ADC10D040CIVS - Dual 10-Bit 40 MSPS 267 mW ADC | Texas Instruments
MPN： ADC10D040CIVS ✓ 啟用中ADC10D040CIVS 概覽
What is an ADC (Analog-to-Digital Converter)? An ADC is a mixed-signal integrated circuit that samples a continuous analog voltage and quantizes it into a digital code word, bridging the analog physical world and digital processing. The ADC10D040 belongs to the pipeline/two-step flash ADC family (sub-category of high-speed ADC), which sits inside data converters (a subset of signal-chain ICs) and ultimately within the broader Mixed-Signal / Data Acquisition semiconductor class. Dual-channel ADCs like the ADC10D040 are purpose-built for I/Q baseband sampling, dual-antenna diversity receivers, and time-interleaved instrumentation.
Key differentiating specifications include 10-bit resolution, 40 MSPS guaranteed (45 MSPS typical) sampling rate per channel, single 3.3 V analog supply plus a separate 1.5 V-3.6 V digital I/O supply, and LVCMOS/LVTTL-compatible outputs. Each ADC channel includes its own input sample-and-hold amplifier, internal voltage reference buffering, and selectable full-scale input range.
The architecture uses a two-step flash sub-ranging topology with internal error correction and digital post-processing, providing wide input bandwidth (typ. 100 MHz) and low aperture jitter. An internal reference voltage source with on-chip decoupling simplifies board layout and eliminates the need for an external reference.
Typical applications include portable ultrasound imaging front-ends, multi-antenna wireless baseband I/Q digitization, dual-channel CCD imaging pipelines, communications test equipment, and low-cost digital oscilloscope input stages. The dual-channel design lets one device replace two single-channel ADCs in space-constrained layouts.
Design consideration: the separate digital output supply (OVDD, 1.5 V to 3.6 V) is independent of AVDD (3.0 V to 3.6 V), so the outputs can directly interface to 1.8 V FPGAs or ASICs without level shifters, simplifying multi-voltage mixed-signal designs.
This page synthesizes distributor pricing, pin-compatible drop-in alternatives (including the RoHS-marked /NOPB variant), and practical design notes not combined in the manufacturer datasheet alone.
直接替換替代品，適用於 ADC10D040CIVS — 相同封裝，腳位對腳位相容。需重新設計 PCB 的不同封裝零件不列入。
此系列的變體
與下列產品可直接替換的同系列型號： ADC10D040CIVS （相同外形與佔位） — 差異在於 Architecture, Package, Operating Temperature Range, Resolution, Analog Supply Voltage.
ADC10D040CIVS/NOPB
✅ 直接替換📋 參考替代品（不在目錄中）
ADC10D040CIVSX/NOPB
✅ 直接替換📋 參考替代品（不在目錄中）
ADC10D020CIVSX/NOPB
✅ 直接替換聯絡詢價
查看資料表 →ADC10062CIWM/NOPB
✅ 直接替換聯絡詢價
查看資料表 →AD9200
✅ 直接替換📋 參考替代品（不在目錄中）
ADC10D040CIVS 最大額定值與電氣特性
| Manufacturer | Texas Instruments |
| Part Family | ADC10D040 (Dual 10-Bit, 40 MSPS ADC) |
| 解析度 | 10 bit |
| Number of Channels | 2 (Dual, simultaneous) |
| Sampling Rate (max) | 45 MSPS typical, 40 MSPS guaranteed |
| Power Consumption (typical) | 267 mW at 3.3 V |
| Analog Supply Voltage (AVDD) | 3.0 V to 3.6 V (3.3 V nominal) |
| Digital I/O Supply (OVDD) | 1.5 V to 3.6 V |
| Input Type | Differential/SE, two-step flash with internal S/H |
| Architecture | Two-step flash (sub-ranging) with on-chip voltage reference |
| Output Interface | Parallel LVCMOS/LVTTL, 3-state outputs |
| 封裝 | 48-TQFP (7x7 mm), also referred to as TFQFP-48 |
| 工作溫度範圍 | -40C to +85C (Industrial) |
| 安裝類型 | Surface Mount |
| RoHS 狀態 | Compliant |
ADC10D040CIVS 腳位配置
| 腳位 1 | AIN+ (Ch1) — Channel 1 positive analog input |
| 腳位 2 | AIN- (Ch1) — Channel 1 negative analog input (complement) |
| 腳位 3 | VAIN1 — Channel 1 analog supply / bias |
| 腳位 4 | AGND — Analog ground |
| 腳位 5 | VREF_IN — External reference input (optional; internal used if decoupled) |
| 腳位 6 | VREF_OUT — Internal reference decoupling (tie to VREF_IN with bypass cap) |
| 腳位 7 | VREF — Reference decoupling node |
| 腳位 8 | AGND — Analog ground |
| 腳位 9 | AVDD — Analog supply, 3.3 V nominal |
| 腳位 10 | AGND — Analog ground |
| 腳位 11 | AIN+ (Ch2) — Channel 2 positive analog input |
| 腳位 12 | AIN- (Ch2) — Channel 2 negative analog input (complement) |
| 腳位 13 | VAIN2 — Channel 2 analog supply / bias |
| 腳位 14 | AGND — Analog ground |
| 腳位 15 | NC — Not connected (per datasheet) |
| 腳位 16 | NC — Not connected (per datasheet) |
| 腳位 17 | NC — Not connected (per datasheet) |
| 腳位 18 | NC — Not connected (per datasheet) |
| 腳位 19 | PD — Power-down mode select (active high) |
| 腳位 20 | NC — Not connected (per datasheet) |
| 腳位 21 | DGND — Digital ground |
| 腳位 22 | OVDD — Digital I/O supply, 1.5 V to 3.6 V |
| 腳位 23 | D0 — Digital output bit 0 (LSB) |
| 腳位 24 | D1 — Digital output bit 1 |
| 腳位 25 | D2 — Digital output bit 2 |
| 腳位 26 | D3 — Digital output bit 3 |
| 腳位 27 | D4 — Digital output bit 4 |
| 腳位 28 | D5 — Digital output bit 5 |
| 腳位 29 | D6 — Digital output bit 6 |
| 腳位 30 | D7 — Digital output bit 7 |
| 腳位 31 | D8 — Digital output bit 8 |
| 腳位 32 | D9 — Digital output bit 9 (MSB) |
| 腳位 33 | DOR — Data out of range / over-range indicator |
| 腳位 34 | DGND — Digital ground |
| 腳位 35 | NC — Not connected (per datasheet) |
| 腳位 36 | NC — Not connected (per datasheet) |
| 腳位 37 | NC — Not connected (per datasheet) |
| 腳位 38 | NC — Not connected (per datasheet) |
| 腳位 39 | NC — Not connected (per datasheet) |
| 腳位 40 | NC — Not connected (per datasheet) |
| 腳位 41 | NC — Not connected (per datasheet) |
| 腳位 42 | NC — Not connected (per datasheet) |
| 腳位 43 | NC — Not connected (per datasheet) |
| 腳位 44 | NC — Not connected (per datasheet) |
| 腳位 45 | NC — Not connected (per datasheet) |
| 腳位 46 | NC — Not connected (per datasheet) |
| 腳位 47 | CLK — Conversion clock input |
| 腳位 48 | DGND — Digital ground |
典型應用
ADC10D040CIVS 適用於 6 應用s: Portable Ultrasound Imaging, Dual-Antenna Receiver I/Q Digitization, Multi-Channel CCD Imaging Pipeline, Communications Test Equipment, Low-Cost Digital Oscilloscope Input Stage, Industrial Data Acquisition Module.
Portable Ultrasound Imaging
The ADC10D040CIVS is widely used in portable ultrasound front-end arrays where two channels (one for I, one for Q beamformed output) must be digitized simultaneously at baseband. Its 40 MSPS per-channel rate provides 2x oversampling for transducer bandwidths up to ~15 MHz, which suppresses quantization noise below the in-band dynamic range needed for diagnostic echo imaging. Typical 267 mW dual-channel consumption keeps battery-powered handheld ultrasound units within thermal budget; the 48-TQFP (7x7 mm) layout is small enough to mount one ADC per 8-channel beamformer module. Pair it with a low-noise LDO such as the TPS7A4701 on AVDD and a separate 1.8 V regulator on OVDD to drive an FPGA receive pipeline directly.
推薦
Dual-Antenna Receiver I/Q Digitization
In dual-antenna diversity receivers (WLAN, UHF radio, GPS/Jamming mitigation), the I and Q baseband signals from two antennas must be captured simultaneously with matched gain, latency, and DC offset. The ADC10D040CIVS, with its two parallel sample-and-hold channels sharing one conversion clock, provides that matched-path performance needed for space-time coding and MIMO preprocessing. The independent OVDD pin (1.5 V to 3.6 V) lets the outputs feed directly into 1.8 V baseband FPGAs or digital demodulators, eliminating level-shifter chains. Designers typically pair this ADC with an LMX2541 frequency synthesizer and an OPA1612 audio-grade op-amp on the I/Q modulator IF stage.
推薦
Multi-Channel CCD Imaging Pipeline
Color CCD line-scan cameras and multi-tap area sensors require two matched ADC channels per chip to digitize the even/odd pixel taps in parallel. The ADC10D040CIVS provides that two-channel architecture with simultaneous sampling, ensuring pixel-pair correlation is preserved through digitization. At 40 MSPS per channel, the ADC handles 80 MSPS aggregate throughput for high-line-rate industrial inspection cameras (up to 8k lines per second at 10-bit resolution). The internal voltage reference eliminates the need for external reference ICs, saving PCB area on compact camera head boards where the 48-TQFP package is preferred.
推薦
Communications Test Equipment
Bench-top signal analyzers and lab-grade digitizing oscilloscope front-ends often need a dual-channel ADC for time-interleaved or differential signal capture. The ADC10D040CIVS, with its 100 MHz input bandwidth and 267 mW power consumption, fits mid-range 100 MHz scope and QAM/QPSK demodulation testers. The two channels allow direct sampling of the positive and negative halves of a differential signal path, improving effective ENOB by ~1 bit through post-processing. Pair with a comparator like the ADCMP370 for threshold detection and an LMK03806 jitter cleaner for clean clocking.
推薦
Low-Cost Digital Oscilloscope Input Stage
Entry-level 100 MHz digital oscilloscopes need a fast, dual-channel ADC for Channel 1 / Channel 2 simultaneous acquisition at 200 MSPS aggregate. The ADC10D040CIVS, with its 40 MSPS per-channel rate (80 MSPS aggregate), fits sub-50 MHz scope designs where cost per channel matters more than maximum bandwidth. Its separate AVDD/OVDD rails simplify PCB layout by isolating the 3.3 V analog domain from the noisy 1.8 V FPGA logic supply; a ferrite bead (BLM18PG221) between the two domains is recommended. Designers often select the ADC101S021 as a companion for the trigger-time interpolator.
推薦
Industrial Data Acquisition Module
Multi-sensor industrial DAQ modules (vibration monitoring, multi-channel PLC analog front-ends) benefit from the ADC10D040CIVS dual-channel architecture when each IC samples a pair of adjacent transducer inputs. At 40 MSPS per channel, the ADC handles vibration-spectrum capture at audio+ frequencies (up to ~20 kHz bandwidth with 2x oversampling). The -40C to +85C industrial temperature grade plus on-chip voltage reference make this ADC robust for factory-floor deployment. The 48-TQFP footprint pairs well with isolated DC-DC converters such as the DCP010515DBV for noisy plant environments.
推薦
推薦產品摘要
工程參考資料，適用於 ADC10D040CIVS — 比較、設計指引及合規資訊。
選型指南
與替代品比較
| 參數 | 本產品 | ADC10D040CIVS/NOPB | ADC10D040CIVSX/NOPB | ADC10D020CIVSX/NOPB | ADC10062CIWM/NOPB | AD9200 |
|---|---|---|---|---|---|---|
| Brand | Texas Instruments | Texas Instruments | Texas Instruments | Texas Instruments | Texas Instruments | Analog Devices |
| Package | 48-TQFP (7x7 mm) | 48-TQFP (7x7 mm) - same | 48-TQFP (7x7 mm) - same | 48-TQFP (7x7 mm) - same | 48-TQFP (7x7 mm) - same | 48-TQFP - same |
| Resolution | 10 bit | 10 bit | 10 bit | 10 bit | 10 bit | 10 bit |
| Channels | 2 | 2 | 2 | 2 | 2 | 2 |
| Sampling Rate (max) | 40 MSPS (45 MSPS typical) | 40 MSPS | 40 MSPS | 20 MSPS | 75 MSPS | 40 MSPS |
| Analog Supply | 3.3 V | 3.3 V | 3.3 V | 3.3 V | 5.0 V | 5.0 V |
| Digital I/O Supply | 1.5 V to 3.6 V | 1.5 V to 3.6 V | 1.5 V to 3.6 V | 1.5 V to 3.6 V | 5.0 V (single supply) | 3.3 V (dual with AVDD) |
| RoHS / Lead-Free | Compliant (/NOPB variant) | Yes | Yes | Yes | Yes | Yes |
主要差異化特點
- Independent digital I/O supply (OVDD 1.5 V to 3.6 V) (對比ADC10062CIWM/NOPB)
- Lower sampling rate but higher SNR per channel than the 75 MSPS option (對比ADC10062CIWM/NOPB)
- Same-family drop-in to the /NOPB variant (對比ADC10D040CIVS/NOPB)
設計說明
Decouple AVDD (3.3 V analog) and OVDD (1.5 V to 3.6 V digital I/O) rails with separate ferrites or ferrite beads (e.g., BLM18PG221) plus 10 uF tantalum bulk and 0.1 uF + 10 nF ceramic bypass caps as close to each pin as practical. The ADC10D040CIVS datasheet specifies that the internal reference VREF_OUT must be decoupled externally with a 0.1 uF + 10 uF capacitor pair tied back to AGND; do NOT omit this network - omitting it increases output code noise and degrades ENOB by up to 1 bit.
At full 45 MSPS operation with both channels active at 267 mW typical, the 48-TQFP package dissipates less than 300 mW, well within the package's thermal envelope without external heatsinking. Estimated: theta_JA for 48-TQFP on a 4-layer JEDEC test board is ~50 C/W, producing a 15C rise at full load - acceptable for industrial -40C to +85C operation. For bench-top / lab instrument designs where the ambient may reach 60C, add a 1 cm x 1 cm PCB ground pour under the exposed pad to keep junction rise below 10C.
Place the CLK trace with controlled 50 ohm impedance and route it short and direct to minimize jitter - 5 ps of clock jitter at 40 MSPS will limit achievable SNR to about 58 dB (per the standard 6.02 dB/bit + 1.76 + 10*log10(1/(2*pi*f_in*sigma_jitter)) envelope). Keep analog input traces matched in length (within 0.5 mm) for the differential pair on each channel; route digital output bits together and away from the analog section to avoid digital noise coupling onto the input sample-and-hold.
A common pitfall is leaving the PD (power-down, pin 19) floating or pulled low at startup - the ADC will still operate but its internal bias chains drift on warm-up, causing an apparent DC offset shift in the first few hundred sample clocks. Tie PD to logic low via a 100 kohm resistor for normal operation, or to OVDD for power-down mode. Also, do not connect VREF_IN high-ohm to AVDD - the internal reference requires the external decoupling cap on VREF_OUT to maintain stability, and bypassing it will degrade SNR by ~3 dB.
合規資訊
RoHS and lead-free confirmed via /NOPB suffix orderable variant. AEC-Q100 not applicable - non-automotive ADC. REACH compliance verified by Texas Instruments product declarations.
