EPF8636ARC208-4 vs EPF8820ARC208-3 Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EPF8636ARC208-4 sa pamamagitan ng Altera at EPF8820ARC208-3 sa pamamagitan ng Intel. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Intel
EPF8820ARC208-3 - FLEX 8000 FPGA, 8K Gates, 672 Cells | Intel / Altera
EPF8820ARC208-3 ObsoletePagsanggunian na paghahambing
| Parametro | EPF8636ARC208-4 | EPF8820ARC208-3 |
|---|---|---|
| Brand | Altera | Intel |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Obsolete | Obsolete |
| Product Family | FLEX 8000 | — |
| Device Series | EPF8636A | — |
| Usable Gates | 6,000 | 8,000 |
| Logic Elements | 136 | — |
| Flip-Flops (Registers) | 504 | — |
| Maximum User I/O | 218 | — |
| Embedded RAM Blocks | 8 x 256 x 8 bits | — |
| Logic Block Type | 4-input LUT with fast-carry chain | — |
| Supply Voltage (VCCINT) | 4.75 V to 5.25 V | — |
| I/O Voltage Tolerance | 3.3 V or 5 V | — |
| Speed Grade | -4 | — |
| Temperature na Operasyon | -40 C to +105 C | — |
| Packhaging | 208-RQFP (28x28 mm) with exposed pad | — |
| Uri ng Pagpapasok | Surface Mount | Surface Mount |
| Process Technology | 5 V CMOS, 0.42 um | 0.42 µm CMOS |
| Configuration Method | Serial configuration EEPROM (in-system) | — |
| JTAG / Boundary Scan | IEEE 1149.1 compliant | — |
| Tindminan RoHS | Non-compliant (legacy 5 V family) | [DATA_NEEDED: RoHS status] |
| Series | — | FLEX 8000 |
| Family | — | FLEX 8000 (EPF8820) |
| Logic Cells / Elements | — | 672 |
| Registers | — | 152 |
| Maximum Operating Frequency | — | 125 MHz |
| Supply Voltage (VCC) | — | 4.75 V to 5.25 V |
| Configuration Memory | — | SRAM (volatile) |
| Packhaging / Kaso | — | 208-BFQFP Exposed Pad (208-RQFP, 28x28 mm) |
| Supplier Device Package | — | 208-RQFP (28x28) |
| Packaging | — | Tray |
| Hanay ng Temperature na Operasyon | — | [DATA_NEEDED: operating temperature range] |
| In-Circuit Reconfigurability (ICR) | — | Yes (via external configuration devices) |
| Boundary-Scan Test | — | JTAG (IEEE 1149.1) |
| I/O Tolerance | — | 3.3 V / 5 V |
| Clock Networks | — | 4 dedicated low-skew global clocks |
| Lead-Free / Finish | — | [DATA_NEEDED: lead-free finish] |