Support | — | IEEE Std 1149.1 Boundary-Scan (contributes up to 31,250 gates of test logic) |
| Configuration Method | — | SRAM-based; requires external configuration device (e.g., EPC2) for power-up loading |