EP1K50TI144-2 vs EP1K50TI144-2Q Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EP1K50TI144-2 sa pamamagitan ng Intel at EP1K50TI144-2Q sa pamamagitan ng Intel. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Pagsanggunian na paghahambing
| Parametro | EP1K50TI144-2 | EP1K50TI144-2Q |
|---|---|---|
| Brand | Intel | Intel |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Obsolete | NRND |
| Family | ACEX-1K | ACEX-1K |
| Logic Elements (LEs) | 2,880 | — |
| Typical Gates | 50,000 | — |
| Maximum User I/O | 102 | — |
| Logic Array Blocks (LABs) | 360 | — |
| Embedded Array Blocks (EABs) | [DATA_NEEDED: EAB count] | — |
| Total RAM Bits | 40,960 | — |
| Core Supply Voltage (VCCINT) | 2.5 V (2.375 V to 2.625 V) | — |
| I/O Supply Voltage (VCCIO) | [DATA_NEEDED: VCCIO range] | — |
| Speed Grade | -2 | -2 |
| Temperature na Operasyon | -40 °C to +85 °C (Industrial) | — |
| Packhaging | 144-LQFP (TQFP-144) | 144-pin TQFP (TQFP-144) |
| Uri ng Pagpapasok | Surface Mount | Surface Mount |
| Process Technology | SRAM-based, 0.18 µm | 0.22 um CMOS |
| Configuration Method | Passive Serial / Passive Parallel / JTAG | — |
| JTAG Support | IEEE 1149.1 Boundary Scan | — |
| Level ng MSL | [DATA_NEEDED: MSL rating] | — |
| Tindminan RoHS | [DATA_NEEDED: RoHS compliance] | [DATA_NEEDED: RoHS status] |
| Device Logic Elements | — | 2880 |
| Typical Gate Count | — | 50000 |
| Embedded Memory Bits (EAB) | — | 40960 |
| Number of User I/O | — | 102 |
| Number of Logic Array Blocks (LABs) | — | [DATA_NEEDED: LAB count] |
| Number of Embedded Array Blocks (EABs) | — | [DATA_NEEDED: EAB count] |
| Core Voltage (VCCINT) | — | 2.5 V |
| I/O Bank Voltage (VCCIO) | — | 2.5 V / 3.3 V compatible per bank |
| Operating Temperature Grade | — | Industrial (-40C to +100C) |
| Configuration Scheme | — | SRAM, serial or parallel, JTAG (IEEE 1149.1) |