EPF8282ATI100-3N vs EPF8282ATC100-2W Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EPF8282ATI100-3N sa pamamagitan ng Altera at EPF8282ATC100-2W sa pamamagitan ng Altera. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Pagsanggunian na paghahambing
| Parametro | EPF8282ATI100-3N | EPF8282ATC100-2W |
|---|---|---|
| Brand | Altera | Altera |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Obsolete | Obsolete |
| Family | FLEX 8000 | FLEX 8000 |
| Logic Cells | 208 | — |
| Logic Array Blocks (LABs) | 26 | — |
| Usable Gates | 2,500 | — |
| User I/Os | 78 | — |
| Maximum Operating Frequency | 125 MHz | — |
| Process Technology | 0.42 um CMOS SRAM | 0.5 micron CMOS SRAM |
| Core Supply Voltage (VCCINT) | 5 V | — |
| I/O Supply Voltage (VCCIO) | 3.3 V or 5.0 V | — |
| Packhaging | 100-pin TQFP | 100-pin TQFP |
| Uri ng Pagpapasok | Surface Mount | Surface Mount |
| Temperature na Operasyon | 0C to +70C | — |
| Configuration Memory | SRAM (volatile) | — |
| Configuration Devices Supported | EPC1, EPC1064, EPC1213, EPC1441 | — |
| In-Circuit Reconfigurability | Yes (ICR) | — |
| Boundary-Scan Support | IEEE 1149.1 JTAG | — |
| Tindminan RoHS | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS status] |
| Logic Elements | — | 282 |
| Typical Gates | — | 2,500 |
| Maximum Gates | — | 5,000 |
| User I/O Pins | — | 78 |
| Flip-Flops | — | 208 |
| Embedded RAM Bits | — | 208 |
| Speed Grade | — | -2 |
| Operating Temperature Grade | — | Industrial ("W" suffix) |
| Configuration Method | — | SRAM, serial or parallel EPROM |
| JTAG Support | — | Yes (IEEE 1149.1 boundary-scan) |