EPM3512AFI256-7 vs EPM3512AFC256-10 Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EPM3512AFI256-7 sa pamamagitan ng Altera at EPM3512AFC256-10 sa pamamagitan ng Altera. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Pagsanggunian na paghahambing
| Parametro | EPM3512AFI256-7 | EPM3512AFC256-10 |
|---|---|---|
| Brand | Altera | Altera |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Obsolete | NRND |
| Family | MAX 3000A | MAX 3000A |
| Device Type | CPLD (Complex Programmable Logic Device) | — |
| Macrocells | 512 | 512 |
| Usable Gates | 10,000 | 10,000 |
| Logic Array Blocks (LABs) | 32 (16 macrocells each) | 16 |
| User I/O Pins | 208 | — |
| Pin-to-Pin Delay (tPD) | 7.5 ns | 10 ns |
| Maximum Operating Frequency | [DATA_NEEDED: fMAX value] | — |
| Supply Voltage VCCINT | 3.3 V | — |
| MultiVolt I/O Voltage | 1.8 V / 2.5 V / 3.3 V / 5.0 V tolerant | — |
| Process Technology | 0.30 µm CMOS EEPROM | — |
| Packhaging | 256-ball FBGA (Fine-Pitch BGA), 17 mm × 17 mm, 1.0 mm pitch | 256-pin FBGA |
| In-System Programmability | IEEE Std. 1532 compliant via JTAG | Yes (IEEE Std. 1149.1 JTAG / IEEE Std. 1532) |
| Boundary-Scan Test | IEEE Std. 1149.1 (JTAG) | — |
| Operating Temperature (Industrial) | -40 °C to +85 °C | — |
| Tindminan RoHS | [DATA_NEEDED: confirm from data] | unknown |
| Uri ng Pagpapasok | Surface Mount (BGA) | Surface Mount |
| Maximum I/O Pins | — | 208 |
| Maximum Counter Frequency | — | 87 MHz |
| Supply Voltage (VCCINT) | — | 3.3 V |
| I/O Voltage Tolerance | — | 5-V tolerant |
| Programmable Technology | — | CMOS EEPROM |
| Hanay ng Temperature na Operasyon | — | [DATA_NEEDED: industrial/commercial operating temperature range] |
| Bilang ng Pin | — | 256 |
| Architecture | — | MAX (Multiple Array matriX) EEPROM-based |