EP1K100FC484-3N vs EP1K100FI484-2 对比
详细并排对比 EP1K100FC484-3N 出自 Intel 和 EP1K100FI484-2 出自 Intel。对比关键规格、电气参数、封装、生命周期状态、价格和供货情况，以确定最适合您设计需求的元器件。
规格对比
| 参数 | EP1K100FC484-3N | EP1K100FI484-2 |
|---|---|---|
| 品牌 | Intel | Intel |
| 分类 | FPGA & CPLD | FPGA & CPLD |
| 生命周期状态 | 最后采购期 | Obsolete |
| 库存状态 | 有库存 | 有库存 |
| 单价（USD） | $65.10 | $118.00 |
| Family | ACEX 1K | ACEX-1K Programmable Logic Device Family |
| Logic Elements | 4,992 | — |
| Typical Gate Count | 100,000 gates | — |
| Logic Array Blocks (LABs) | 624 | — |
| Embedded Array Blocks (EABs) | 12 | — |
| Total RAM Bits | 49,152 | 49,152 |
| User I/Os | 333 | — |
| Operating Voltage (VCCINT) | 2.5 V | — |
| Process Technology | 0.22 µm CMOS | CMOS, 2.5 V |
| Internal Operating Frequency | up to 200 MHz | — |
| Speed Grade | -3 | -2 (mid) |
| 封装 | 484-ball FBGA | 484-BBGA (FineLine BGA) |
| 安装类型 | Surface Mount | Surface Mount |
| Configuration Method | Passive Serial, JTAG, PPA | — |
| I/O Standards Supported | LVTTL, LVCMOS, PCI, 2.5V/3.3V/5V multiVolt I/O | — |
| Operating Temperature (Commercial) | 0 °C to +70 °C | — |
| Boundary-Scan Test | IEEE 1149.1 (JTAG) | — |
| RoHS 状态 | [DATA_NEEDED: RoHS status] | unknown |
| Series | — | ACEX-1K |
| Typical Gates | — | 100,000 |
| Logic Elements (Cells) | — | 4,992 |
| Number of I/O | — | 333 |
| Number of Logic Array Blocks (LABs) | — | [DATA_NEEDED: LAB count] |
| Number of Embedded Array Blocks (EABs) | — | [DATA_NEEDED: EAB count] |
| 工作电源电压 | — | 2.5 V |
| Maximum Operating Frequency | — | 250 MHz |
| 工作温度范围 | — | -40C to +85C (Industrial) |
| Configuration Interface | — | JTAG (IEEE 1149.1) + serial/parallel |