EPF8820ARC208-2 vs EPF8820ARC208-3 Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EPF8820ARC208-2 sa pamamagitan ng Altera at EPF8820ARC208-3 sa pamamagitan ng Intel. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Intel
EPF8820ARC208-3 - FLEX 8000 FPGA, 8K Gates, 672 Cells | Intel / Altera
EPF8820ARC208-3 ObsoletePagsanggunian na paghahambing
| Parametro | EPF8820ARC208-2 | EPF8820ARC208-3 |
|---|---|---|
| Brand | Altera | Intel |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Obsolete | Obsolete |
| Family | FLEX 8000 | FLEX 8000 (EPF8820) |
| Logic Cells | 672 | — |
| Usable Gates | 8,000 (typical) | 8,000 |
| Registers | 1,500 (max) | 152 |
| User I/O Pins | 152 | — |
| Packhaging | 208-pin RQFP / BFQFP with exposed pad | — |
| Process Technology | 0.42 µm CMOS | 0.42 µm CMOS |
| Supply Voltage (Core) | 5 V | — |
| I/O Voltage (MultiVolt) | 3.3 V or 5.0 V | — |
| Speed Grade | -2 | — |
| Max Internal Frequency | 125 MHz | — |
| Configuration Method | SRAM - serial EPC device, parallel EPROM, or microcontroller | — |
| In-Circuit Reconfigurable | Yes (ICR) | — |
| Boundary-Scan / JTAG | Yes | — |
| Temperature na Operasyon | Commercial (0 °C to +70 °C) | — |
| Uri ng Pagpapasok | Surface Mount | Surface Mount |
| Tindminan RoHS | [DATA_NEEDED: rohs_status] | [DATA_NEEDED: RoHS status] |
| Series | — | FLEX 8000 |
| Logic Cells / Elements | — | 672 |
| Maximum Operating Frequency | — | 125 MHz |
| Supply Voltage (VCC) | — | 4.75 V to 5.25 V |
| Configuration Memory | — | SRAM (volatile) |
| Packhaging / Kaso | — | 208-BFQFP Exposed Pad (208-RQFP, 28x28 mm) |
| Supplier Device Package | — | 208-RQFP (28x28) |
| Packaging | — | Tray |
| Hanay ng Temperature na Operasyon | — | [DATA_NEEDED: operating temperature range] |
| In-Circuit Reconfigurability (ICR) | — | Yes (via external configuration devices) |
| Boundary-Scan Test | — | JTAG (IEEE 1149.1) |
| I/O Tolerance | — | 3.3 V / 5 V |
| Clock Networks | — | 4 dedicated low-skew global clocks |
| Lead-Free / Finish | — | [DATA_NEEDED: lead-free finish] |