EPM3064ATC44-10 vs EPM3064ATI44-10N Karşılaştırma
Ayrıntılı yan yana karşılaştırma EPM3064ATC44-10 tarafından Altera ve EPM3064ATI44-10N tarafından AlteraAnahtar özellikleri, elektriksel parametreleri, ambalajı, yaşam döngüsü durumu, fiyatlandırma ve mevcudiyeti karşılaştırarak tasarım gereksinimleriniz için en iyi bileşeni belirleyin.
Özellik Karşılaştırması
| Parametre | EPM3064ATC44-10 | EPM3064ATI44-10N |
|---|---|---|
| Marka | Altera | Altera |
| Kategori | FPGA & CPLD | FPGA & CPLD |
| Yaşam Döngüsü Durumu | Obsolete | Obsolete |
| Family | MAX 3000A | MAX 3000A |
| Logic Elements / Macrocells | 64 macrocells | — |
| Usable Gates | 1,250 | 1250 |
| Number of Logic Blocks / LABs | 4 LABs | — |
| Propagation Delay (tPD) | 10 ns | — |
| Maximum Internal Frequency | 227.3 MHz (counter speed) | — |
| Programmable I/Os | 34 | — |
| Supply Voltage (VCCINT) | 3.0 V to 3.6 V (3.3 V typical) | — |
| I/O Bank Voltage (VCCIO) | MultiVolt 1.5 V / 1.8 V / 2.5 V / 3.3 V | — |
| Technology | CMOS EEPROM, 5 V tolerant I/O | — |
| In-System Programming | IEEE Std. 1532 (JTAG) | — |
| Boundary-Scan Support | IEEE 1149.1 (JTAG) | — |
| Paket | TQFP-44, 10 x 10 mm, 0.8 mm pitch | 44-pin TQFP |
| Montaj Türü | Surface Mount | Surface Mount |
| İşletim Sıcaklığı Aralığı | 0C to +70C (commercial) | — |
| RoHS Durumu | Non-compliant (legacy Altera, Pb-bearing) | Non-Compliant (per digchip datasheet excerpt) |
| Product Type | — | CPLD (Complex Programmable Logic Device) |
| Macrocells | — | 64 |
| User I/Os | — | 34 |
| Dedicated Inputs | — | 4 |
| Logic Blocks | — | 4 |
| Pin-to-Pin Delay | — | 10 ns (-10 speed grade) |
| Maximum Frequency (fMAX) | — | 100 MHz |
| Programmable Type | — | In-System Programmable (EEPROM) |
| ISP Interface | — | IEEE Std. 1149.1 (JTAG) |
| ISP Standard Compliance | — | IEEE Std. 1532 |
| Core Supply Voltage (VCCINT) | — | 3.3 V |
| I/O Supply Voltage (VCCIO) | — | 3.3 V or 2.5 V (MultiVolt) |
| İşletim Sıcaklığı | — | -40C to +85C (Industrial, "N" suffix) |
| Process Technology | — | CMOS EEPROM |
| Boundary-Scan Test | — | Built-in (JTAG) |
| Lead-Free Status | — | Contains Lead (per digchip datasheet excerpt) |