EPF8282ATC100-3 vs EPF8282ATI100-3NGZ Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EPF8282ATC100-3 sa pamamagitan ng Intel at EPF8282ATI100-3NGZ sa pamamagitan ng Altera. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Pagsanggunian na paghahambing
| Parametro | EPF8282ATC100-3 | EPF8282ATI100-3NGZ |
|---|---|---|
| Brand | Intel | Altera |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Obsolete | Obsolete |
| Family | FLEX 8000 | FLEX 8000 |
| Logic Cells (LEs) | 208 | — |
| Usable Gates | 2,500 | ~2,500 |
| Typical Gates Equivalent | 12,000 | — |
| Maximum User I/O | 78 | — |
| Number of Logic Array Blocks (LABs) | 26 | — |
| Embedded Array Blocks (EABs) | 6 | — |
| Total RAM Bits | 12 Kbits | — |
| Process Technology | 0.42 micron CMOS SRAM | 0.42 µm CMOS |
| Supply Voltage (Core) | 5 V | — |
| MultiVolt I/O Support | 3.3 V / 5 V | — |
| Maximum Frequency | 125 MHz | — |
| Speed Grade | -3 | -3 |
| Packhaging | 100-pin TQFP (100-TQFP) | 100-pin TQFP |
| Configuration Method | SRAM, EPC1/EPC1064/EPC1213/EPC1441, microprocessor | — |
| Operating Temperature (Commercial) | 0 C to +70 C | — |
| In-Circuit Reconfigurable | Yes (ICR) | — |
| Boundary Scan | JTAG IEEE 1149.1 | — |
| Logic Elements / Cells | — | 208 |
| Logic Array Blocks (LABs) | — | 26 |
| User I/Os | — | 78 |
| Configuration Memory | — | SRAM (volatile, requires external load) |
| Core Supply Voltage | — | 5 V |
| Maximum Toggle Frequency | — | 125 MHz |
| Uri ng Pagpapasok | — | Surface Mount |
| Temperature na Operasyon | — | -40 °C to +85 °C (Industrial) |
| JTAG Boundary Scan | — | Yes (IEEE 1149.1) |
| Tindminan RoHS | — | [DATA_NEEDED: RoHS status] |
| Lead-Free / Pb-Free | — | [DATA_NEEDED: lead-free status] |