RTAX250S-CG624E vs RTAX250S-CG624EV Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng RTAX250S-CG624E sa pamamagitan ng Microchip Technology at RTAX250S-CG624EV sa pamamagitan ng Microchip Technology. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Microchip Technology
RTAX250S-CG624E - 250K-Gate Rad-Tolerant FPGA | Microchip
RTAX250S-CG624E ✓ NakahandaMicrochip Technology
RTAX250S-CG624EV - 250K-Gate Rad-Tolerant FPGA | Microchip
RTAX250S-CG624EV ✓ NakahandaPagsanggunian na paghahambing
| Parametro | RTAX250S-CG624E | RTAX250S-CG624EV |
|---|---|---|
| Brand | Microchip Technology | Microchip Technology |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Aktibo | Aktibo |
| System Gates | 250000 gates | 250000 gates |
| Logic Cells (CLBs) | 2816 | — |
| Maximum Toggle Frequency | 649 MHz | — |
| Process Technology | 0.15 um CMOS | 0.15 um CMOS |
| Core Supply Voltage | 1.5 V | 1.5 V |
| Logic Family | CMOS | CMOS |
| CLB Combinatorial Delay (max) | 0.930 ns | — |
| Package Type | CCGA-624 (ceramic column grid array, 624 pins) | 624-pin Ceramic Grid Array (CGA/CCGA) |
| Temperature na Operasyon | -55C to +125C | -55C to +125C |
| Programming Technology | Antifuse (one-time programmable) | — |
| SEU Hardening | SEU-hardened registers, no external TMR required | — |
| SEU Immunity | Immune to single-event upsets to specified LET threshold; SEU rate < 10-10 errors/bit-day | [DATA_NEEDED: LET threshold (MeV-cm2/mg)] |
| Power-Up Behavior | Live at power-up (true single-chip) | — |
| Family | RTAX-S radiation-tolerant FPGA | RTAX-S RadTolerant FPGA |
| Uri ng Pagpapasok | Surface Mount | Surface Mount (ceramic column grid array) |
| Target Application | Space-flight systems | — |
| Logic Cells | — | 4224 cells |
| Configurable Logic Blocks (CLBs) | — | 2816 |
| Maksimum na Taktiko ng Oras | — | 649 MHz |
| Bilang ng Pin | — | 624 |
| Radiation Tolerance | — | SEU-hardened registers; SEU rate < 10-10 errors per bit-day |
| Configuration | — | Anti-fuse, live-at-power-up, single chip |
| Tindminan RoHS | — | [DATA_NEEDED: RoHS status] |