RTAX250S-1CG624E vs RTAX250S-CG624EV Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng RTAX250S-1CG624E sa pamamagitan ng Microchip Technology at RTAX250S-CG624EV sa pamamagitan ng Microchip Technology. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Microchip Technology
RTAX250S-1CG624E - 250K-Gate Rad-Tolerant FPGA 624-CCGA | Microchip
RTAX250S-1CG624E ✓ NakahandaMicrochip Technology
RTAX250S-CG624EV - 250K-Gate Rad-Tolerant FPGA | Microchip
RTAX250S-CG624EV ✓ NakahandaPagsanggunian na paghahambing
| Parametro | RTAX250S-1CG624E | RTAX250S-CG624EV |
|---|---|---|
| Brand | Microchip Technology | Microchip Technology |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Aktibo | Aktibo |
| Family | RTAX-S Radiation-Tolerant FPGA | RTAX-S RadTolerant FPGA |
| Equivalent System Gates | 250,000 | — |
| Logic Cells | 2816 | 4224 cells |
| Maximum Toggle Frequency | 649 MHz | — |
| CLB Combinatorial Delay (Max) | 0.930 ns | — |
| Core Supply Voltage | 1.5 V | 1.5 V |
| Process Technology | 0.15 um CMOS antifuse | 0.15 um CMOS |
| Speed Grade | -1 (approximately 15% faster than standard) | — |
| Packhaging | 624-pin Ceramic Column Grid Array (CCGA) | — |
| Temperature na Operasyon | -55C to +125C | -55C to +125C |
| Configuration Type | One-time programmable antifuse, live at power-up | — |
| Logic Family | CMOS | CMOS |
| SEU Hardening | SEU-hardened registers, immune to single-event upsets | — |
| Embedded Memory | Embedded SRAM with built-in FIFO control | — |
| Uri ng Pagpapasok | Surface Mount | Surface Mount (ceramic column grid array) |
| Application Domain | Space flight / satellite systems | — |
| System Gates | — | 250000 gates |
| Configurable Logic Blocks (CLBs) | — | 2816 |
| Maksimum na Taktiko ng Oras | — | 649 MHz |
| Package Type | — | 624-pin Ceramic Grid Array (CGA/CCGA) |
| Bilang ng Pin | — | 624 |
| Radiation Tolerance | — | SEU-hardened registers; SEU rate < 10-10 errors per bit-day |
| SEU Immunity | — | [DATA_NEEDED: LET threshold (MeV-cm2/mg)] |
| Configuration | — | Anti-fuse, live-at-power-up, single chip |
| Tindminan RoHS | — | [DATA_NEEDED: RoHS status] |