RTAX2000S-1CQ352V vs RTAX1000SL-CQ352V مقارنة
مقارنة تفصيلية جنبًا إلى جنب لـ RTAX2000S-1CQ352V بواسطة Microchip Technology و RTAX1000SL-CQ352V بواسطة Microchip Technology. قارن المواصفات الرئيسية والمعلمات الكهربائية والتغليف وحالة دورة الحياة والأسعار والتوافر لتحديد أفضل مكوّن لمتطلبات تصميمك.
Microchip Technology
RTAX2000S-1CQ352V - 2M-Gate Rad-Tolerant FPGA | Microchip
RTAX2000S-1CQ352V ✓ نشطMicrochip Technology
RTAX1000SL-CQ352V - 1M-Gate Rad-Tolerant FPGA | Microchip
RTAX1000SL-CQ352V ✓ نشطمقارنة المواصفات
| المعامل | RTAX2000S-1CQ352V | RTAX1000SL-CQ352V |
|---|---|---|
| العلامة التجارية | Microchip Technology | Microchip Technology |
| الفئة | FPGA & CPLD | FPGA & CPLD |
| حالة دورة الحياة | نشط | نشط |
| Equivalent System Gates | 2,000,000 gates | 1,000,000 |
| Logic Cells | 32,256 cells | 18,144 |
| Configurable Logic Blocks (CLBs) | 21,504 CLBs | — |
| Process Technology | Digital CMOS | 0.15 um CMOS |
| Speed Grade | -1 | — |
| Family | RTAX-S/SL Radiation-Tolerant FPGAs | RTAX-SL (RTAX-S/SL Radiation-Tolerant FPGAs) |
| العلبة | CQ352 ceramic QFP, 352 pins | 352-pin Ceramic CQFP (CQ352V) |
| نوع التركيب | Surface Mount | Surface Mount |
| Configuration | Live at power-up, single-chip | — |
| Embedded Memory | Embedded SRAM with built-in FIFO control logic | Embedded SRAM with built-in FIFO control logic |
| Core Voltage | [DATA_NEEDED: core voltage] | 1.5 V |
| I/O Voltage | [DATA_NEEDED: I/O voltage] | [DATA_NEEDED: I/O bank voltage range] |
| درجة حرارة التشغيل | [DATA_NEEDED: operating temperature range] | [DATA_NEEDED: operating temperature range] |
| Radiation Tolerance (TID) | [DATA_NEEDED: TID rating] | — |
| مستوى MSL | [DATA_NEEDED: moisture sensitivity level] | [DATA_NEEDED: moisture sensitivity level] |
| حالة RoHS | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS compliance status] |
| CLBs (Logic Modules) | — | 12,096 |
| Maximum Toggle Frequency | — | 581 MHz |
| Programming Technology | — | Antifuse (one-time programmable) |
| Radiation Tolerance | — | Radiation-tolerant, space-flight qualified family |
| Power-Up Behavior | — | Live at power-up (non-volatile) |
| Configuration Upset Immunity | — | No SEU in configuration memory (antifuse) |
| Total Ionizing Dose (TID) | — | [DATA_NEEDED: TID rating in krad (Si)] |
| Estimated Equivalent Gates per CLB | — | [DATA_NEEDED: gates-per-CLB ratio] |