EP1K10TC100-1 vs EP1K10TC100-1N Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EP1K10TC100-1 sa pamamagitan ng Altera at EP1K10TC100-1N sa pamamagitan ng Intel. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Pagsanggunian na paghahambing
| Parametro | EP1K10TC100-1 | EP1K10TC100-1N |
|---|---|---|
| Brand | Altera | Intel |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Obsolete | Obsolete |
| Series | ACEX 1K | EP1K10 |
| Family | ACEX-1K FPGA family (2.5V) | ACEX-1K |
| Typical Gates | 10,000 | — |
| Logic Elements / Cells | 576 | 576 |
| Embedded Memory (bits) | 12,288 (dual-port SRAM) | — |
| Logic Array Blocks (LABs) | 72 | 72 |
| Embedded Array Blocks (EABs) | Yes (memory / megafunctions) | 3 x 4 Kbit |
| User I/Os | 66 | 66 |
| Maximum Frequency | 250 MHz | — |
| Process Technology | 0.22 µm CMOS | 0.22 µm CMOS SRAM |
| Core Voltage (VCCINT) | 2.5 V | — |
| Speed Grade | -1 | -1N (commercial, slower tier) |
| Packhaging | 100-pin TQFP | 100-pin TQFP (14 mm x 14 mm, 1 mm height) |
| Uri ng Pagpapasok | Surface Mount | Surface Mount (gull-wing) |
| JTAG Support | IEEE Std 1149.1 boundary-scan | Yes (IEEE 1149.1 boundary-scan) |
| Configuration Method | SRAM-based (external config device required) | SRAM (external PROM required) |
| Temperature na Operasyon | [DATA_NEEDED: commercial / industrial temp grade] | 0 °C to 70 °C (commercial) |
| Tindminan RoHS | [DATA_NEEDED] | Compliant |
| Total Gates (typical) | — | 10,000 |
| Embedded RAM Bits | — | 12,288 bits |
| Core Supply Voltage | — | 2.5 V (2.375 V to 2.625 V) |