EPM3064ATC44-7N vs EPM3064ATI44-10 Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EPM3064ATC44-7N sa pamamagitan ng Altera at EPM3064ATI44-10 sa pamamagitan ng Intel. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Pagsanggunian na paghahambing
| Parametro | EPM3064ATC44-7N | EPM3064ATI44-10 |
|---|---|---|
| Brand | Altera | Intel |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Obsolete | NRND |
| Family | MAX 3000A | MAX 3000A |
| Device Type | CPLD (Complex Programmable Logic Device) | — |
| Macro Cells | 64 | — |
| Logic Array Blocks | 2 | — |
| Usable Gates | 1,250 | — |
| User I/O Pins | 34 | — |
| Bilang ng Pins | 44 | — |
| Speed Grade | -7 (7.5 ns pin-to-pin delay) | — |
| Pin-to-Pin Delay (tPD) | 7.5 ns | 10 ns |
| Maximum Counter Frequency | 192.3 MHz (-7 grade) | 227.3 MHz |
| Supply Voltage (VCC) | 3.3 V | — |
| MultiVolt I/O | 1.8 V / 2.5 V / 3.3 V | — |
| Programmability | EEPROM, in-system programmable (ISP) | — |
| JTAG Interface | IEEE Std. 1149.1 compliant | IEEE Std. 1149.1 compliant |
| ISP Standard | IEEE Std. 1532 compliant | IEEE Std. 1532 |
| Boundary-Scan Test (BST) | Built-in, JTAG-driven | — |
| Packhaging | 44-pin TQFP | TQFP-44 (10x10 mm, 0.8 mm pitch) |
| Temperature na Operasyon | 0°C to +85°C (commercial) | -40C to +85C (Industrial) |
| Uri ng Pagpapasok | Surface Mount | Surface Mount |
| Tindminan RoHS | Compliant | Non-Compliant (contains lead, per DigiChip listing) |
| Product Type | — | CPLD (Complex Programmable Logic Device) |
| Programmable Type | — | In-System Programmable (ISP), EEPROM-based |
| Number of Macrocells | — | 64 |
| Number of Logic Array Blocks (LABs) | — | 4 |
| Number of Usable Gates | — | 1,250 |
| Number of User I/O Pins | — | 34 |
| Supply Voltage (VCCINT) | — | 3.3 V |
| I/O Voltage Tolerance | — | 5.0 V tolerant (MultiVolt I/O) |
| Lead Free Status | — | Contains Lead |
| Process Technology | — | CMOS, EEPROM |
| Programming Cycles | — | [DATA_NEEDED: typical program/erase endurance] |