EPM3512AQC208-15N vs EPM3512AQC208-10N Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EPM3512AQC208-15N sa pamamagitan ng Altera at EPM3512AQC208-10N sa pamamagitan ng Intel. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Altera
EPM3512AQC208-15N - 512-Macro CPLD MAX 3000A PQFP-208 | Altera
EPM3512AQC208-15N ⚠ Huling PagbiliPagsanggunian na paghahambing
| Parametro | EPM3512AQC208-15N | EPM3512AQC208-10N |
|---|---|---|
| Brand | Altera | Intel |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Huling Pagbili | Obsolete |
| Family | MAX 3000A | MAX 3000A |
| Device Type | CPLD - Complex Programmable Logic Device | CPLD (Complex Programmable Logic Device) |
| Macro Cells | 512 | — |
| Logic Array Blocks (LABs) | 16 | 16 |
| Maximum User I/O Pins | 172 | — |
| Typical Usable Gates | 12,000 | — |
| Number of Logic Elements | 512 | — |
| Pin-to-Pin Delay (tPD) | 15 ns | — |
| Operating Supply Voltage (VCCINT) | 3.3 V | — |
| I/O Supply Voltage (VCCIO) | 2.5 V / 3.3 V (MultiVolt) | — |
| Programmable I/O Standards | LVTTL, LVCMOS, PCI (with external resistor) | — |
| In-System Programmability | Yes (IEEE Std. 1532 compliant) | — |
| Configuration Memory | EEPROM (non-volatile) | — |
| JTAG Support | Yes (BST/Boundary-Scan Test) | — |
| Packhaging | PQFP-208 (QC208) | 208-pin PQFP (Plastic Quad Flat Pack) |
| Uri ng Pagpapasok | Surface Mount | — |
| Temperature na Operasyon | 0C to +70C (commercial) | 0 C to 70 C (commercial) |
| Tindminan RoHS | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS status not in verified web data] |
| Macrocells | — | 512 |
| Usable Gates | — | Up to 10,000 |
| User I/Os | — | 172 |
| Volte ng Pagbibigay | — | 3.3 V |
| Pin-to-Pin Delay | — | 4.5 ns (-10 speed grade) |
| Maximum Internal Frequency | — | 227.3 MHz |
| Speed Grade | — | -10 |
| Process Technology | — | CMOS EEPROM |
| In-System Programming | — | IEEE Std. 1149.1 JTAG, IEEE Std. 1532 |
| Boundary-Scan Test (BST) | — | Built-in, IEEE 1149.1 compliant |
| I/O Standards | — | MultiVolt (1.8V / 2.5V / 3.3V) |