RTAX4000SL-CQ352E vs RTAX4000S-CQ352V 比較
詳細並排比較 RTAX4000SL-CQ352E 由 Microsemi 與 RTAX4000S-CQ352V 由 Microchip Technology. 比較關鍵規格、電氣參數、封裝、生命週期狀態、價格與供貨情況，以找出最符合您設計需求的元件。
Microsemi
RTAX4000SL-CQ352E - 4M-Gate Rad-Tolerant FPGA, 352-CQFP | Microchip
RTAX4000SL-CQ352E ✓ 啟用中Microchip Technology
RTAX4000S-CQ352V - 4M-Gate Rad-Tolerant FPGA | Microchip
RTAX4000S-CQ352V ✓ 啟用中規格比較
| 參數 | RTAX4000SL-CQ352E | RTAX4000S-CQ352V |
|---|---|---|
| 品牌 | Microsemi | Microchip Technology |
| 類別 | FPGA & CPLD | FPGA & CPLD |
| 生命週期狀態 | 啟用中 | 啟用中 |
| Family | RTAX-SL (RTAX-S/SL and RTAX-DSP) | RTAX-S/SL Radiation-Tolerant FPGAs |
| Equivalent System Gates | 4,000,000 | 4,000,000 gates |
| Logic Cells / Cells | 40,320 | — |
| Total Logic Modules | 60,480 | — |
| Process Technology | 0.15 um CMOS | — |
| Core Supply Voltage | 1.5 V | — |
| 封裝 | 352-terminal CQFP (ceramic quad flat pack) | CQ352 (352-pin ceramic column grid array) |
| Terminal Pitch | 0.500 mm | — |
| Radiation Tolerance | Radiation-tolerant (space-flight grade) | Radiation-tolerant (space-flight grade) |
| Configuration | Anti-fuse, live at power-up, single-chip | Live at power-up, single-chip, no external configuration device |
| Embedded Memory | Embedded SRAM with built-in FIFO control logic | Embedded SRAM with built-in FIFO control logic |
| Clocking | Segmentable clocks, chip-wide highway routing | — |
| Arithmetic Support | Dedicated carry logic | — |
| 工作溫度 | -55C to +125C | [DATA_NEEDED: operating temperature range] |
| 安裝類型 | Surface Mount | — |
| Typical Applications | Space-flight systems, satellites | — |
| RoHS 狀態 | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS status] |
| Combinational Logic Blocks | — | 40,320 |
| Logic Cells | — | 60,480 |
| Technology | — | CMOS, antifuse (OTP) |
| Clock Resources | — | Segmentable clocks, chip-wide highway routing |
| Architecture Base | — | Axcelerator commercial FPGA family |
| Application Domain | — | Space-flight systems |
| 供應電壓 | — | [DATA_NEEDED: core supply voltage] |
| Max User I/O | — | [DATA_NEEDED: maximum user I/O count for CQ352] |
| Screening | — | Standard vs SL variant distinguished by ICCA limits at 125C final electrical test |