EPM3512AFI256-7 vs EPM3512AFI256-7N 对比
详细并排对比 EPM3512AFI256-7 出自 Altera 和 EPM3512AFI256-7N 出自 Altera。对比关键规格、电气参数、封装、生命周期状态、价格和供货情况，以确定最适合您设计需求的元器件。
规格对比
| 参数 | EPM3512AFI256-7 | EPM3512AFI256-7N |
|---|---|---|
| 品牌 | Altera | Altera |
| 分类 | FPGA & CPLD | FPGA & CPLD |
| 生命周期状态 | Obsolete | 最后采购期 |
| 库存状态 | 有库存 | 有库存 |
| 单价（USD） | $15.95 | $27.95 |
| Family | MAX 3000A | MAX 3000A |
| Device Type | CPLD (Complex Programmable Logic Device) | — |
| Macrocells | 512 | — |
| Usable Gates | 10,000 | — |
| Logic Array Blocks (LABs) | 32 (16 macrocells each) | 16 |
| User I/O Pins | 208 | — |
| Pin-to-Pin Delay (tPD) | 7.5 ns | — |
| Maximum Operating Frequency | [DATA_NEEDED: fMAX value] | — |
| Supply Voltage VCCINT | 3.3 V | — |
| MultiVolt I/O Voltage | 1.8 V / 2.5 V / 3.3 V / 5.0 V tolerant | — |
| Process Technology | 0.30 µm CMOS EEPROM | — |
| 封装 | 256-ball FBGA (Fine-Pitch BGA), 17 mm × 17 mm, 1.0 mm pitch | 256-ball FBGA |
| In-System Programmability | IEEE Std. 1532 compliant via JTAG | — |
| Boundary-Scan Test | IEEE Std. 1149.1 (JTAG) | — |
| Operating Temperature (Industrial) | -40 °C to +85 °C | — |
| RoHS 状态 | [DATA_NEEDED: confirm from data] | — |
| 安装类型 | Surface Mount (BGA) | Surface Mount (BGA) |
| Device Logic Elements / Macrocells | — | 512 macrocells |
| Typical Usable Gates | — | 10,000 gates |
| Maximum User I/O Pins | — | [DATA_NEEDED: user I/O count] |
| Maximum Operating Frequency (fMAX) | — | 116.3 MHz |
| Pin-to-Pin Delay (tPD, speed grade -7) | — | approximately 7.5 ns |
| Supply Voltage (VCCINT) | — | 3.3 V |
| MultiVolt I/O Levels | — | 2.5 V / 3.3 V / 5 V mixed |
| Configuration Memory | — | Non-volatile EEPROM |
| Programming Interface | — | IEEE 1149.1 JTAG (in-system programmable) |
| 工作温度范围 | — | -40C to +85C (industrial) |
| Lead-Free / RoHS | — | Yes ('N' suffix, lead-free) |
| Design Software | — | Quartus II (legacy MAX 3000A support) |
| Speed Grade | — | -7 |